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Volume 60, Number 6, 2010¸   6 Z 4, pp. 591∼594

New Physics: Sae Mulli (The Korean Physical Society), DOI: 10.3938/NPSM.60.591

ƒ

º‚ ºP } º§ Ž7 0Y  Œ Ÿ «X N ˋ ˜ m ù p § T “ Ó Þ” X ¢ ‰ ˜ mø m Çä Ä ’ ˜ m} º  x ¢š ½¬ Ž8 ý    ºô m É Œ Ÿ «X N Ë; c 6

” X ¢ Ž ì ŏ ŒÑ ÷ ‰ ˜ mø m Çä Ä ’ ˜ m} º x ¢š ½¬ Ž  ú n Þ= 0, f Ç  ¹ Å4 „ ÇÊ Ý ² Ž O U ­ Ž' [ < gX c l

™ »# Ü g Y @

ô

 Dz D G õ † < Æl Õ ü tƒ  ½ ¨" é ¶, – Ð4 Ÿ ©· r Û ¼% 7 ›ƒ  ½ ¨‘ : r  Ò, Ÿ íž Ð_ ” Û ¼/G ' p" fr Û ¼% 7 ›G ' p' , " fÖ  ¦ 136-791

“

¦ 9@ /† < Ɠ § „   „  l / B N † < Æõ , " fÖ  ¦ 136-713

™ »? £ Ó

“

¦ 9@ /† < Ɠ § „    „  l / B N † < Æõ , " fÖ  ¦ 136-713

™ »` 9 ‡ Ú · _  @* å ? 

ô

 Dz D G õ † < Æl Õ ü tƒ  ½ ¨" é ¶, – Ð4 Ÿ © ·r Û ¼% 7 ›ƒ  ½ ¨‘ : r  Ò, Ÿ íž Ð_ ” Û ¼/G ' p" fr Û ¼% 7 ›G ' p' , " fÖ  ¦ 136-791 (2010¸   5 Z 4 11{ 9  ~ à Î6 £ §, 2010¸   6 Z 4 10{ 9  > F  S X ‰& ñ )

‘

: r  7 Hë  H \ " f Ä ºo   H š ¸f ”  Ÿ íž Ðo ™ èÕ ªA x  (photolithography) / B N& ñ ë ß –`  ¦ s 6   x # Œ é ß –{ 9 # 4  ò ø ͙ è  ” ¸ È

ÓÚ Ô (single-walled carborn nanotube; SWNT)\  ¦ z  ´o – B H l ó ø Í0 A\  ‚  × þ ˜& h Ü ¼– Ð f  ¨ ‚ à Ìr v   H / B N& ñ ~ ½ ÓZ O  õ

 s \  ¦ s 6   x ô  Ç „  > ´ òõ  à Ô ½ ™t Û ¼'  (field emission transistor; FET)_  ] j Œ •~ ½ ÓZ O \  @ /K  “ ¦¹ 1 Ï % i  .

í ß

– o} Œ •(SiO

2

) s  + þ A$ í  ) a z  ´o – B H l ó ø Í0 A\  Ÿ íž Ðo ™ èÕ ªA x  / B N& ñ `  ¦ s 6   x # Œ e ” _ _  Ÿ íž ÐY Ut Û ¼à Ô J ‡   s

 + þ A$ í ÷ &% 3  . Ÿ íž ÐY Ut Û ¼à Ô J ‡   ) a l ó ø Í“ É r SWNT  ì  r í ß –  ) a  s 9 þ t – Ж Ð $ ™H $ ™ (dichlorobenzene)6   x Ó 

o 5 Å q \  { Œ ™”   .  6 £ §“ É r Ÿ íž ÐY Ut Û ¼à Ô J ‡  s  ] j ÷ &“ ¦,   õ & h Ü ¼– Ð octadecyltrichlorosilane (OTS)

\ 

¦  6   x   H l ” > r _  4 Ÿ ¤ ¸ ú šô  Ç  o† < Æ& h  õ & ñ \ O s • ¸ ™ èš ¸Û ¼ü < × ¼Y U“   „  F G  s \  ‚  × þ ˜& h Ü ¼– Ð SWNT G  V ,

[ þ t s   l › ¸w n  ÷ &% 3  . s   l › ¸w n / B N& ñ s  s 6   xH † d Ü ¼– Ð" f SWNT Y O w  G V , – Ð ½ ¨$ í  ) a  ×  æ G V ,  FET  $ í / B N& h Ü ¼– Ð ] j Œ •÷ &% 3  .

