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Virtex-5 XC5VLX50 Field Programming Gate Array õ u § T “ Ó Þ” X ¢ W ë sV R Ë  Ä

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. z  ´+ « >\   6   x ô  Ç \  -t   H 30.3, 54.7, 73.7, 104, 150 MeV s % 3 Ü ¼ 9, s \  ¦  „ ½ ÓÜ ¼– Ð Bendel Fitting Parameters\  ¦ • ¸Ø  ¦ % i  . Õ ªo “ ¦, s  z  ´+ « >   õ \  ¦  „ ½ ÓÜ ¼– Ð @ /³ ð& h “   0 A$ í C • ¸“   $ C • ¸ 0 A$ í \ " f _

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“

  % i  .

PACS numbers: 07.87.+v, 28.41.Te, 61.80.Az, 61.82.Fk, 85.30.Tv

Keywords: é ß –{ 9 ‰ & ³ © œ´ òõ , 8 ú x ~ ½ Ó ‚   ¾ º& h ´ òõ , FPGA, € ª œ$ í   c ” , Ä ºÅ Ò~ ½ Ó ‚  

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Ä

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¾

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K " f  Ҿ ¡ § ? /\  Ò q t$ í  ) a „   { 9  \  _ ô  Ç Â Ò¾ ¡ § _  : £ ¤$ í

E-mail: [email protected]

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–

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£

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‰

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£

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x s   Ÿ ÷ ¶     { 9 r & h “    Œ •1 l x Ô  ¦0 p x, < ʓ É r ™ è  ! Q o

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

 H TID ü <  H  Ø Ô>  é ß –{ 9  ‰ & ³ © œ\  _ K " f µ 1 ÏÒ q t >  ÷ &Ù ¼

–

Ð µ 1 ÏÒ q t r & h  x 9 , µ 1 ÏÒ q t  Òì  r`  ¦ & ñ S X ‰ >  \ V8 £ ¤ ½ + É Ã º \ O  .



 " f, SEE_   â Ä º\   H t  © œ\ " f_  z  ´+ « >   õ \  ¦  „ ½ Ó Ü

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¼– Ð  6   x ÷ &  H  Ҿ ¡ §[ þ t õ   H   É r : £ ¤$ í `  ¦ ° ú   H  Ҿ ¡ § Ü ¼– Ð

½

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 }“ É r q 6   x Ü ¼– Ð Õ ª@ /– Ð & h 6   x ÷ &“ ¦, ¢ ¸ô  Ç Õ ª / B N/ å L s  { 9 & ñ u 

· ú

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–

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s

 Qô  Ç $ q 6   x`  ¦ z  ´‰ & ³ l  0 A # Œ  © œ@ /& h Ü ¼– Ð $ § 4  “ ¦ Â

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\

 & h ½ + Ëô  Ç ? /½ ¨$ í `  ¦ t     â Ä º  6   x >  ÷ &  H  â Ä º Z þ t

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Q l  r  Œ • “ ¦ e ”   [3]. Ä ºo   _  ™ è+ þ A 0 A$ í “   Ä ºo  Z >

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“ ¦ e ” Ü ¼ 9, · ú ¡Ü ¼– Е ¸ s  Qô  Ç Æ Ò[ j  H > 5 Å q| ¨ c „  } © œs  .

‘

: r  7 Hë  H \ " f  H s  Qô  Ç 2 [t – Ð  © œ6   x „     Ҿ ¡ § ×  æ  “   Virtex-5 Field Programmable Gate Array (FPGA)\  ¦ s  6

 

x # Œ ~ ½ Ó ‚   _ …Û ¼à Ô\  ¦ à º' Ÿ ô  Ç   õ \  ¦ l Õ ü t % i  . ¢ ¸ ô

 Ç, s  z  ´+ « >   õ \  ¦  „ ½ ÓÜ ¼– Ð z  ´] j 0 A$ í \   6   x| ¨ c  â Ä º

\

 QÖ  ¦`  ¦ > í ß – % i  . 0 A$ í s  î  r% ò | ¨ c à º e ”   H C • ¸  H Á º Ã

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$

C • ¸ü < & ñ t C • ¸\ " f_  ¨ 8 Š â `  ¦ l ï  r Ü ¼– Ð \  QÖ  ¦`  ¦ >  í ß

–K  ˜ Ѐ Œ ¤ .

