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„

 z Œ ™@ /† < Ɠ § Ó ü t o † < Æõ , F g Å Ò 500-757

(2011¸   7 Z 4 19{ 9  ~ à Î6 £ §, 2011¸   10 Z 4 4{ 9  à º& ñ ‘ : r ~ à Î6 £ §, 2011¸   11 Z 4 7{ 9  > F  S X ‰& ñ )

‘ :

r ƒ  ½ ¨\ " f  H n+ þ AÜ ¼– Ð • ¸i ç  ) a GaN 8 £ x`  ¦ ‚  × þ ˜& h Ü ¼– Ð „  K \ g A † < ÊÜ ¼– Ð" f  ” ¸  / B N$ í GaN\  ¦ ] j



Œ

• “ ¦, q 1 p x ~ ½ Ó$ í F g † < Æ& h  : £ ¤$ í `  ¦ á Ôo 7 £ § & e  ¦  Q\  ¦ s 6   x # Œ ì  r$ 3  % i  . á Ôo 7 £ § & e  ¦  Q 8 £ ¤& ñ `  ¦ 0 AK 

\

g A U  ·s ü < porosity\  ¦ › ¸] X  # Œ & h ] X ô  Ç  ” ¸  / B N$ í GaN\  ¦ ] j Œ • “ ¦, TE, TM ¼ # F g \ " f y Œ •y Œ •_ 

•

¸  — ¸× ¼\  ¦ S X ‰ “   % i  . • ¸  — ¸× ¼ 8 £ ¤& ñ   õ – Ð y Œ • ¼ # F g \  @ /ô  Ç Ï ã J] X Ò  ¦(n

T E

, n

T M

)`  ¦   & ñ ½ + É Ã º e ” 

“

¦, s \  ¦  „ ½ ÓÜ ¼– Ð porosity\    É r Ï ã J] X Ò  ¦    o\  ¦ ì  r$ 3  % i  .  / B N$ í s  \ O   H GaN ½ ¨› ¸\ " f_  ¼ # F g

\

   É r Ï ã J] X Ò  ¦ s (n

T M

-n

T E

)  0.04– Ð › ' a8 £ ¤ ÷ &% 3 “ ¦, s  ° ú כ“ É r  ” ¸  / B N$ í GaN ½ ¨› ¸\ " f  H 0.14 – Ð



8¹ ¡ ¤ & f ” `  ¦ S X ‰ “   % i  .

Ù þ

˜d ” # Q:  ” ¸  / B N$ í , GaN, ¼ # F g, Ï ã J] X Ò  ¦

Analysis of the Optical Anisotropy of Nanoporous GaN

Baro Lee · Jin-Ho Kang · Sang-Wan Ryu

Department of Physics, Chonnam National University, Gwangju 500-757 (Received 19 July 2011 : revised 4 October 2011 : accepted 7 November 2011)

In this research, nanoporous GaN was fabricated by electrochemical etching of n-type GaN, and its anisotropic optical properties were analyzed using the prism coupling technique. The refractive indices n

T E

and n

T M

were determined from the reflection spectra and mode calculations of the TE and the TM waveguide modes. Bulk GaN had an optical anisotropy due to a structural deformation during the growth. However, nanoporous GaN showed a larger optical anisotropy, and the difference between the indices of refraction increased to 0.14. This result agreed well with the numerical calculation.

PACS numbers: 78.20.Ci, 78.66.Fd, 78.67.Rb

Keywords: Nanoporous, GaN, Polarization, Refractive index

I. " e  ] Ø

‰

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³F  GaN\  ¦ l ì ø ÍÜ ¼– Ð ô  Ç LED  H ì ø ͕ ¸^ ‰ “ ¦^ ‰ › ¸" î Ü ¼

–

Ð • 2 ;¨ 8 Š â & h s “ ¦, \  -t  ] X €  • ´ òõ  Ä ºÃ º “ ¦, ì ø Í% ò ½ ¨

&

h “   à º" î `  ¦ ° ú   H 1 p x # Œ Q t   © œ& h Ü ¼– Ð “   # Œ display 6

£

x6   x ì  r  \ • ¸ ´ ú §“ É r › ' a d ” `  ¦ ~ à Γ ¦ e ”   [1]. : £ ¤ y  ? / Ò_ 

E-mail: [email protected]



×  æ € ª œ Ä ºÓ ü t(multiquantum well) \ " f µ 1 ÏÒ q tô  Ç y n C_  Ø  ¦

§

4 õ  ´ òÖ  ¦`  ¦ Z  } s l  0 AK  ² D G ? /\ " f• ¸ ´ ú §“ É r ƒ  ½ ¨ > hµ 1 Ïs 

”

 ' Ÿ ÷ &“ ¦ e ”  .

