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•

¤ Ç k Ä  M T U ê sV R Ë ù p § à à Š[CoFe/Pt/CoFe]/IrMn   • «U c lT c l; c" e à

Ã

Å Ž Ò Þ  À W ¥ V ê s„ Æw ‹ò & ÿ+ s Ƕ  ¥I í Ä — ¤V R Ë

L

|ø ¶ B¦ 



© œt @ /† < Ɠ § @ /† < Æ" é ¶ l 0 p x$ í „   ™ èF † < Æõ , " é ¶ Å Ò 220-702

T „ ç ¡) o  · % · n| ¡£ Ó



© œt @ /† < Ɠ § @ /† < Æ" é ¶ l 0 p x$ í „   ™ èF † < Æõ ,  © œt @ /† < Ɠ § ( Ž É Ó' „   Ó ü t o † < Æõ , " é ¶ Å Ò 220-702

™

»` 9 ] 8 ;



© œt @ /† < Ɠ § Ò q t" î õ † < ƃ  ½ ¨™ è, " é ¶ Å Ò, 220-702 (2005¸   3 Z 4 17{ 9  ~ à Î6 £ §)

[Pt/CoFe]

N

/IrMn  8 £ x~ à Ì} Œ •_  à ºf ”   l s ~ ½ Ó$ í \  @ / # Œ 8 £ x à º(N)_  _ ” > r$ í `  ¦ ƒ  ½ ¨ % i  . : £ ¤ y  Ã

ºf ”   l s ~ ½ Ó$ í `  ¦ ”   [CoFe/Pt/CoFe]/IrMn  8 £ x~ à Ì} Œ •\ " f CoFe 8 £ x õ  ì ø Íy © œ $ í ^ ‰ IrMn8 £ x \  _  K

 “ ¦& ñ ÷ &# Q e ”   H CoFe 8 £ x  s _   © œ  ñ“ § ¨ 8 Š  ½ + ˧ 4 s  Pt ¿ ºa \     ”  1 l x   H  כ `  ¦ › ' a¹ 1 Ï % i  . Õ ª

”

 1 l x_  Å Òl   H @ /| Ä Ì Pt _  ¿ º " é ¶  8 £ x \  K { © œô  Ç . s    õ – РÒ'  q  $ í F K5 Å q Pt ¿ ºa \  _ ” > r   H  © œ  

ñ“ § ¨ 8 Š  ½ + ˧ 4 _  ”  1 l x‰ & ³ © œ“ É r IrMn 8 £ x`  ¦ : Ÿ x K " f Ä »• ¸  ) a y © œ $ í ^ ‰/q  $ í ^ ‰/y © œ $ í ^ ‰_  ½ ¨› ¸& h “   : £ ¤

$ í

\  › ' a >  e ” 6 £ §`  ¦ · ú ˜ à º e ” % 3  .

PACS numbers: 75.30.Et, 75.70.AK

Keywords:  © œ  ñ“ § ¨ 8 Š  ½ + ˧ 4 , à ºf ”   l s ~ ½ Ó$ í , q  $ í F K5 Å q Pt 8 £ x, ì ø Íy © œ $ í ^ ‰ IrMn 8 £ x, [CoFe/Pt/CoFe]/IrMn



8 £ x~ à Ì} Œ •

I. " e  ] Ø

q

 $ í F K5 Å q8 £ x ç ß –  Ü ¼– Ð ì  r o   ) a ¿ º y © œ $ í ^ ‰ 8 £ x  s 

\

 ”  1 l x   H  © œ  ñ“ § ¨ 8 Š  ½ + ˧ 4  (interlayer exchange cou- pling; IEC)“ É r à º¨ î + þ A © œ  l s ~ ½ Ó$ í _  Fe/Cr/Fe  ± p× ¼0 A u