II. ÷ m Ç] M ö U ê s0 n É

r

+ « > @ / © œÜ ¼– Ð  Œ ™“ É r ™ è   H XILINX  _  Virtex-5 FPGA XC5VLX50 s  .  6   x ô  Ç ™ è   H † ½ Ó/ B N Ä ºÅ ҃  ½ ¨" é ¶

\

" f ”  ' Ÿ  “ ¦ e ”   H ‘ 0 A$ í 6   x ² D G í ß – EEE  Ҿ ¡ §  Ž 7 £ x l ì ø Í

ƒ

 ½ ¨ x 9 $ ¸ ú š6 £ § “ ¦5 Å q X <s '  % ƒo   © œu  DM> hµ 1 Ï’õ ] j\ 



6   x ÷ &“ ¦ e ”   H ™ è – Ð+ ‹, † ¾ ÓÊ ê Ä ºÅ Ò6   x Ü ¼– Ð  6   x s  l @ /

÷

&  H ™ è s  .

FPGA  H e ” _ _   r– Ð\  ¦ ™ èá Ôà ÔJ ?# Q– Ð ½ ¨‰ & ³ # Œ × ¼ J

?# Q\  d ” `  ¦ à º e ”   H ì ø ͕ ¸^ ‰ ™ è – Ð, : £ ¤  o  ) a ì ø ͕ ¸^ ‰“   Application Specific Integrated Circuit (ASIC) õ   H ² ú ˜ o

 ? /Â Ò [ O > \  ¦ > 5 Å q à º& ñ ½ + É Ã º e ” Ü ¼Ù ¼– Ð  6   x   כ ¹

½

¨   H Ä »ƒ  $ í \  @ /^ ‰ l  ~ 1  . @ / Òì  r _  ƒ  í ß – % ƒo 



© œu   H  7 H o  ƒ  í ß – à º' Ÿ   Òì  r õ  B j— ¸o  à º' Ÿ   Òì  r Ü ¼– Ð  

*

'# Q4 R e ” Ü ¼Ù ¼– Ð, ‘ : r z  ´+ « >\   6   x ) a FPGA ? / Ò\ • ¸ s  ü

< ° ú  s  ¿ º t  l 0 p x`  ¦ à º' Ÿ  • ¸2 Ÿ ¤ á Ԗ ÐÕ ªA b ç `  ¦ % i 



.  7 H o  ƒ  í ß – à º' Ÿ `  ¦ 0 A # Œ" f  H Fast Fourier Transform (FFT) ü < Inverse FFT l 0 p x`  ¦ { 9 § 4  % i  . ¿ º t  ƒ  í ß –

`

 ¦  u “ ¦  €   { 9 § 4  + þ A Õ ª@ /– Ð  r  Ø  ¦§ 4 s  ÷ &l  M : ë

 H \ , þ jœ í { 9 § 4  + þ Aõ  Ø  ¦§ 4  + þ A`  ¦ q “ § # Œ \  Q_  Ä » Á

º\  ¦ S X ‰ “  ½ + É Ã º e ” >  % i  . B j— ¸o  l 0 p x à º' Ÿ   Òì  r Ü ¼

–

Ѝ  H First-In-First-Out (FIFO)\  ¦ { 9 § 4  % i  . s  % i r , { 9

§ 4  ) a & ñ ˜ Ð } 9  ? / Ò\  $  © œ÷ &# Q e ”   Õ ª@ /– Ð Ø  ¦§ 4 

Fig. 1. Actual Printed Circuit Board (PCB) picture.