LED _  F g ´ òÖ  ¦“   ü @ Ҁ ª œ ´ òÖ  ¦“ É r ? / Ҁ ª œ ´ òÖ  ¦ õ  F g Æ

ÒØ  ¦ ´ òÖ  ¦ _  Y  L \  _ K    & ñ ÷ &“ ¦ ° ú  “ É r ? / Ҁ ª œ ´ òÖ  ¦`  ¦

° ú

  H LED\  ¦ ] j Œ • # Œ• ¸ y n C`  ¦ ü @ Җ Ð ~ ½ ÓØ  ¦   H 0 p x§ 4 

“ É

r F g Æ ÒØ  ¦ ´ òÖ  ¦ \  _ K " f ² ú ˜ t >   ) a  . 7 £ ¤ LED ™ è F

“   GaN(Ï ã J] X Ò  ¦ = 2.4) ü < / B N l (Ï ã J] X Ò  ¦ = 1) ü <_  Ï ã J] X 

-1059-

(2)

Fig. 1. (Color online) Schematics of the formation of nanoporous GaN.

Ò

 ¦(refractive index) s – Ð “  K  y n Cs  ~ ½ ÓØ  ¦| ¨ c à º e ”   H e ” 

>

y Œ •(critical angle)s  y Œ ™™ è # Œ ? /Â Ò „  ì ø Í \  _ ô  Ç y n C _

 ’ < Hz  ´s  µ 1 ÏÒ q t >   ) a  . s   H LED _  F g ´ òÖ  ¦`  ¦ y Œ ™™ è r

v   H   & ñ & h “   " é ¶ “  `  ¦ ] j/ B N ô  Ç .

F

g Æ ÒØ  ¦ l Õ ü t“ É r s  Qô  Ç ? / Җ Ð_  ì ø Í \  ¦ } Œ •  ü @ Ò

–

Ð » 1 ÏØ  ¦ >  # Œ ~ ½ ÓØ  ¦ ÷ &  H y n C_  € ª œ`  ¦ † ¾ Ó © œr v l  0 Aô  Ç l

Õ ü t – Ð" f [2] þ j   H \   H  / B N$ í _ (porous) È Ò" î „  • ¸} Œ •\ 

@

/ô  Ç ƒ  ½ ¨ ”  ' Ÿ ÷ &% 3  . Bruggeman effective medium approximation (BEMA) " é ¶ o \   Ø Ô€   ~ à Ì} Œ • ? / Ò_  / B N l

_   Òx  q Ö  ¦(volume fraction) s  7 £ x † < Ê\     ~ à Ì} Œ • _

 Ä »´ ò Ï ã J] X Ò  ¦“ É r y Œ ™™ è >   ) a  .   " f  / B N$ í È Ò" î „  

•

¸} Œ •_   â Ä º ~ à Ì} Œ •_  “ ¦Ä » Ï ã J] X Ò  ¦ ˜ Ð  ± ú “ É r Ï ã J] X Ò  ¦`  ¦ 

| 9

 à º e ” 6 £ §`  ¦ _ p ô  Ç  [3]. s  Qô  Ç " é ¶ o   H Z  }“ É r È Òõ • ¸

 € 9 כ ¹ô  Ç LED_  ITO(indium tin oxide) È Ò" î „  F G \  6 £ x 6

 

x ÷ &% 3  . 7 £ ¤, ITO 7 £ x ‚ Ã Ì r  y Œ •• ¸\  ¦    or & º ¡ § Ü ¼– Ð+ ‹   /

B N$ í `  ¦ & h   Z  } # Œ“ ¦ s   H ITO _  Ä »´ ò Ï ã J] X Ò  ¦`  ¦ & h ”  

&

h Ü ¼– Ð    or &  È Òõ • ¸ Z  }“ É r ITO\  ¦ % 3 `  ¦ à º e ” % 3  .

s

\  ¦ LED \  & h 6   x # Œ F g Æ ÒØ  ¦ ´ òÖ  ¦`  ¦ ß ¼>  † ¾ Ó © œr ~  ´ à º e ”

% 3   [4].