Ù þ

˜d ” # Q: é ß –{ 9 # 4  ò ø ͙ è ” ¸È ÓÚ Ô, „  > ´ òõ  à Ô ½ ™t Û ¼' , Ÿ íž Ðo ™ èÕ ªA x 

Study on the Self-assembled Process of Single-walled Carbon Nanotubes (SWNTs) Fabricated Using Only Photolithography and the Fabrication of

SWNT-based Multi-channel Field-emission Transistors

Kyeong Heon Kim

Photonics/Sensor System Center, Robotics/Systems Division, Korea Institute of Science and Technology, Seoul 136-791 Department of Electronic Engineering, Korea University, Seoul 136-713

Tae Geun Kim

Department of Electronic Engineering, Korea University, Seoul 136-713

Sun Ho Kim · Young Tae Byun

Photonics/Sensor System Center, Robotics/Systems Division, Korea Institute of Science and Technology, Seoul 136-791

(Received 11 May, 2010 : accepted 10 June, 2010)

-591-

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-592- ô  Dz D GÓ ü t o † < Æ rt  “D hÓ ü t o ”, Volume 60, Number 6, 2010¸   6 Z 4

In this research, we investigated a selective assembly method of fabricating single-walled carbon nanotubes (SWNTs) on a silicon (Si) surface by using only a photolithographic process; then, we fab- ricated field-emission transistors (FETs). Photoresist (PR) patterns were made on a silicon-dioxide (SiO

2

)-grown Si substrate by using a photolithographic process. This PR-patterned substrate was dipped into a SWNT solution dispersed in dichlorobenzene (DCB). The PR patterns were removed by using aceton. As a result, selectively-assembled SWNT channels could be obtained between two electrodes (source and drain electrodes) without complicated chemical steps using octadecyl- trichlorosilane (OTS). Finally, we successfully fabricated SWNT-based multi-channel FETs by using our novel self-assembly method.

PACS numbers: 07.79, 85.30.T

Keywords: SWNT, CNT, FET, Photolithography

I. " e  ] Ø

1991¸   Iijima\  _ K  ò ø ͙ è ” ¸È ÓÚ Ô (catbon nanotube;

CNT)  % ƒ6 £ § µ 1 Ï|   ) a s Ê ê,  ” ¸ % ò % i \ " f D h– Ðî  r Ó ü t o

‰ & ³ © œõ  † ¾ Ó © œ  ) a Ó ü t o & h  : £ ¤$ í [ þ t s  ˜ Г ¦÷ &# Q M ® o   [1,2].

CNT  H & ñ ˜ Ð: Ÿ x’  , \  -t , _ « Ñ, „    ì  r  \  s Ø Ôl   t

  € ª œô  Ç ì  r  \ " f ƒ  ½ ¨÷ &“ ¦ e ” Ü ¼ 9, Õ ª  © œ\ O & h   Œ ™F § 4 

•

¸ B Ä º ß ¼ . : £ ¤ y  CNT\  ¦ s 6   x ô  Ç „  > ´ òõ  à Ô ½ ™t Û ¼'  (field effect transistor; FET)   B j— ¸o  ™ è   H ì ø ͕ ¸^ ‰_ 

| 9

& h • ¸\  ¦ Z  } s l  0 Aô  Ç Ó ü t| 9 – Ð Å Ò3 l q ~ à Γ ¦ e ”  .   " f l 

”

> r z  ´o – B H l ì ø Í_  „    ™ è ü <  H ² ú ˜o  “ ¦| 9 & h , “ ¦$ í 0 p x _  ì

ø ͕ ¸^ ‰ ™ è \  ¦ ë ß –× ¼  H  כ s  0 p x K  & ’   [3,4].