 ½ ¨› ¸  à ºf ”   l s ~ ½ Ó$ í _  Co/Ru x 9 Ni/Cu œ í   



8 £ x~ à Ì} Œ • ½ ¨› ¸\ " f { 9 ì ø Í& h Ü ¼– Ð ˜ Ð# Œt   H ‰ & ³ © œs   [1–

3].  e ± 8 £ x“   ] X ƒ  8 £ x_  ¿ ºa  7 £ x ½ + Éà º2 Ÿ ¤ IEC ß ¼l _  q

Å Òl & h “   y Œ ™û Z › ' a¹ 1 Ï÷ &% 3   [4]. Z. Y. Liu Õ ªÒ  ¨“ É r à º f ”

  l s ~ ½ Ó$ í [Pt/Co]

3

/NiO/[Co/Pt]

3

 8 £ x~ à Ì} Œ • ½ ¨› ¸\ 

"

f NiO ] X ƒ  8 £ x ¿ ºa _  † < Êà º– Ð" f ”  1 l x   H IEC_  : £ ¤$ í `  ¦ µ

1 ϳ ð % i   [4]. s   H D h– Ðî  r z  ´+ « >  õ – Ð" f ] X ƒ  8 £ x s  9 ì

ø Íy © œ $ í ^ ‰“   NiO ~ à Ì} Œ •s  à ºf ” €  Ü ¼– Ð “ ¦& ñ ÷ &# Q e ”   H   l

  8 £ x~ à Ì} Œ •\  ”  1 l x   H  © œ  ñ“ § ¨ 8 Š  ½ + ˧ 4 \  @ /K  ƒ  ½ ¨ô  Ç

 

õ s  . s  כ “ É r ] X ƒ  8 £ x_  NiO ç ß –  s  y © œ $ í ^ ‰ (FM) 8

£

x_  ` …Ø Ôp  ï  r0 A E

F

˜ Ð  Z  }“ É r U

0

_  f ” y Œ • „  0 A  © œ# 4  Z  } s

ü <  _  q 5 p w  9, Õ ª  © œ  ñ“ § ¨ 8 Š  ½ + ˓ É r y © œ $ í ^ ‰ü < ] X 

E-mail: [email protected]

ƒ 

^ ‰_   â > €  \ " f Û ¼— 2 ; _ ” > r_  % ò † ¾ Ó M :ë  H \  NiO ç ß –   8

£

x Ü ¼– Ð „    1 l x_  ç ß –[ O \  _ ô  Ç  כ Ü ¼– Ð ˜ Ѐ Œ ¤  [4].

‘

: r  7 Hë  H \ " f  H 6   x s    o» ¡ ¤ s  à ºf ” €  `  ¦ ”   [Pt/Co Fe]

N

/IrMn _   l : £ ¤$ í \  @ / # Œ 8 £ x à º (N)_  _ ” > r$ í `  ¦

›

¸  % i “ ¦, glass/Buffer/Co

90

Fe

10

(1.0 nm)/Pt(t

P t

)/Co

90

Fe

10

(1.0 nm)/Ir

22

Mn

78

(10 nm)  8 £ x~ à Ì} Œ •\  q  $ í F K 5

Å

q8 £ x Pt ¿ ºa _  † < Êà º– Ð" f ”  1 l x   H  © œ  ñ“ § ¨ 8 Š  ½ + Ë ´ òõ 

\

 ¦ ƒ  ½ ¨ % i  .

II. ÷ m Ç] M öU ê s0 n É

[Buffer layer: NiO(2 nm)/Pt(0.8 nm) or Pt(10 nm)]/

CoFe (1.0 nm)/Pt(0.8 nm)/CoFe(1.0 nm)/IrMn(10 nm)



8 £ x~ à Ì} Œ •s  3 × 10

−6

Torr“   œ í“ ¦”  / B N 7 £ x‚ Ã Ì r Û ¼% 7 ›\ 

"

f Ä »o  l ó ø Í (Corning 7059) 0 A\   © œ“ : r \ " f dc/rf   Õ

ªW 1à ԏ : r Û ¼( ' a AÜ ¼– Ð 7 £ x‚ Ã Ì % i  . NiO, Pt, CoFe, IrMn _  1 l qw n & h “    ¿ Ü ¼– Ð ì  r o   ) a 7 £ x‚ à ÌÖ  ¦“ É r y Œ •y Œ • 0.02, 0.21, 0.22, 0.13 nm/s s  . ~ à Ì} Œ •r « Ñ ³ ð€  `  ¦ + '– Ð 