‘

: r ƒ  ½ ¨\ " f  H „  K \ g A ~ ½ ÓZ O `  ¦ s 6   x # Œ • ¸i ç 0 l x • ¸\ 



  ‚  × þ ˜& h Ü ¼– Ð GaN\  ¦ d ” y Œ •† < ÊÜ ¼– Ð" f  ” ¸  / B N$ í GaN

½

¨› ¸\  ¦ ] j Œ • % i “ ¦ s \  @ /ô  Ç q 1 p x ~ ½ Ó$ í F g † < Æ& h  : £ ¤$ í `  ¦ á

Ôo 7 £ § & e  ¦  Q [5]\  ¦ s 6   x # Œ ì  r$ 3  % i  . \ g A › ¸| \ 



   / B N$ í GaN_ porosity\  ¦ › ¸] X ½ + É Ã º e ” “ ¦ s – Ð+ ‹ Ï ã J ] X

Ò  ¦`  ¦ ± ú >  › ¸] X ½ + É Ã º e ”  . s   H GaN ü < / B N l 8 £ x  s 

\

  ” ¸  / B N$ í GaN\  ¦ ¶ ú š{ 9 † < ÊÜ ¼– Ð+ ‹ „  ì ø Í  ‰ & ³ © œ`  ¦ ×  ¦ s

“ ¦ F g Æ ÒØ  ¦ ´ òÖ  ¦`  ¦ Z  }{ 9  à º e ”   H l Õ ü t – Ð & h 6   x| ¨ c à º e ” 

`

 ¦  כ s   \ V © œ  ) a  . ¢ ¸ô  Ç q 1 p x ~ ½ Ó$ í F g † < Æ& h  : £ ¤$ í `  ¦ ì  r$ 3  ô

 Ç   õ – Ð D h– Ðî  r F g † < Æ  © œq \  ¦ [ O >    H X < • ¸¹ ¡ § s  | ¨ c  כ Ü

¼– Ð Ò q ty Œ •  ) a  .

II. ÷ m Ç] M öU ê s0 n É

‘

: r ƒ  ½ ¨\ " f  6   x ) a r « э  H   s # Q l ó ø Í (c-plane)0 A

\

 Ä »l F K5 Å q  o† < Æl  © œ7 £ x ‚ à ÌZ O  (Metal Orgarnic Vapor De- position)`  ¦ s 6   x # Œ $ í  © œ÷ &% 3  . 560

C _  ± ú “ É r “ : r • ¸\ 

Fig. 2. Cross sectional SEM images of electrochemically etched n-GaN (n = 1 × 10

18

cm

−3

) at 40 V for (a) 5 min, (b) 20 min, and (c) 30 min.

"

f   s # Q l ó ø Í0 A\  50 nm ¿ ºa _  GaN buffer 8 £ x`  ¦ $ í



© œô  Ç Ê ê, Õ ª 0 A\  “ : r • ¸\  ¦ 1090

C – Ð `  ¦  9" f 0.5 µm ¿ º a

_  • ¸i ç ÷ &t  · ú §“ É r GaN 8 £ x õ  n+ þ AÜ ¼– Ð Si • ¸i ç  ) a 2 µm

¿

ºa _  n-GaN 8 £ x`  ¦ $ í  © œr (   . $ í  © œ  ) a GaN ü < Ñ þ ˜F K`  ¦ y

Œ

•y Œ • 6 £ §F G (−), € ª œF G (+) \  ƒ     “ ¦, 20

C – Ð Ä »t   ) a 0.3 M 6 Ÿ ¤ ¶ ú ˜í ß –6   xÓ  o (Oxalic acid)\  { Œ ™   H Ê ê, „  · ú šõ  r ç ß –

`

 ¦    or &  n-type GaN\  ¦ „  K \ g A (Electro-chemical etching) [6] % i  . s – Ð+ ‹ Fig. 1\ " f      כ % ƒ! 3   © œ é

ß –_  n-GaN`  ¦ ‚  × þ ˜& h Ü ¼– Ð „  K  \ g A† < ÊÜ ¼– Ð+ ‹ ³ ð€  \   

(3)

Fig. 3. (Color online) Dependence of etch depth on the etching time.

”

¸  / B N$ í GaN8 £ x`  ¦ % 3 `  ¦ à º e ” % 3  .