Õ

ª Q  z  ´o – B H l ì ø Í ™ è  ˜ Ð   s `›   Ä ºÃ ºô  Ç : £ ¤$ í `  ¦  f ”

\ • ¸ Ô  ¦ ½ ¨ “ ¦ @ /| ¾ ÓÒ q tí ß –s   & ñ § > =, Õ ªo “ ¦ J ‡  ] j Œ • s

 # Q§ > l  M :ë  H \   f ”   © œ6   x  o 3 l w ÷ &“ ¦ e ”   [5].   

"

f s  Qô  Ç CNT l ì ø Ís   ) a „    ™ è _  > hµ 1 Ï`  ¦ 0 AK 

"

f ç ß –é ß –ô  Ç / B N& ñ é ß –> \  ¦  u   H CNT  l  › ¸w n / B N& ñ \  @ / ô

 Ç ƒ  ½ ¨ € 9 à º& h Ü ¼– Ð כ ¹½ ¨÷ &% 3  .

OTS (octadecyltrichlorosilane)\  ¦  6   x ô  Ç  l  › ¸w n / B N

&

ñ “ É r Ÿ íž Ðo ™ èÕ ªA x \  ¦ s 6   x # Œ @ /€  & h _  $ “ : r/ B N& ñ `  ¦

0 p x >  ë ß –[ þ t% 3 “ ¦, ; Ÿ ¤ s  3 ∼ 4 µm“   f ” ‚  % ò % i \   ” ¸ Ó

ü t| 9 s  J ' _ ç | ¨ c à º e ” >  % i   [6]. Õ ª Q  6   xÓ  o/ B N& ñ

\

  6   x ÷ &  H OTS  H : £ ¤$ í s  Ô  ¦ î ß –& ñ # Œ ~ à Ì} Œ •s  7 £ x ‚ Ã Ì | ¨ c M

: à ºÖ  ¦ s  b  # Qt   H é ß –& h `  ¦ ° ú   H  . Õ ª   õ , OTS 6   xÓ  o _

 F   Ö ¸6   x s  # Q§ > “ ¦, : £ ¤& ñ “ : r • ¸ü < _ þ v • ¸ Ä »t ÷ &  H › ¸| 

\

" f OTS ~ à Ì} Œ •s  7 £ x ‚ Ã Ì  ) a Ê ê,  6   x ) a OTS 6   xÓ  os  ` ‚l 

÷

&# Q    H ë  H ] j& h `  ¦ î ß –“ ¦ e ”  . Õ ª QÙ ¼– Ð OTS 6   xÓ  os 



6   x ) a  l › ¸w n “ É r / B N& ñ › ¸| s  B Ä º   \  v “ ¦, q 6   x8 £ ¤

€

 \ " f Ô  ¦ o K  ”   . ¢ ¸ô  Ç OTS 6   xÓ  o“ É r à ºì  r õ  ì ø Í6 £ x # Œ

;

Ÿ

¤ µ 1 Ï | ¨ c 0 A+ « >$ í s  e ” l M :ë  H \  Á ºÃ º Ù כ ˜í ß –\   B$ 3  # Œ  

E-mail: [email protected]

Fig. 1. Schematic diagram of the SWNT assembly method using only a photolithographic process.

6  

x ) a Ê ê ` ‚l \ O ^ ‰\  ¦ s 6   x # Œ ` ‚l ÷ &# Q    H ë  H ] j& h 

•

¸ t “ ¦ e ”   [7].

‘

: r  7 Hë  H \ " f  H l ” > r _  OTS\  ¦ s 6   x   H  l › ¸w n  / B N

&

ñ _  ë  H ] j& h `  ¦ K    l  0 AK " f OTS 6   xÓ  os   6   x ÷ &t 

· ú

§  H D h– Ðî  r / B N& ñ `  ¦ ] jî ß –ô  Ç . 7 £ ¤, l ” > r _  OTS\  ¦  6   x ô  Ç