#

Œ x-‚   ì ø Í Ö  ¦ y Œ •• ¸\  ¦ 10

s ? /– Ð # Œ % 3 “ É r  r] X  J 

‡ 

`  ¦ ì  r$ 3  # Œ ¿ ºa \  ¦ 8 £ ¤& ñ % i  . ~ à Ì} Œ •_  ³ ð€   } 9 l 

-334-

(2)

 @ /| Ä Ì 0.2 ∼ 0.3 nm– Ð+ ‹ 10 % s ? /_  š ¸ \  ¦   

?

/% 3  . Ê ê \ P % ƒo  \ O   H r « Ñ_   l s § 4 / B G‚  “ É r q & ñ



© œ f . Ë(Hall)-„  · ú š ß ¼l  (extraordinary Hall-voltage am- plitude; EHA) _  8 £ ¤& ñ / B G‚  Ü ¼– РÒ'  % 3 % 3 Ü ¼ 9, 8 £ ¤& ñ r  ü

@ Ò l  © œ“ É r ~ à Ì} Œ •_  à ºf ”  ~ ½ ӆ ¾ Ó`  ¦ & h 6   x % i  . l ï  r r 

«

Ñ[ þ t_   l s § 4  M-H/ B G‚  “ É r œ í„  • ¸€ ª œ ç ß –[ O ™ è  (su- perconducting quantum interference device; SQUID)  

§

4 > ü < ³ ð€   l  F g† < Æ Kerr´ òõ  (surface magneto Kerr effect; SMOKE) – Ð S X ‰ “   % i  .

III. ÷ m Ç] M ö+ s ÇÊ Ý õ m Í ‚ º8 ý

[Buffer layer]/[CoFe(1.0 nm)/Pt(0.8 nm)/CoFe(1.0 nm)]

5

 8 £ x~ à Ì} Œ •_  x-‚    r] X l  (x-ray diffraction; XRD) J

‡  “ É r Pt (111)_  x ß ¼ ° ú כ`  ¦ Ä º[ j % i  .   & ñ ^ ‰_ 

Fig. 1. (a) The Hall-voltage curve and (b) SMOKE curve along the out-of-plane easy axis for the glass/Pt(10 nm)/[CoFe(1.0 nm)/Pt(0.8 nm)]

5

multilayers. (c) The magnetic force image at the upper remanent (H = 0 Oe).

Pt(111) x ß ¼ ° ú כ“ É r CoFe  7 £ x  Ù ¼– Ð y Œ ™™ è % i  .

NiO/Pt 8 £ x ¢ ¸  H Pt 8 £ x Ü ¼– Ð ÷ &# Q e ”   H ! Q( 8 £ x_  8 ú x ¿ ºa 

\

 ¦ 0 \ " f 10 nm t     or (  `  ¦ M :, NiO(111) ¢ ¸  H Pt (111) _  x ß ¼ ° ú כ_  [ jl   H  _  ° ú  “ É r ß ¼l – Ð   z Œ ¤ .

Õ

ª ü @_    & ñ x ß ¼  H ˜ Ðs t  · ú §€ Œ ¤ . [NiO(3 nm)/Pt(0.8 nm)]`  ¦ ! Q( 8 £ x Ü ¼– Ð  6   xÙ þ ¡`  ¦ M :, ì ø Íy © œ $ í ^ ‰ NiO\  _  K

 CoFe8 £ x_  “ § ¨ 8 Š  s # QÛ ¼ ´ òõ  \ O   H s Ä »\  ¦ ¿ º t 

–

Ð ˜ Ѐ Œ ¤ . ' Í   P :  H 3 nm_  # 3 0 A ? /\ " f · û ª“ É r NiO 8 £ x \ 

@

/ # Œ “ § ¨ 8 Š  s # QÛ ¼§ 4 s   _  \ O Ü ¼ 9, ÷  rë ß –  m   “   ] X

ô  Ç Pt 8 £ x Ü ¼– Ð “  K  z  ´“ : r \ " f ¢ - a„  y  ™ èY >  l  M :ë  H s 



. Õ ªo “ ¦ ¿ º  P :  H ì ø Íy © œ $ í ^ ‰ NiO ü < y © œ $ í ^ ‰ CoFe 8

£

x  s \ " f “ § ¨ 8 Š  s # QÛ ¼  H Pt \  _ K  š ¸% i  ) a  â > €  

\

" f { 9 # Q± ú ˜ à º \ O l  M :ë  H s  .