„

 K \ g A Ê ê ] j Œ •  ) a  ” ¸  / B N$ í GaN_  \ g A U  ·s  ü

< porosity\  ¦ 8 £ ¤& ñ l  0 AK  „   Å Ò ‰ & ³p  â (Scanning electron microscope, JEOL-6701F)`  ¦ s 6   x % i “ ¦, s  כ _

 q 1 p x ~ ½ Ó$ í F g † < Æ& h  : £ ¤$ í `  ¦ À Ò { 9  á Ôo 7 £ § & e  ¦  Q(TiO

2

, Ï

ã J] X Ò  ¦ = 2.496)\  ¦ s 6   x # Œ 8 £ ¤& ñ , ì  r$ 3  % i  . á Ôo 7 £ §

&

e  ¦  Q\ " f  6   x ) a Y Us $   H He-Ne Y Us $  (632.8 nm) s

“ ¦ { 9   c ” _  { 9  y Œ •`  ¦  7 º ¡ § Ü ¼– Ð+ ‹ : £ ¤& ñ y Œ •• ¸\ " f

•

¸  — ¸× ¼ # Œl  H † d`  ¦ S X ‰ “   % i “ ¦ s  כ Ü ¼– Ð € 9 2 £ § _  Ï ã J ] X

Ò  ¦`  ¦ ½ ¨ % i  .

III. ÷ m Ç] M ö+ s ÇÊ Ý

€

 $ , \ g A › ¸| (\ g A r ç ß –, “   „  · ú š)\    É r n+ þ A GaN _  \ g A : £ ¤$ í `  ¦ · ú ˜ ˜ Г ¦  n ' 1 × 10

18

cm

−3

_ 

•

¸i ç 0 l x • ¸\  ¦ ° ú   H r « Ñ\  ¦ ³ ð€   „  K  \ g A † < ÊÜ ¼– Ð" f ³ ð€  

\

  ” ¸  / B N$ í GaN\  ¦ % 3 % 3  . ' Í   P :– Ð, \ g A r ç ß –\ 



 É r \ g A U  ·s _     o\  ¦ ¶ ú ˜( R˜ Ðl  0 A # Œ 40 V\ " f r  ç

ß –`  ¦ 5ì  r \ " f 30ì  r  t  ² ú ˜o  # Œ  9 „  K \ g A`  ¦ ”  ' Ÿ 

% i “ ¦ Fig. 2\    è ß – r « Ñ_  é ß –€   SEM`  ¦ : Ÿ x K  \ g A U

 ·s \  ¦ 8 £ ¤& ñ % i  . › ' a8 £ ¤   õ , \ g A ) a U  ·s  r ç ß –\  q  Y

V # Œ 7 £ x † < Ê`  ¦ ^  ¦ à º e ” % 3  . Fig. 3\  ¦ : Ÿ x K  · ú ˜ à º e ”  1

p

w s  " é ¶   H \ g A U  ·s \  ¦ \ g A r ç ß –_  › ¸] X `  ¦ : Ÿ x K  % 3 `  ¦ Ã

º e ” 6 £ §`  ¦ · ú ˜ à º e ”  . ¿ º   P :– Ð, n-GaN_  „  · ú š\    É r

\

g A : £ ¤$ í `  ¦ › ' a ¹ 1 Ï l  0 A # Œ 40 V, 50 V, 60 V– Ð „  K 

\

g A  ) a  ” ¸  / B N$ í GaN`  ¦ ] j Œ • % i “ ¦, s \  ¦ : Ÿ x K  \ g A

„

 · ú šs  & f ” \     pore t    H q Ö  ¦ s  & f ” `  ¦ S X ‰

“

  ½ + É Ã º e ”  . Fig. 4  H 0 A_  › ¸| Z > – Ð ] j Œ •  ) a  ” ¸  / B N

$ í

GaN_  SEM  ”  s  . : £ ¤ y  Z  }“ É r „  · ú š\ " f  H pore ü <

pore  ½ + Ë5 gf ” Ü ¼– Ð+ ‹ ³ ð€  s  Á º -f ” `  ¦ · ú ˜ à º e ”  .

Fig. 4. Cross sectional SEM images of electrochemically etched n-GaN (n = 1 × 10

18

cm

−3

) at (a) 40 V, (b) 50 V, and (c) 60 V for 5 min.