l › ¸w n  / B N& ñ \ " f OTS C ] j÷ &% 3 `  ¦ ÷  r ë ß –  m  , ] j

#

Q l  # Q 9 ° ?~   SWNT (single-walled nanotube)• ¸ Ÿ í

ž

Ðo ™ èÕ ªA x  / B N& ñ ë ß –`  ¦ s 6   x # Œ SiO

2

 © œ_  " é ¶   H 0 A u

\  ~ 1 >  f  ¨ ‚ Ã Ì r ~  ´ à º e ”   H l Z O s  ƒ  ½ ¨÷ &% 3  . Õ ªo 

“

¦ > hµ 1 Ï  ) a D h– Ðî  r  l › ¸w n  / B N& ñ `  ¦ s 6   x # Œ  ×  æ G V ,  SWNT FET ™ è  $ í / B N& h Ü ¼– Ð ] j Œ •÷ &% 3  .

II. Ä ] Ø Â ] Ø

1. ÷ m Ç] M ö õ m Í + s ÇÊ Ý

Figure 1“ É r Ÿ íž Ðo ™ èÕ ªA x \  ¦ s 6   x ô  Ç SWNT  l › ¸ w n

 / B N& ñ \  @ /ô  Ç > h¥ Æ • ¸s  . 1050

C _  _ þ vd ”  \ P S X ‰ í ß –– Ð

(thermal furnace)\  ¦ s 6   x # Œ 120 nm_  \ P í ß – o} Œ • (ther-

mal oxide; SiO

2

) s  $ í  © œ  ) a z  ´o – B H l ó ø Í 0 A\  Ÿ íž ÐY Ut Û ¼

(3)

Ÿ

íž Ðo ™ èÕ ªA x  / B N& ñ ë ß –`  ¦ s 6   x ô  Ç é ß –{ 9 # 4  ò ø ͙ è  ” ¸È ÓÚ Ô_  · · · – ^ ”  ⠉  ³ 1 p x -593-

Fig. 2. SEM images of self-assembled SWNT patterns.

(a) SWNTs on phtoresist(PR) patterns and a SiO

2

- grown Si substrate, (b) Magnified SEM image of (a), (c) Magnified SEM image of a SiO

2

region in (b), (d) Magnified SEM image of a PR region in (b), (e) SEM image of self-assembled SWNT patterns after removing PR patterns, and (f) Magnified SEM image of a rectangle in (e).

à

Ô • ¸Ÿ í  ) a  . Ÿ íž Ðo ™ èÕ ªA x  / B N& ñ Ü ¼– Ð SWNT f  ¨

‚ Ã

Ì | ¨ c  Òì  r _  \ P í ß – o} Œ • ³ ð€  s  ” ¸Ø  ¦ ÷ &• ¸2 Ÿ ¤ Ÿ íž ÐY Ut Û ¼ à

Ô J ‡  s  + þ A$ í  ) a  . Ÿ íž ÐY Ut Û ¼à Ô J ‡  s  + þ A$ í  ) a l  ó

ø ͓ É r œ í6 £ § \  ¦ s 6   x # Œ  s 9 þ t – Ж Ð $ ™H $ ™ (dichloroben- zene; DCB) 6   x B  5 Å q \ " f 1r ç ß – 1 l x î ß – ì  r í ß –  ) a SWNT ì  r í ß

– 6   xÓ  o(0.2 mg/ml)5 Å q \  €  • 1 ∼ 3ì  r 1 l x î ß – { Œ ™”   .   õ 

&

h Ü ¼– Ð Ÿ íž ÐY Ut Û ¼à Ô ³ ð€  õ  SiO

2

³ ð€  0 A\  — ¸¿ º SWNT

 f  ¨ ‚ Ã Ì  ) a  . SWNT f  ¨ ‚ Ã Ì  ) a r « э  H  [ j— : r`  ¦ s 6   x 

#

Œ Ÿ íž ÐY Ut Û ¼à Ô J ‡  s  ] j   ) a  . Ÿ íž ÐY Ut Û ¼à Ô ] j 

÷

&  H õ & ñ \ " f Ÿ íž ÐY Ut Û ¼à Ôü < Õ ª 0 A\  f  ¨ ‚ Ã Ì  ) a SWNT

 1 l x r \  ] j ÷ &# Q SiO

2

³ ð€  s  ” ¸Ø  ¦ ) a  .   õ & h Ü ¼– Ð

Ÿ

íž ÐY Ut Û ¼à Ô J ‡  s  \ O % 3 ~   SiO

2

J ‡   0 A\  f  ¨ ‚ à Ì÷ &# Q e ”