˜

Ð § 4 õ  { 9 u ô  Ç q & ñ  © œ f . Ë-„  · ú š ß ¼l  (EHA) _  / B G

‚ 

“ É r SMOKE – Ð 8 £ ¤& ñ # Œ q “ § % i  . Ñ ü t   f . Ë-„  · ú šõ  Kerr ´ òõ  ß ¼l   H B Ä º { 9 u   9 6   x s » ¡ ¤ s  à ºf ” €  Ü ¼– Ð Ã

ºf ”   l s ~ ½ Ó$ í `  ¦ { “ ¦ e ” % 3  . : £ ¤ y , ì ø Íy © œ $ í ^ ‰ IrMn 8

£

x s  \ O   H r « Ñ\  @ /K  z  ´“ : r \ " f 8 £ ¤& ñ ô  Ç EHA/ B G‚  “ É r “ §

¨ 8

Š  s # QÛ ¼ ´ òõ \  ¦ ° ú   H # Q* ‹ô  Ç ×  æd ” s 1 l x  l s § 4 / B G

‚ 

`  ¦ % 3 `  ¦ Ã º \ O % 3  .

Fig. 1(a) ü < (b)  H à ºf ”   l s ~ ½ Ó$ í `  ¦ ”   glass/Pt(10 nm)/[CoFe(1.0 nm)/Pt(0.8 nm)]

5

 8 £ x~ à Ì} Œ •\  @ / # Œ f . Ë-

„ 

· ú šõ  Kerr ´ òõ _  / B G‚  [ þ t`  ¦ q “ §ô  Ç  כ s  . ¿ º / B G‚  “ É r H

c

= 115 Oe_  ˜ Ð § 4 s   _  { 9 u  % i “ ¦, ° ú  “ É r  l 

&

h “   : £ ¤$ í _  ° ú כ`  ¦ ° ú   H  כ s  ¿ º > h_    É r  l s § 4  M- H / B G‚  `  ¦ : Ÿ x K " f S X ‰ “  ÷ &% 3  .   " f, " î S X ‰ “ ¦ 6   x s ô  Ç Ã

ºf ”   l s ~ ½ Ó$ í `  ¦ ”    8 £ x~ à Ì} Œ •\  @ / # Œ EHA / B G‚  

`

 ¦ : Ÿ x K  8 £ ¤& ñ % i “ ¦, SMOKE M-H / B G‚  Ü ¼– Ð 7 £ x" î % i 



. Fig. 1(c)   H ï ß –À Ó  o_   © œÂ Ò_  ô  Ç  © œI  (H = 0 Oe)

Fig. 2. The major extraordinary Hall-voltage ampli-

tude (EHA) curves along the out-of-plane easy axis

for glass/Buffer/[Pt(0.8 nm)/CoFe (1.0 nm)]

N

/IrMn(10

nm) (N = 2, 3, 4, 5).

(3)

\

" f  l ‰ & ³p  â (magnetic force microscope; MFM) `  ¦ :

Ÿ

x K " f › ' a¹ 1 Ïô  Ç  l ½ ¨% i _   _  z  ´] j % ò  © œ  ”  s  .