]

j Œ •  ) a  ” ¸  / B N$ í GaN_  F g † < Æ& h  : £ ¤$ í `  ¦ · ú ˜ ˜ Г ¦



 À Ò { 9  á Ôo 7 £ § & e  ¦  Q\  ¦  6   x % i “ ¦ TE, TM — ¸× ¼ _

 c ” `  ¦ y Œ •y Œ • { 9  r &  • ¸  — ¸× ¼\  ¦ S X ‰ “   “ ¦ s – Ð+ ‹  

”

¸  / B N$ í GaN_  Ï ã J] X Ò  ¦`  ¦ > í ß – % i  . á Ôo 7 £ § & e  ¦  Q 8

£ ¤& ñ `  ¦ 0 AK " f  H  ” ¸  / B N$ í GaN_  ³ ð€  s  B   H K  

“ ¦ pore size @ /| Ä Ì 200 nm s   # Œ  ô  Ç .   " f n ' 4 × 10

18

cm

−3

_  • ¸i ç 0 l x • ¸\  ¦ ° ú   H r « Ñ\  ¦ ± ú “ É r „  

· ú

š“   10 V– Ð 30ì  r 1 l x î ß – \ g A† < ÊÜ ¼– Ð+ ‹ pore size  H @ /| Ä Ì

80 nm, \ g A U  ·s   H 1.354 µm“    ” ¸  / B N$ í GaN 8 £ x

(4)

Fig. 5. (a) Plane view and (b) cross sectional SEM im- ages of etched n-GaN at 10 V for 30 min. The doping of n-GaN was 4 × 10

18

cm

−3

.

`

 ¦ ] j Œ • % i  . Fig. 5  H 0 A_  › ¸| `  ¦ : Ÿ x K  % 3 # Q”    ” ¸



/ B N$ í GaN_  SEM  ”  s  . s Ê ê SEM  ”  `  ¦ : Ÿ x K  pore  + þ A$ í  ) a  Òì  r(/ B N l )õ  + þ A$ í ÷ &t  · ú §“ É r  Òì  r(GaN) _

  © œ@ /& h  €  & h q Ö  ¦`  ¦ : Ÿ x K  €  • 10.46 %_  porosity\  ¦ >  í

ß –½ + É Ã º e ” % 3  .

Figure 6  H GaN ü <  ” ¸  / B N$ í GaN_  TE, TM — ¸× ¼

\

 @ /ô  Ç á Ôo 7 £ § & e  ¦  Q 8 £ ¤& ñ   õ \  ¦ ˜ Ð# ŒÅ ғ ¦ e ” Ü ¼ 9, s 

\

 ¦ : Ÿ x K  : £ ¤& ñ y Œ •• ¸\ " f ì ø Í • ¸ / å L  y  b  # Qt €  " f { 9 



 c ” s  • ¸  — ¸× ¼– Ð # Œl  H † d`  ¦ · ú ˜ à º e ”  . ‰ & ³F  z  ´+ « >  © œ q

_  › ¸| “ É r { 9  y Œ •_  # 3 0 A −60

≤ θ ≤ 20

– Ð ] jô  Ç÷ &

#

Q e ” l  M :ë  H \  GaN_   â Ä º, ' Í   P : — ¸× ¼Â Ò'  í  H & h  Ü

¼– Ð S X ‰ “  ½ + É Ã º \ O  .   " f ‘ : r ƒ  ½ ¨\ " f  H € 9 2 £ § _  ¿ º a

\  ¦ SEM`  ¦ : Ÿ x # Œ 8 £ ¤& ñ ô  Ç ° ú כÜ ¼– Ð “ ¦& ñ r v “ ¦ à º\  ¦ e ”

_ – Ð    or &   9 Ï ã J] X Ò  ¦`  ¦ fitting # Œ ½ ¨ % i  .

Fitting   õ  GaN_  n

T E

= 2.35, n

T M

= 2.39 – Ð l ” > r _

  7 Hë  H õ  { 9 u    H ° ú כ`  ¦ % 3 % 3   [7].  / B N$ í ½ ¨› ¸– Ð “  

# Œ    o  ) a Ï ã J] X Ò  ¦`  ¦ ˜ Ѐ  ,  ” ¸  / B N$ í GaN_  n

T E

= 2.18, n

T M

= 2.32 s  . s   H BEMA " é ¶ o \    H   # Œ ~ Ã Ì }

Œ

• ? / Ò_  / B N l _   Òx  q Ö  ¦ s  7 £ x † < Ê\     ~ à Ì} Œ •_  Ï ã J ] X

Ò  ¦ s  ± ú  f ” õ  { 9 u † < Ê`  ¦ · ú ˜ à º e ”  .