~   SWNTë ß –s  z Œ ™>  ÷ &# Q ‚  × þ ˜& h “   SWNT J ‡  s  % 3 

# Q”   .

Figure 2  H SWNT J ‡  s  + þ A$ í ÷ &  H õ & ñ _  „   ‰ & ³p 

 â

(Scanning electron microscope; SEM)  ”  s  . Fig- ure 2(a)  H Ÿ íž ÐY Ut Û ¼à Ô J ‡  s  + þ A$ í  ) a SiO

2

/Si r « Ñ

SWNT 6   xÓ  o\  { Œ ™”   Ê ê, r « Ñ_  ³ ð€  \  f  ¨ ‚ Ã Ì  ) a SWNT

\

 ¦ 8 £ ¤& ñ ô  Ç SEM  ”  s  .  ”  _  C Ö  ¦ s  3,000C s l  M : ë

 H \  f ”  â s  à º nms “ ¦ U  ´s  à º µm“   SWNT  ”  

\

" f ˜ Ðs t  · ú §  H  . Fig. 2(b)  H Fig. 2(a)\  ¦ 10,000 C – Ð S X

‰ @ /ô  Ç SEM  ”  s  . Ÿ íž ÐY Ut Û ¼à Ô_  ‚  ; Ÿ ¤“ É r €  • 3.78 µm s  . s   ”  \ " f• ¸  l  › ¸w n  ) a SWNT  — ¸¿ º ˜ Ð s

t  · ú §l  M :ë  H \   8 Z  }“ É r C Ö  ¦ s  € 9 כ ¹  .

Fig. 3. SEM image of SWNT multi-channel patterns(×2000).

Figures 2 (c) ü < (d)  H y Œ •y Œ • Fig. 2(b)_  SiO

2

~ à Ì} Œ •  Òì  r õ

 PR  Òì  r s  S X ‰ @ /  ) a  ”  s  . s  M : C Ö  ¦“ É r 30,000 C 

“

 X < SiO

2

ü < Ÿ íž ÐY Ut Û ¼à Ô 0 A\  f  ¨ ‚ Ã Ì  ) a SWNT  ‚  " î

>  ˜ Г   . ¿ º  ”  `  ¦ q “ § €   Ÿ íž ÐY Ut Û ¼à Ô ³ ð€  ˜ Ð



 SiO

2

³ ð€  \   8 ´ ú §“ É r SWNT  f  ¨ ‚ Ã Ì  ) a  כ `  ¦ S X ‰ “  ½ + É Ã º e ”

 . Õ ª s Ä »  H SWNT  ™ èà º$ í ³ ð€  ˜ Ð  • 2 ;à º$ í ³ ð€  

\

  8 ¸ ú ˜ f  ¨ ‚ à Ì÷ &l  M :ë  H s   [8]. 7 £ ¤, ™ èà º$ í “   Ÿ íž ÐY Ut  Û

¼à Ô ³ ð€   ˜ Ð  • 2 ;à º$ í “   SiO

2

³ ð€  \  SWNT  8 ¸ ú ˜ f

 ¨ ‚ à Ì÷ &Ù ¼– Ð s  : £ ¤$ í `  ¦ ¸ ú ˜ s 6   x €   ‚  × þ ˜& h “   SWNT J 

‡

 s  ] j› ¸ | ¨ c à º• ¸ e ”  .

Figure 2(e)  H Fig. 2(a) _  Ÿ íž ÐY Ut Û ¼à Ô J ‡  s   [ j

—

: r (aceton) Ü ¼– Ð ] j   ) a Ê ê_  SEM  ”  s  . Fig. 2(a)_ 



”  õ  q “ § l  0 AK " f SEM  ”  _  C Ö  ¦“ É r ×3000 s  .