8 µm × 8 µm_  Å Ò # 3 0 A– Ð Ã ºf ”   l s ~ ½ Ó$ í `  ¦ ”   [CoFe(1.0 nm)/Pt(0.8 nm)]

5

 8 £ x~ à Ì} Œ •\  @ / # Œ 8 £ ¤& ñ ô  Ç

 כ

s  . # Œl " f,  © œ@ /& h “   V , “ É r ‚   J ‡   + þ AI _  Ô  ¦ç  H{ 9  ô 

Ç  l ½ ¨% i  # 4 [ þ t s  s p  µ 1 ϳ ð  ) a ì ø Íy © œ $ í ^ ‰   ½ + Ë`  ¦ { 



 H [Pt/Co]

3

/NiO/[Co/Pt]

3

ü < Co/Ru/Co  8 £ x ½ ¨› ¸\ " f

%

3 # Q”   · û ª“ É r  l ½ ¨% i  # 4 `  ¦ ˜ Ð# Œï  r % ò  © œõ  ß ¼>   Ø Ô> 



 z Œ ¤  [4,5].

Fig. 2  H ì ø Í4 Ÿ ¤   H Pt/CoFe s 8 £ x ½ ¨› ¸_  8 £ x à º (N = 2, 3, 4, 5) \  ¦ ”   Buffer/[Pt(0.8 nm)/CoFe(1.0 nm)]

N

/Ir Mn(10 nm)  8 £ x~ à Ì} Œ • ½ ¨› ¸\  @ /ô  Ç EHA / B G‚  [ þ t s  . N

= 2{ 9  M :, à ºf ”   l s ~ ½ Ó$ í CoFe/IrMn s 8 £ x ½ ¨› ¸_  “ §

¨ 8

Š  s # QÛ ¼ [ jl  (H

ex

)   H 170 Oe \ " f 350 Oe Ü ¼– Ð 7

£

x  % i  . [CoFe(1.0 nm)/Pt(0.8 nm)]

N−1

_   { Œ • © œ I

\  @ / # Œ f . Ë-„  · ú š_  ß ¼l   H [Pt/CoFe] s 8 £ x ½ ¨› ¸_  8 £ x Ã

º\  q Y V† < Ê`  ¦ Fig. 2 \  ¦ : Ÿ x K  · ú ˜ à º e ” % 3  .   É r 8 £ ¤€  

\

" f, ì ø Íy © œ $ í ^ ‰ IrMn 8 £ x õ  “  ] X ô  Ç [Pt/CoFe]  © œ0 A_ 

“

§ ¨ 8 Š  s # QÛ ¼ [ jl \  @ / # Œ   † < Ês  \ O % 3  . Õ ªX O t ë ß –, ' Í

  P : [Pt/CoFe] 8 £ x \  l “  ô  Ç H

ex

  H [CoFe/IrMn] 8 £ x õ  [CoFe/Pt]

N−1

 8 £ x  s _   © œ  ñ“ § ¨ 8 Š  ½ + Ë_     o– Ð î ß –& ñ ô 

Ç + þ AI – Ð ï ß –À Ó  o_  ß ¼l ë ß –    “ ¦ e ” 6 £ §`  ¦ · ú ˜ à º e ”  .

¢

¸ô  Ç ‹ Œ •à º 8 £ x“   N = 2ü < 4{ 9  M :, CoFe/IrMn s 8 £ x~ à Ì} Œ •

\

 _ K  Ä »• ¸  ) a à ºf ”   l  “ § ¨ 8 Š  ½ + Ë [ jl   H f . Ë Ã º 8 £ x N = 3 õ  5{ 9  M :˜ Ð   s `›   ß ¼>    z Œ ¤ . s  כ “ É r à ºf ”   l s 

~

½ Ó$ í ´ òõ   H 8 £ x à º_     o– Ð › ¸] X  0 p x$ í `  ¦ ] jr ô  Ç . : £ ¤ y

, [CoFe(1.0 nm)/Pt(t

P t

)/CoFe(1.0 nm)]/IrMn(10 nm)

Fig. 3. The HIEC strength as a function of Pt thickness (in units of both nm and ML) for glass/Buffer/CoFe(1.0 nm)/Pt(t

P t

)/CoFe(1.0 nm) /IrMn(10 nm). H

IEC

is de- fined by interval value between two exchange biasing fields of minor loops in inset.



8 £ x~ à Ì} Œ •\ " f Pt ¿ ºa _  † < Êà º– Ð" f  © œ  ñ“ § ¨ 8 Š  ½ + ˧ 4  : £ ¤$ í

“ É

r  7 Hë  H_  Fig. 3õ  4\ " f  7 H_  % i  .