Figure 1 (a) shows the front side of the PCB, and Fig. 1 (b) shows the backside of the PCB. To reduce the stray light and to be positioned as close as possible with the collimator, the FPGA are located in the opposite side of the PCB where other parts are located.

`

 ¦ l  M :ë  H \  { 9 § 4  & ñ ˜ Ðü <_  q “ §– Ð ~ 1 >  \  Q { 9 # Q z

Œ

¤  H t _  # ŒÂ Ò\  ¦ S X ‰ “  ½ + É Ã º e ”  . Fig. 1“ É r z  ´+ « >\   6   x ô

 Ç l ó ø Í_   ”  s  . FPGAü < r ï  r l ü <_  / B N ç ß –s  V , # Q t

€   FPGA s ü @_   Ҿ ¡ § s  ~ ½ Ó ‚  \  ” ¸Ø  ¦| ¨ c à º e ” “ ¦, ç  H { 9

• ¸ b  # Qt >  ÷ &l  M :ë  H \  FPGA s ü @_  — ¸Ž  H  Ҿ ¡ §

“ É

r l ó ø Í z ´ »€  \  C u  % i  .

z 

´+ « >“ É r \  -t  ï  r 0 A\    " f ¿ º ç  H X <_  r [ O `  ¦ s 6   x

% i  . $  \  -t  z  ´+ « >“   30.3 MeV z  ´+ « >“ É r " fÖ  ¦ \  ™ èF 

“ ¦ e ”   H " é ¶  § 4  # î " é ¶ _  € ª œ$ í   5 Å q l   © œu \  ¦ s 6   x 

%

i  .   Qt  “ ¦ \  -t “   54.7, 73.7, 104, 150 MeV z  ´+ « >

“ É

r p ² D G Indiana University Cyclotron Facility (IUCF) \ 

(3)

"

f à º' Ÿ  % i  . y Œ • \  -t  ï  r 0 A Z >  8 ú x fluence Y U6 \ š, › ¸ 

|

¾ Ó x 9 , z  ´+ « > à º' Ÿ  r ç ß –`  ¦ Table 1 \  ³ ðr  % i  .

€

ª œ$ í   c ”  › ¸  z  ´+ « >\ " f, € ª œ$ í   c ” “ É r SEE\  ¦ { 9 Ü ¼v 



 H  כ s ü @\ • ¸ › ¸ | ¾ Ó`  ¦ ¾ º& h  r v >   ) a  . MOSFET

>

\ P \  @ /ô  Ç TID_  @ /³ ð& h “   ‰ & ³ © œÜ ¼– Ѝ  H ë  H) 3  „  · ú š_  s

1 l x`  ¦ [ þ t à º e ” “ ¦, ë  H) 3  „  · ú š_  s 1 l x“ É r  r– Ð\  â ìØ Ô  H

„

 À Ó ° ú כ`  ¦    or v l  M :ë  H \ , ™ è _  „  À Ó    o_  8 £ ¤& ñ Ü

¼– Ð TID\  _ ô  Ç % ò † ¾ Ó`  ¦ y Œ ™t ½ + É Ã º e ”   [4].   " f s 



  z  ´+ « >\ " f TID\  _ ô  Ç ´ òõ _  Ä »Á º\  ¦ S X ‰ “   l  0 A 

#

Œ SEEz  ´+ « >õ  # î ' Ÿ  # Œ _ …Û ¼à Ô ˜ Ð× ¼\  â ìØ Ô  H „  À ӕ ¸

†

< Êa  8 £ ¤& ñ % i  .