Fig. 2(e) \ " f · ú ˜ à º e ” 1 p w s  SWNT \ O   H SiO

2

³ ð€   % ò

%

i õ  SWNT f  ¨ ‚ Ã Ì  ) a % ò % i s  ‚  " î >  ¸ ú ˜ ½ ¨ì  rH † d`  ¦ S X ‰

“

 ½ + É Ã º e ”  . Fig. 2(f)  H Fig. 2(e) _   y Œ •+ þ A % ò % i \ " f SWNT f  ¨ ‚ à Ì Òì  r`  ¦ 30,000 C – Ð S X ‰ @ / # Œ 8 £ ¤& ñ ô  Ç SEM  

”

 s  . s   ”  Ü ¼– РÒ'  SWNT SiO

2

³ ð€  0 A\  ¸ ú ˜ f  ¨

‚ Ã

Ì÷ &# Q e ” 6 £ §`  ¦ · ú ˜ à º e ”  .

Figure 3“ É r U  ´s  24 µms “ ¦ ; Ÿ ¤ s  6 µm“   f ”  y Œ • + þ

As  – Ð ~ ½ ӆ ¾ ÓÜ ¼– Ð 2> hü < [ j– Ð ~ ½ ӆ ¾ ÓÜ ¼– Ð 19> h C \ P  ) a SWNT # QY Us _  SEM  ”  s  . Fig. 1_   l › ¸w n  / B N& ñ õ

& ñ \ " f ˜ Ѝ  H  כ % ƒ! 3  r « Ñ SWNT 6   xÓ  o\  { Œ ™”   Ê ê,

Ÿ

íž ÐY Ut Û ¼à Ô ] j   ) a Si l ó ø Í_  SEM  ”  s  . SiO

2

~ Ã

Ì} Œ • 0 A\  ‚  × þ ˜& h Ü ¼– Ð f  ¨ ‚ Ã Ì  ) a  ×  æ G V ,  (multi-channel) SWNT J ‡  s  2000C – Ð S X ‰ @ /  ) a  ”  \ " f  H SWNT 

"

î S X ‰ >  ˜ Ðs t  · ú §Ü ¼  Ò  o_  s – РÒ'  SWNT J ‡  

`

 ¦ S X ‰ “  ½ + É Ã º e ”  . 7 £ ¤, Fig. 3 \ " f f ”  y Œ •+ þ A_  ¸ Ï ŠÒ  o % ò

%

i s  SWNT › ¸w n  ) a % ò % i `  ¦    · p . Fig. 3Ü ¼– РÒ'  r

« ѳ ð€  _  " é ¶   H 0 Au \  SWNT ‚  × þ ˜& h Ü ¼– Ð ¸ ú ˜ f  ¨

‚ Ã

Ì÷ &  H  כ s  S X ‰ “   ) a  . s ü < ° ú  “ É r SWNT _   ×  æ G V ,  ] j

›

¸ / B N& ñ l Õ ü t s  s 6   x ÷ &€    ×  æ G V ,  SWNT FET „   ™ è



 ] j› ¸ | ¨ c à º e ”  .

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-594- ô  Dz D GÓ ü t o † < Æ rt  “D hÓ ü t o ”, Volume 60, Number 6, 2010¸   6 Z 4

Fig. 4. (a) SEM image of a fabricated SWNT FET(×100) using SWNT patterns as multi-channels, (b) Magnified SEM image of SWNT multi-channels fabri- cated between two electrodes (× 4000).

Figure 4  H  © œl  ~ ½ ÓZ O Ü ¼– Ð ] j Œ •  ) a SWNT J ‡  `  ¦ G V , 

–

Ð s 6   x ô  Ç  ×  æ G V ,  FET „   ™ è _   ”  s  . × ¼Y U“  

„

 F G (drain electrode; D) s  ý aÄ º @ /g A& h Ü ¼– Ð 2> h e ” “ ¦

™

èš ¸Û ¼ „  F G (source electrode; S) s  × ¼E $ ™“   „  F G  s \  e ”

l  M :ë  H \  2> h_  FET ™ è  ] j› ¸  ) a  כ õ  ° ú  “ É r ´ òõ 

\

 ¦ % 3 `  ¦ à º e ”  . Õ ª   õ  SWNT FET „   ™ è _  Ò q tí ß –

´

òÖ  ¦ (yield) s  2C – Ð † ¾ Ó © œ | ¨ c à º e ”   H  © œ& h s  e ”  . > s  à

Ô „  F G (gate electrode; G)“ É r ™ èš ¸Û ¼ „  F G _   A \  0 A u

K  e ”   H X < ¿ º „  F G  s \  SiO

2

~ à Ì} Œ •s  e ”  .