© œ  ñ“ § ¨ 8 Š  ½ + ˧ 4 _  ß ¼l  (H

IEC

)  ”  1 l x   H ‰ & ³ © œ“ É r · û ª

“

É r Pt ç ß –  _  ´ ú “ É r ¼ # \  ¿ º y © œ $ í ^ ‰ 8 £ x  s \ " f % 3 # Q t

  H  © œ  ñ“ § ¨ 8 Š  ½ + Ë_  Ä »{ 9 ô  Ç 5 Å q$ í e ” `  ¦ Fig. 3 \ " f ˜ Ð# Œ Å

ғ ¦ e ”  . # Œl " f, H

IEC

  H ¶ ú š{ 9  ) a Õ ªa Ë >\ " f · ú ˜ à º e ” 1 p w s

 y Û ¼_ …o r Û ¼ / B G‚  _  minor loop\ " f ¿ º “ § ¨ 8 Š  ½ + ˧ 4 



s _  ° ú כÜ ¼– Ð & ñ % i  . 2d ∼ = 0.4 nm (d = 1.96 nm   H (111) €    s _   o ) _  Å Òl \  ¦ ”   Pt ¿ ºa \ " f Å Òl 

&

h “   : £ ¤$ í “ É r y Œ •y Œ • Z. Y. Liu Õ ªÒ  ¨ õ  Bruno Õ ªÒ  ¨ \ " f F K 5

Å

q ç ß –  \  @ / # Œ à º¨ î €  _  — ¸4 S qõ  ] X ƒ   ç ß –  _  í  H " f@ /

–

Ð ì ø Íy © œ $ í ^ ‰– Ð   oô  Ç Ã ºf ” €  _  ”  1 l x: £ ¤$ í   õ ü < Ä »



   [4,6]. Õ ª QÙ ¼– Ð Pt ¿ ºa \  _ ” > r   H  © œ  ñ“ § ¨ 8 Š  

½ +

Ë_  ”  1 l x   H  1 l x“ É r ì ø Íy © œ $ í ^ ‰ IrMn 8 £ x`  ¦ : Ÿ x # Œ í  H

"

f@ /– Ð Ä »• ¸  ) a ì ø Íy © œ $ í ^ ‰ü < › ' a >  e ”  “ ¦ Ò q ty Œ • ) a  .

Õ

ª Q  à º¨ î + þ A © œ  l s ~ ½ Ó$ í _   â Ä º, s  Qô  Ç   õ   H ì ø Í y

© œ $ í ^ ‰   ½ + ËB ^ ‰\ " f % 3 # Q”   ß ¼l ü < „  + þ A& h “   : £ ¤f ç [ þ t õ

  Ø Ô . s  כ “ É r Co/Ru/Co  8 £ x~ à Ì} Œ •\ " f z  ´+ « >& h Ü ¼– Ð



 è ß – |   Å Òl  t

Ru

= 1.1 nm _    õ – Ð" f [5],   ½ + Ë[ j l

 t

Ru

\  y Œ ™™ è   H Ruderman-Kettel-Kasuya-Yoshida (RKKY) - + þ A   ½ + Ë [7]\  _ K  l “   l  M :ë  H s  .

Ã

ºf ”   l s ~ ½ Ó$ í `  ¦    · p y Û ¼_ …o r Û ¼ / B G‚  \  @ / 

#

Œ ×  æ כ ¹ô  Ç   o° ú כõ  EHA / B G‚  “ É r 0.4 nm \ " f 1.4 nm   t

_  # 3 0 A\  e ”   H Pt_  ¿ ºa ü < 1.0 nm – Ð “ ¦& ñ ÷ &# Q e ”   H CoFe 8 £ x`  ¦ Ÿ í† < Êr †   6> h_  [CoFe/Pt/CoFe]/IrMn  8 £ x

~ Ã

Ì} Œ • ½ ¨› ¸\  ¦ Fig. 4 \    Í Ç x . Fig. 3 ü <  ð ø Ít – Ð Fig. 4 \ " f Ÿ í o © œI _   l  © œõ  Ÿ í o © œI _  EHA / B G‚   [