“

 / B N 0 A$ í s  e ” Á º\  ¦ à º' Ÿ    H C • ¸  H  € ª œô  Ç 7 á x À Ó

e ”

Ü ¼ 9, @ /³ ð& h Ü ¼– Ð Ä ºo    _   o | ½ Ó 2  ñ  õ † < Æ0 A

$ í

s  î  r% ò ÷ &“ ¦ e ”   H $ C • ¸, GPS 0 A$ í _  ×  æ C • ¸, Õ ªo 

“

¦ Á ºÏ ã Î  o 0 A$ í õ  ° ú  “ É r & ñ t C • ¸ e ”  . Õ ª Q  s ü @\ 

•

¸ ´ ú §“ É r C • ¸ ” > r F   9, ° ú  “ É r $ C • ¸ • ¸ 5 p x “ §& h s  ,

 â

 y Œ • 1 p x1 p x _    à º\    " f  € ª œô  Ç C • ¸\  ¦ | 9  à º

e ”

 . s   7 Hë  H \ " f  H @ /³ ð& h “   $ C • ¸ 0 A$ í “   õ † < Æ0 A$ í 3   ñ_  C • ¸ü < & ñ t C • ¸\  ¦ @ /³ ð– Ð r Ó ý t Y Us ‚   % i   [5].

Õ

ªo “ ¦, Ä ºÅ Ò ¨ 8 Š â r Ó ý t Y Us ‚  “ É r l ‘ : r& h Ü ¼– Ð þ j€ Œ •_   © œ S !

`  ¦ “ ¦ 9 # Œ r Ó ý t Y Us ‚   † < ÊÜ ¼– Ð+ ‹,  Ҿ ¡ § ? /½ ¨$ í \  @ / K

" f # ŒÄ »\  ¦ | 9  à º e ” • ¸2 Ÿ ¤ % i  .

SEU > í ß –`  ¦ l  0 A # Œ" f  H z  ´+ « >   õ \  ¦ Bendel 2 parameters d ” Ü ¼– Ð fitting `  ¦ # Œ  ô  Ç . s  d ” 

“

É r { 9  ô  Ç € ª œ$ í   c ” \  @ /ô  Ç upset cross section`  ¦  

 · p d ” Ü ¼– Ð z  ´+ « > / B Nd ” s  9  6 £ § õ  ° ú  s  j þ t à º e ”   [6,7].

σ = (

BA

)

14

[1 − exp(−0.18Y

0.5

)]

4

#

Œl " f † < Êà º Y  H  6 £ § õ  ° ú  “ É r d ” Ü ¼– Ð ³ ð‰ & ³ ) a  .

Y = q

18

A

(E − A)

E ü < A  H MeV _  é ß –0 A\  ¦ ° ú   H  .

Cross section _  é ß –0 A  H 10

−12

upsets per proton /cm

2

s  . A_  _ p   H upset`  ¦ { 9 Ü ¼v   H ë  H) 3  \  -t  s

 9, (

BA

)

14

  H Ÿ í o é ß –€  & h s  . s X O >  Bendel param- eters\  ¦ % 3 >  ÷ &€   C • ¸ & ñ ˜ Ð\  ¦ s 6   x # Œ K { © œ C • ¸\ " f _

 \  QÖ  ¦`  ¦ % 3 `  ¦ à º e ” >   ) a  .

r

Ó ý t Y Us ‚  \   6   x ô  Ç õ † < Æ0 A$ í 3  ñ_  C • ¸ & ñ ˜ Ѝ  H 2009¸   r Û ¼% 7 ›  © œ[ j [ O >   Ž ž Ð  r_  ‰ & ³F  Table 2ü < ° ú  Ü ¼ 9, Æ ÒÊ ê µ 1 Ï ^ ‰ & ñ K t >  ÷ &€   S X ‰& ñ | ¨ c \ V& ñ s   [8].

~

½ Ó ‚   ¨ 8 Š â r Ó ý t Y Us ‚  `  ¦ 0 A # Œ Trapped particle\  @ / ô

 Ç — ¸4 S q– Ѝ  H AP8MIN, AE8MAX\  ¦ ‚  × þ ˜ % i “ ¦ [9], ×  æ s 

“

: r \  @ /ô  Ç — ¸4 S q– Ѝ  H CREME96`  ¦  6   x % i   [10].