Fig. 6. (Color online) A reflection spectra obtained from prism coupler measurements for (a) TE mode and (b) TM mode.

Fig. 7. (Color online) Dependence of the refractive in- dices on the porosity of nanoporous GaN for TE and TM modes.

 

& ñ ½ ¨› ¸ 8 £ ¤€  \ " f ˜ Ѐ  , c-plane   s # Q l ó ø Í 0 A

(5)

1 p

x ~ ½ Ó$ í s  7 £ x  >   ) a  .

‘

: r ƒ  ½ ¨\ " f  H 0 A_  : £ ¤$ í `  ¦ [ O " î l  0 A # Œ M. Saito 1

p

x s  ] jî ß –ô  Ç € ª œF G í ß – o · ú ˜À Òp ³ o u (anodized aluminum ox- ide: AAO) ½ ¨› ¸\ " f_  4 Ÿ ¤Ï ã J] X õ  s \    É r TE, TM ¼ #  F

g \  @ /ô  Ç Ï ã J] X Ò  ¦ › ' a > d ” `  ¦ ‚ à Л ¸ % i   [8]. AAO € 9 2 £ §

\

" f " é ¶: Ÿ x+ þ A ½ ¨" í _  ì ø Ít 2 £ § s  a, ½ ¨" í  s _   o  b 

“

¦ ½ + É M : € 9 2 £ § _  Ï ã J] X Ò  ¦“ É r  6 £ § õ  ° ú   .

n

T E

= n

1

− πa

2

b

2

n

1

n

21

− n

22



n

21

+ n

22

(1) n

T M

= n

1

− πa

2

2b

2

n

21

− n

22

n

1

(2)

n

1

, n

2

  H y Œ •y Œ • í ß – o· ú ˜À Òp ³ o u, / B N l _  Ï ã J] X Ò  ¦ s  . s 

\

 ¦  ” ¸  / B N$ í GaN\  & h 6   x K  ˜ Ѐ   d ”  (17), (2)_  πa

2

/b

2

“ É r porosity \  K { © œ Ù ¼– Ð 0.1046`  ¦ @ /{ 9  # Œ ½ ¨ K

˜ Ѐ   n

T E

= 2.18, n

T M

= 2.29 e ” `  ¦ · ú ˜ à º e ”  . TE — ¸

×

¼_   â Ä º á Ôo 7 £ § & e  ¦  Q_    õ ü < 1 l x{ 9 ô  Ç Ï ã J] X Ò  ¦`  ¦ % 3 

%

3 “ ¦, TM — ¸× ¼  H 0.03 _  s  e ” % 3  . s   H  6   x ) a — ¸ 4

S qs  AAO € 9 2 £ § ? /\  Å Òl & h Ü ¼– Ð C \ P  ) a " é ¶: Ÿ x+ þ A — ¸€ ª œ_ 

½

¨" í `  ¦ ° ú   H  כ \  q K   ” ¸  / B N$ í GaN  H ½ ¨" í _  C \ P  s

 Å Òl & h s t  3 l w “ ¦ + þ AI  ¢ ¸ô  Ç " é ¶: Ÿ x+ þ Aõ   H s  e ”  l

 M :ë  H“    כ Ü ¼– Ð Ò q ty Œ •  ) a  .

IV. + s Ç Â ] Ø

‘

: r ƒ  ½ ¨\ " f  H   s # Q l ó ø Í0 A\  $ í  © œ  ) a n-type GaN

\

 ¦ „  K \ g A`  ¦ s 6   x # Œ  ” ¸  / B N$ í GaN\  ¦ ] j Œ • “ ¦ s

 כ _  q 1 p x ~ ½ Ó$ í F g † < Æ& h  : £ ¤$ í `  ¦ á Ôo 7 £ § & e  ¦  Q\  ¦ s 6   x