Figure 4(a) \ " f × ¼Y U“   „  F G _  ; Ÿ ¤ s  200 µms “ ¦, ™ è

š

¸Û ¼-× ¼E $ ™“   „  F G  s _  ; Ÿ ¤ 4 µm s  . Õ ªo “ ¦ ™ èš ¸Û ¼ü <

×

¼Y U“  `  ¦ ƒ       H G V , _  à º  H 19 > h  ) a  . s ü < ° ú  s  19 > h_  G V , s  s 6   x ÷ &  H s Ä »  H ô  Ç G V , s  s 6   x| ¨ c M : ˜ Ð



 G V , _  à º 7 £ x  H † d \     ™ èš ¸Û ¼-× ¼Y U“   „  À Ó 7 £ x

÷ &l  M :ë  H s  .   " f  ×  æ G V ,  FET ™ è   H „  À Ó_  7

£

x; Ÿ ¤ ´ òõ  % 3 # Qt   H  © œ& h • ¸ ° ú >   ) a  . Fig. 4(b)  H ] j



Œ

•  ) a SWNT Y O w G V ,  FET_  SEM  ”  “  X < ™ èš ¸Û ¼ü <

×

¼Y U“    s \  + þ A$ í  ) a  ×  æ G V ,  SWNT J ‡  `  ¦ S X ‰ “    l

 0 AK " f  y Œ •+ þ A % ò % i s  400C \ " f 4000C – Ð S X ‰ @ /÷ &% 3 



. S X ‰ @ /  ) a ¶ ú š{ 9   ”  \ " f ™ èš ¸Û ¼ü < × ¼Y U“    s  SWNT G

V , s  # Œ Q> h ] j Œ •÷ &% 3 6 £ §`  ¦ S X ‰ “  ½ + É Ã º e ”  .

III. + s Ç Â ] Ø

‘

: r  7 Hë  H“ É r Ÿ íž Ðo ™ èÕ ªA x ü < SWNT 6   xÓ  o/ B N& ñ Ü ¼– Ð SWNT\  ¦ z  ´o – B H l ó ø Í0 A\  ‚  × þ ˜& h Ü ¼– Ð C \ P ½ + É Ã º e ” 



 H $ q 6   x x 9 @ /€  & h  / B N& ñ l Õ ü t õ  s \  ¦ s 6   x ô  Ç  ×  æ G V ,  SWNT FET ™ è _  ] j Œ •\  @ /K  ˜ Г ¦ô  Ç .

l

” > r _  OTS 6   xÓ  o\  ¦ s 6   x   H  l › ¸w n  / B N& ñ _  ë  H ] j

&

h

`  ¦ K    l  0 AK " f OTS 6   xÓ  os   6   x ÷ &t  · ú §  H D h– Ð î

 r SWNT  l › ¸w n  / B N& ñ l Õ ü t s  ] jî ß –÷ &“ ¦ ƒ  ½ ¨÷ &% 3  .

s

 l Õ ü t“ É r Ÿ íž Ðo ™ èÕ ªA x ü < SWNT 6   xÓ  o/ B N& ñ ë ß –Ü ¼– Ð SWNT  SiO

2

³ ð€  \  ‚  × þ ˜& h Ü ¼– Ð f  ¨ ‚ Ã Ì | ¨ c à º e ” l  M :ë  H

\

 / B N& ñ é ß –>  ß ¼>  é ß –í  H  o ÷ &% 3  . D h– Ðî  r ~ ½ ÓZ O “ É r OTS 6

  xÓ  os   6   x ÷ &t  · ú §l  M :ë  H \  q 6   x] X y Œ ™õ  à ºÖ  ¦ † ¾ Ó © œs  % 3 

#

Qt “ ¦, / B N& ñ s  é ß –í  H  o ÷ &# Q › ¸w n q 6   x s  y Œ ™™ è÷ &  H  © œ& h 

`

 ¦ ° ú   H  .