Fig. 2. Current variations during the 54.7 MeV proton irradiation test. Sudden current drops under 0.4 A indi- cate that the SEEs in the FPGA occurred. No gradual increase or decrease due to the TID can be seen in the figure.

III. + s ÇÊ Ý õ m Í A 0V Ä

€

 $  Table 1\ " f · ú ˜ à º e ” 1 p w s  ‘ : r z  ´+ « >\ " f  H @ / Òì  r 30 krad(Si) p ë ß –_  8 ú x › ¸ | ¾ Ós  ¾ º& h  ÷ &% 3  .   " f, s 

&

ñ • ¸_  › ¸ | ¾ Ós  FPGA™ è \  \ O ë ß –  p u % ò † ¾ Ó`  ¦ p ' ¬ I  H t  S X

‰ “   l  0 A # Œ Fig. 2\  54.7 MeV z  ´+ « >\ " f 8 £ ¤& ñ ô  Ç



r– Ð_  „  À Ó    o ° ú כ`  ¦ l 2 Ÿ ¤ % i  . 0.4 A s  – Ð b  # Q

”

  ° ú כ[ þ t“ É r SEE  { 9 # Qz Œ ¤6 £ §`  ¦ _ p    H  כ s  9, 0.45 A

˜

Ð  €  •ç ß – Z  }“ É r ° ú כ`  ¦ ˜ Ðs   H  â Ä º  H SEE  { 9 # Qè ß – + ' F

 Òh A`  ¦   H  â Ä º\  { 9 r & h Ü ¼– Ð „  À Ó 7 £ x    H  כ s

 . Õ ª s ü @\   H z  ´+ « > 7 á x « Ñ r  t  0.45 A   H % ƒ\  ¦ Ä »t 

“ ¦ e ”  .   " f, 54.7 MeV € ª œ$ í   › ¸  z  ´+ « >\ " f  H 25.3 krad(Si) _  8 ú x › ¸ | ¾ Ós  ¾ º& h  ÷ &% 3 Ü ¼  z  ´+ « >\   6   x

 )

a FPGA \   H  _  % ò † ¾ Ó`  ¦ z u t  3 l w Ù þ ¡6 £ §`  ¦ · ú ˜ à º e ” 



 [11]. 54.7 MeV z  ´+ « > s ü @_    É r \  -t  @ /% i \ " f• ¸

 

õ   H — ¸¿ º q 5 p w ô  Ç € ª œ © œ`  ¦ ˜ Ð% i Ü ¼Ù ¼– Ð s    z  ´+ « >\ " f



 H € ª œ$ í   c ” \  _ K " f TID_  % ò † ¾ ӓ É r p p   “ ¦ ó ø Íé ß –

% i  .   " f, ‘ : r z  ´+ « >\ " f µ 1 ÏÒ q tô  Ç — ¸Ž  H SEE[ þ t“ É r " f– Ð



Á º   ƒ  › ' a \ O s  1 l qw n & h Ü ¼– Ð { 9 # Qz Œ ¤ “ ¦ & ñ % i  .

FFT, FIFO l 0 p x \  @ /ô  Ç   õ \  ¦ Bendel 2 parameters d ”

Ü ¼– Ð fittingô  Ç   õ ü < † < Êa  Fig. 3\  ³ ðr  % i  . Ben- del fitting`  ¦ ô  Ç “    ° ú כ“ É r FFT ƒ  í ß – l 0 p x _   â Ä º A : 3.02990, B : 4.94359, Õ ªo “ ¦ FIFO  Òì  r _   â Ä º A : 3.02990, B : 4.24725 s % 3  . Õ ªo “ ¦ s    õ \  ¦ þ j€ Œ •_ 

 â

Ä º\  ¦ “ ¦ 9ô  Ç $ C • ¸ü < & ñ t C • ¸\  @ /{ 9  # Œ \  QÖ  ¦`  ¦

½

¨ô  Ç   õ  FFT  H $ C • ¸\ " f 2.92 × 10

−3

errors/day s 

(4)

Table 1. Total irradiated fluence and experimental time for each energy level.