# Œ 8 £ ¤& ñ , ì  r$ 3  % i  .



” ¸  / B N$ í GaN ] j Œ •`  ¦ 0 AK  \ g A › ¸|  (\ g A r ç ß –,

“

  „  · ú š)\    É r \ g A : £ ¤$ í `  ¦ S X ‰ “   % i  . \ g A r ç ß –

\

 q Y V # Œ etched depth 7 £ x  “ ¦ \ g A „  · ú šs  7 £ x 

†

< Ê\     porosity• ¸ 7 £ x  % i  . á Ôo 7 £ § & e  ¦  Q 8 £ ¤& ñ `  ¦ 0

AK  8 £ x _  ¿ ºa ü < porosity\  ¦ Ò q ty Œ • # Œ n ' 4×10

18

cm

−3

•

¸i ç 0 l x • ¸\  ¦ ° ú   H n-GaN`  ¦ 10 V, 30ì  r _  › ¸|  \  \ g A r

(   . s – Ð+ ‹ \ g A U  ·s  1.354 µm s “ ¦ porosity

10.46 %“    ” ¸  / B N$ í GaN\  ¦ % 3 `  ¦ à º e ” % 3  .

K

 ~ à Ì} Œ • ? /_  / B N l  t    H q Ö  ¦ s  & | 9 à º2 Ÿ ¤ ~ à Ì} Œ •_  Ï

ã J] X Ò  ¦ s  ± ú  t   H  כ õ  { 9 u  “ ¦   " f \ g A › ¸| `  ¦

›

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½ + É Ã º e ” `  ¦  כ Ü ¼– Ð \ V © œ  ) a  .

q

1 p x ~ ½ Ó$ í F g † < Æ& h  : £ ¤$ í `  ¦ ì  r$ 3  €   GaN_  ∆n(=

n

T M

− n

T E

) = 0.04 s “ ¦ s   H c-plane   s # Q l ó ø Í\ 

$ í

 © œ  ) a GaN _  uniaxial ½ ¨› ¸ M :ë  He ” `  ¦ · ú ˜ à º e ”  .  ” ¸



/ B N$ í GaN_   â Ä º, ∆n = 0.14– Ð GaN\  q K  q 1 p x ~ ½ Ó

$ í

: £ ¤$ í s  & f ” `  ¦ · ú ˜ à º e ” “ ¦ s   H l ” > r _  s  : r& h  \ V8 £ ¤ õ

• ¸ { 9 u    H   õ s  .

P

c p 8 ý ò k >

s

  7 Hë  H“ É r 2009¸  • ¸ & ñ  Ò(“ §¹ ¢ ¤ õ † < Æl Õ ü t  Ò)_  F " é ¶ Ü ¼

–

Ð ô  Dz D Gƒ  ½ ¨F é ß –_  t " é ¶`  ¦ ~ à Î  à º' Ÿ  ) a l œ íƒ  ½ ¨ \ O  e ”

(No. 2009-0076199).

Y

c p w Š à U Ø ”  ô

[1] E. F. Schubert and J. K. Kim, Science 308, 1274 (2005).

[2] V. Coffey, Laser Focus World. 44, 29 (2008).

[3] Peter K. H. Ho, D. Stephen, Thomas, Richard H.

Friend and Nir Tessler, Science 285, 233 (1999).

[4] J. K. Kim, S. Chhajed, M. F. Schubert, E. F. Schu- bert, A. J. Fischer, M. H. Crawford, J. Cho, H. Kim and C. Sone, Adv. Mater. 20, 4 (2008).

[5] R. Ulrich and R. Torge, Appl. Opt. 12, 2901 (1973).

[6] J. M. Park, K. M. Song, S. R. Jeon, J. H. Baek and S. W. Ryu, Appl. Phys. Lett. 94, 221907 (2009).

[7] H. Y. Zhang, X. H. He, Y. H. Shih, M. Schurman, Z.

C. Feng and R. A. Stall, Opt. Lett. 21, 1529 (1996).

[8] M. Saito and M. Miyagi, J. Opt. Soc. Am A 6, 1895

(1989).

수치

Fig. 2. Cross sectional SEM images of electrochemically etched n-GaN (n = 1 × 10 18 cm −3 ) at 40 V for (a) 5 min, (b) 20 min, and (c) 30 min.
Fig. 4. Cross sectional SEM images of electrochemically etched n-GaN (n = 1 × 10 18 cm −3 ) at (a) 40 V, (b) 50 V, and (c) 60 V for 5 min.
Fig. 7. (Color online) Dependence of the refractive in- in-dices on the porosity of nanoporous GaN for TE and TM modes.

참조

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