þ

t – РÒ'  Pt 8 £ x ¿ ºa _  _ ” > r$ í `  ¦  © œ[ j >  · ú ˜ à º e ”  .

t

P t

_  0.4 nm ü < 0.8 nm \  @ / # Œ   oü < q & ñ  © œ f . Ë-„  

Fig. 4. The major anomalous Hall-voltage curves along

the out-of-plane easy axis for glass/Buffer/CoFe(1.0

m)/Pt(t

P t

)CoFe(1.0 nm)/IrMn(t

P t

= 0.4, 0.8, and 1.2

nm vs t

P t

= 0.6, 1.0, and 1.4 nm).

(4)

·

ú š ß ¼l _  ü @ Ò l  © œ _ ” > r$ í “ É r [Pt/Co]

3

/NiO/[Co/Pt]

3



8 £ x~ à Ì} Œ • ½ ¨› ¸ü < Ä » ô  Ç ü @ Ò l  © œ _ ” > r$ í `  ¦ t “ ¦ e ”  t

ë ß –, H

IEC

_  ß ¼l   H [Pt/Co]

3

/NiO/[Co/Pt]

3

 8 £ x~ à Ì} Œ •

½

¨› ¸˜ Ð  2ì  r_  1 & ñ • ¸  Œ •  [4]. H

IEC

  H 0.4 nm ü < 0.8 nm \  ] X   H   H t

P t

ü < ° ú  s  7 £ x   9, @ /| Ä Ì ¿ º " é ¶  8 £ x s

 t

P t

_  0.4 nm ¢ ¸  H 0.8 nm \  K { © œ # Œ €  • 1 kOe ° ú כ

`

 ¦ ° ú “ ¦ e ”  . t

P t

= 0.8 nm \ " f t

P t

\  @ / # Œ ° ú כs  2ì  r _  1 t  y Œ ™™ è # Œ 1.2 nm { 9  M :, H

IEC

° ú כ_  # 3 0 A\  ¦  Å 

>

 7 £ x  % i  . t

P t

= 0.6 nm, 1.0 nm, Õ ªo “ ¦ 1.4 nm{ 9  M

:, q & ñ  © œ f . Ë-„  · ú š ß ¼l _  / B G‚  Ü ¼– Ð % 3 “ É r H

IEC

  H  _  0 s  . Õ ª QÙ ¼– Ð, s    õ   H Pt ¿ ºa _  ç ß –   8 £ x`  ¦ ”   IrMn`  ¦ : Ÿ x K " f Ä »• ¸  ) a [CoFe/Pt/CoFe]  8 £ x~ à Ì} Œ • ½ ¨› ¸ _  r Û ¼% 7 ›\  @ / # Œ   è ß – “ ¦Ä »ô  Ç  © œ  ñ“ § ¨ 8 Š  ½ + Ë_  ”   1

l

x   H _ ” > r$ í { 9   כ Ü ¼– Ð # Œ ”   . s   H à ºf ”   l s ~ ½ Ó

$ í

_  “ § ¨ 8 Š  s # QÛ ¼ r Û ¼% 7 ›_  ×  æ כ ¹ô  Ç : £ ¤f ç ×  æ  _  ‰ & ³



© œs  “ ¦ ½ + É Ã º e ”  .

IV. + s Ç Â ] Ø

[Pt/CoFe]

N

/IrMn  8 £ x~ à Ì} Œ •_   l & h “   : £ ¤$ í \  @ / 

#

Œ 8 £ x à º (N) _  _ ” > r$ í `  ¦ ƒ  ½ ¨ % i  . ¢ ¸ô  Ç Ã ºf ”   l  s

~ ½ Ó$ í `  ¦ ”   [CoFe/Pt/CoFe]/IrMn  8 £ x~ à Ì} Œ •\  @ /K  Pt 8 £ x ¿ ºa _  ç ß –  s  7 £ x † < Ê\      © œ  ñ“ § ¨ 8 Š  ½ + Ë_  ß ¼ l