Proton Energy[MeV] Fluence[#/cm

2

] Dose[krad(Si)] Time[sec]

30.3 4.44 × 10

10

9.85 120

54.7 1.68 × 10

11

25.3 1035

73.7 1.68 × 10

11

20.1 847

104 1.68 × 10

11

15.6 653

150 1.76 × 10

11

13.2 958

Table 2. Orbit parameters of STSAT-3 [TBD].

Apegee(km) 700.00

Perigee(km) 700.00

Right Ascension of Ascending Node(deg) 334.79

Inclination(deg) 98.19

Fig. 3. Upset cross section data of FFT and FIFO in the FPGA. Also shown are the Bendel 2 parameters fitting curves. The FFT and FIFO fitting parameters are A : 3.02992, B : 4.94359, and A : 3.02990, B : 4.24725, respectively.

9, & ñ t C • ¸\ " f  H 3.64 × 10

−3

errors/day \  ¦ % 3 % 3 Ü ¼ 9, FIFO l 0 p x`  ¦ à º' Ÿ    H  Òì  r“ É r $ C • ¸\ " f 3.49 × 10

−4

errors/day , & ñ t C • ¸\ " f 4.35 × 10

−4

errors/day\  ¦ % 3 

%

3  . IEEE 1156.4-1997 l ï  r“   0.0100 SEU’s per day\  ¦

—

¸¿ º ë ß –7 á ¤   H   õ \  ¦ ˜ Ð% i  . FFT à º' Ÿ  l 0 p x s  FIFO Ã

º' Ÿ   Òì  r \  q K " f 8.4C  SEU\    y Œ ™† < Ê`  ¦ S X ‰ “  ½ + É Ã º e ” 



.

IV. + s Ç Â ] Ø

XILINX  _  Virtex-5 XC5VLX50 FPGA \  @ / # Œ SEE z  ´+ « >`  ¦ à º' Ÿ  # Œ Upset Cross Section / B G‚  `  ¦ % 3 % 3 



.  7 H o  ƒ  í ß –`  ¦ à º' Ÿ    H l 0 p x s  B j— ¸o  l 0 p x`  ¦ à º' Ÿ  



 H  Òì  r \  q  # Œ SEE\  2 [€  •† < Ê`  ¦ S X ‰ “   % i Ü ¼ 9 Bendel 2 parameters fitting`  ¦ ô  Ç   õ  “    ° ú כ“ É r FFT ƒ  í ß – l  0

p

x _   â Ä º A : 3.02990, B : 4.94359\  ¦, Õ ªo “ ¦ FIFO à º '

Ÿ   Òì  r _   â Ä º A : 3.02990, B : 4.24725\  ¦ % 3 % 3  . s 

 

õ [ þ t“ É r Æ ÒÊ ê s  ™ è  Ä ºÅ Ò ¨ 8 Š â \   Ö ¸6   x| ¨ c  â Ä º s  6

 

x ½ + É Ã º e ” Ü ¼o   l @ /  ) a  . ‘ : r  7 Hë  H \ " f  H $ C • ¸ü < & ñ t

C • ¸ ¨ 8 Š â `  ¦ r Ó ý t Y Us ‚   ô  Ç + ', z  ´+ « >\   6   x ô  Ç FPGA _

 Bendel “   ° ú כ`  ¦ @ /{ 9  # Œ \  QÖ  ¦`  ¦ > í ß –K  ˜ Ѐ Œ ¤ .