SWNT\  ¦ r « ѳ ð€  _  e ” _  0 Au \   l › ¸w n  l  0 A K

" f > hµ 1 Ï  ) a ‘ : r  7 Hë  H _  l Õ ü t s  ì ø ͕ ¸^ ‰ „   ™ è \  ¦ ] j



Œ

•   H X < & h ½ + Ëô  Çt \  ¦ S X ‰ “   l 0 AK " f FET ] j Œ •÷ &% 3 



. FET\ " f ™ èš ¸Û ¼ „  F G õ  × ¼Y U“   „  F G  s _  G V , “ É r



l › ¸w n  / B N& ñ Ü ¼– Ð ] j Œ •  ) a SWNT J ‡  s  . s  SWNT J

‡  “ É r 19 > hs Ù ¼– Ð é ß –{ 9 G V , s       ×  æ G V ,  SWNT FET  $ í / B N& h Ü ¼– Ð ] j Œ •÷ &% 3  .

SWNT FET ™ è   H Û ¼G ' p" f– Ð s 6   x| ¨ c à º e ” Ü ¼ 9 þ

j   H \   H  s š ¸ G ' p" f– Ð" f 0 p x$ í [ þ t s  ƒ  ½ ¨÷ &“ ¦ e ” l  M

:ë  H \  ‘ : r  7 Hë  H \ " f > hµ 1 Ï  ) a l Õ ü t s  s 6   x ÷ &€    ×  æ G V ,  SWNT FET ™ è   H “ ¦y Œ ™• ¸s “ ¦ œ í™ è+ þ A“    ™ èG ' p" f > h µ

1 Ï\   Ö ¸6   x| ¨ c à º e ”  .

P

c p 8 ý ò k >

s

  7 Hë  H“ É r 2010¸  • ¸ KIST_  F " é ¶ Ü ¼– Ð l  › ' a3 l q& h  \ O  _

 t " é ¶`  ¦ ~ à Î   Òì  r& h Ü ¼– Ð Ã º' Ÿ ÷ &% 3 “ ¦, ¢ ¸ô  Ç ² D G ž ÐK € ª œ Â

Ò ™ è › ' a ƒ  ½ ¨> hµ 1 Ï \ O _  ƒ  ½ ¨q  t " é ¶ \  _ K  à º' Ÿ ÷ &% 3  _

þ v m  .

Y

c p w Š à U Ø ”  ô

[1] S. Iijima, Nature 354, 56 (1991).

[2] D. S. Bethune, C. H. Kiang, M. S. De Vries, G. Gor- man, R. Savoy, J. Vazquez and R. Beyers, Nature 363, 605 (1993).

[3] S. J. Trans, A. R. M. Verschueren and C. Dekker, Nature 393, 49 (1998).

[4] R. Martel, T. Schmidt, H. R. Shea, T. Hertel and Ph.

Avouris, Appl. Phys. Lett. 73, 2447 (1998).

[5] E. S. Snow, J. P. Novak, P. M. Campbell and D. Park, Appl. Phys. Lett. 82, 2145 (2003).

[6] M. Lee, J. Im, B. Y. Lee, S. Myung, J. Kang, L.

Huang, Y. -K. Kwon and S. Hong, Nature Nanotech- nology 1, 66 (2006).

[7] J. T. Koh, M. H. Yi, B. Y. Lee, T. H. Kim, J. H.

Lee, Y. M. Jhon and S. H. Hong, Nanotechnology 19, 505502 (2008).

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ture 425, 36 (2003).

수치

Fig. 1. Schematic diagram of the SWNT assembly method using only a photolithographic process.
Fig. 3. SEM image of SWNT multi-channel patterns(×2000).

참조

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