\  ”  1 l x   H  כ `  ¦ › ' a¹ 1 Ï % i  . Õ ª ”  1 l x_  Å Òl   H @ /| Ä Ì

¿

º " é ¶  8 £ x_  ¿ ºa \  K { © œ   H 0.4 nm & ñ • ¸s  .   " f

[CoFe/Pt/CoFe]/IrMn  8 £ x~ à Ì} Œ • ½ ¨› ¸  H q  $ í F K5 Å q _

 Pt ç ß –  \  : £ ¤Z > ô  Ç › ' a >  e ” % 3  . Pt 8 £ x ¿ ºa _  † < Ê Ã

º– Ð" f  © œ  ñ“ § ¨ 8 Š  ½ + ˧ 4 s  ”  1 l x   H ì ø Í6 £ x“ É r ì ø Íy © œ $ í ^ ‰ IrMn 8 £ x`  ¦ : Ÿ x K " f Ä »• ¸÷ &  H ì ø Íy © œ $ í ^ ‰ 7 á x À Óü < › ' a > 

e ”

6 £ §`  ¦ · ú ˜ à º e ” % 3  .

P c

p 8 ý ò k >

‘

: r ƒ  ½ ¨  H ô  Dz D G† < ÆÕ ü t”  < É ª F é ß –_  ‚  • ¸ƒ  ½ ¨t " é ¶ õ ] j (õ  ]

j    ñ KRF-2004-041-D00316)t " é ¶ \  _ K  à º' Ÿ ÷ &% 3 _ þ v m

 .

Y c

p w Š à U Ø ”  ô

[1] P. Grunberg et al., Phys. Rev. Lett. 57, 2442 (1986).

[2] P. Bruno and Chappert, Phys. Rev. Lett. 67, 1602 (1991).

[3] M. D. Stiles, Phys. Rev. B 48, 7238 (1993).

[4] Z. Y. Liu and S. Adenwalla, Phys. Rev. Lett. 91, 37207 (2003).

[5] D. T. Margulies et al., Appl. Phys. Lett. 80, 91 (2002).

[6] S. S. Lee et al., Phys. stat. sol. (c) 1, 3360 (2004), P.

Bruno, Phys. Rev. B 52, 411 (1995).

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(1990).

(5)

Oscillatory Interlayer Exchange Coupling in [CoFe/Pt/CoFe]/IrMn Multilayers with Perpendicular Anisotropy

J. G. Choi

Department of Functional Electronic Materials, Graduation, Sangji University, Wonju 220-702

S. S. Lee

and D. G. Hwang

Department of Functional Electronic Materials, Graduation,

Sangji University and Department of Computer and Electronic Physics, Sangji University, Wonju 220-702

S. W. Kim

Life Science Institute, Sangji University, Wonju 220-702 (Received 17 March 2005)

The effect of the number of bilayer repeats, N, upon the magnetic properties of [Pt/CoFe]

N

/IrMn is studied. An oscillatory interlayer exchange coupling(IEC) has been shown in pinned [CoFe/Pt/

CoFe]/IrMn multilayers with perpendicular anisotropy. The period of oscillation corresponds to about 2 monolayers of Pt. The oscillatory behavior of IEC depends on the nonmagnetic metallic Pt thickness and is thought to be related to the antiferromagnetic ordering induced by the IrMn layer.

PACS numbers: 75.30.Et, 75.70.Ak

Keywords: Interlayer exchange coupling (IEC), Perpendicular anisotropy, Nonmagnetic metallic Pt layer, Antiferromagnetic IrMn layer

E-mail: [email protected]

수치

Fig. 2. The major extraordinary Hall-voltage ampli- ampli-tude (EHA) curves along the out-of-plane easy axis for glass/Buffer/[Pt(0.8 nm)/CoFe (1.0 nm)] N /IrMn(10 nm) (N = 2, 3, 4, 5).
Fig. 4. The major anomalous Hall-voltage curves along the out-of-plane easy axis for glass/Buffer/CoFe(1.0 m)/Pt(t P t )CoFe(1.0 nm)/IrMn(t P t = 0.4, 0.8, and 1.2 nm vs t P t = 0.6, 1.0, and 1.4 nm).

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