MOS Memory
2018년 1학기 반도체소자특성
경북대 전자공학부
2
1 3 5 7 8.5
WL voltage for the selected cell (VDD) ON-cell (“0”) OFF-cell (“1”)
Threshold voltage distribution
?
Charged F-gate discharged F-gate
# of cells
Vt WL voltage for unselected cells (0 V)
Erase verify Program verify
Read
Program/ Erase
4
Terms in NAND Flash
Bit line (B/L)
Word line (W/L)
Disturbance during program operation
6
-4 -2 0 0.5 1.5
WL voltage for the selected cell (0 V)
ON-cell (“0”) OFF-cell (“1”) Threshold voltage distribution
?
discharged F-gate Charged F-gate# of cells
Vt WL voltage for unselected cells (Vpass)
Erase verify Program verify Decide whether the
Vth of the selected cell is larger or smaller than Vtarget (= 0 V)
3.5