FFT ƒ  í ß – l 0 p x`  ¦ à º' Ÿ    H  Òì  r“ É r $ C • ¸\ " f 2.92 × 10

−3

errors/day s  9, & ñ t C • ¸\ " f  H 3.64 × 10

−3

er- rors/day \  ¦ % 3 % 3  . FIFO l 0 p x`  ¦ à º' Ÿ    H  Òì  r“ É r $ C

•

¸\ " f 3.49 × 10

−4

errors/day , & ñ t C • ¸\ " f  H 4.35 × 10

−4

errors/day\  ¦ % 3 % 3  .

Y

c p w Š à U Ø ”  ô

[1] T. P. Ma and Paul V. Dressendorfer, Ionizing Radi- ation Effects in MOS Devices and Circuits., (John Wiley & Sons, NY, 1989)

[2] K. Ryu, G. H. Shin, H. M. Kim and H. Kim, J.

Korean Phys. Soc. 52, 853 (2008).

[3] James R. Wertz and Wiley J. Larson, Space Mission Analysis and Design., (Microcosm , CA, 1999) [4] D. H. Ko, S. W. Rhee, S. J. Kim and K. W. Min, J.

Korean Phys. Soc. 54, 800 (2009).

[5] D. H. Ko, KARI-SAFD-TM-2008-006 (2008).

[6] W. L. Bendel and E. L. Petersen, IEEE Trans. Nucl.

Sci., NS-30, 3381, (1983)

[7] Y. Shimano, T. Goka, S. Kuboyama, K. Kawachi, T. Kanai and Y. Takami., IEEE Trans. Nucl. Sci., NS-89, 2344, (1989)

[8] STSAT-3 System Critical Design Review (2009).

[9] J. I. Vette, “The NASA/National Space Sci-

ence Data Center Trapped Radiation Environ-

ment Model Program (1964-1991),” NSSDC 91-

29, NASA/Goddard Space Flight Center, National

(5)

Space Science Data Center, Greenbelt, MD, Novem- ber (1991)

[10] A. J. Tylka, J. H. Adams, Jr., P. R. Boberg, W. F. Dietrich, E. O. Flueckiger, E. L. Petersen, M. A. Shea, D. F. Smart and E. C. Smith,

“CREME96: A Revision of the Cosmic Ray Effects

on Micro-Electronics Code,”: to be presented at the IEEE/NSREC Conference in July (1997)

[11] K. Ryu, G. H. Shin, H. M. Kim, S. Kim, D. H. Ko, H. Kim and K. Min, J. Korean Phys. Soc. 50, 1552 (2007).

Single Event Effect Analysis of the Virtex-5 XC5VLX50 Field Programming Gate Array Using Proton Irradiation

D. H. Ko,

Seung-hun Lee, SUNG-SAE LEE, Jong-Oh Park and Eun Sup Sim Korea Aerospace Research Institute, Daejun 305-333

Jeong Woon Hong

Seed Core Co., Ltd., Daejun 305-732 (Received 16 November 2009)

Proton irradiation tests for the Single Event Effects of the XILINX Virtex-5 XC5VLX50 field programming gate array (FPGA) were performed at the Indiana University Cyclotron Facility and the Korea Cancer Center Hospital. In the FPGAs, the fast-Fourier-transform logic and first-in- first-out logic were programmed to simulate arithmetic calculations and memory functions. Proton beams of 30.3, 54.7, 73.7, 104, and 150 MeV were used to fit the data with the Bendel 2 parameters equation. Furthermore, the availabilities for use in a space environment were confirmed by using a low-earth orbit and a geosynchronous orbit based on these experimental results.

PACS numbers: 07.87.+v, 28.41.Te, 61.80.Az, 61.82.Fk, 85.30.Tv Keywords: SEE, SEU, TID, FPGA, Proton beam, Space radiation

E-mail: [email protected]

수치

Fig. 1. Actual Printed Circuit Board (PCB) picture.
Fig. 2. Current variations during the 54.7 MeV proton irradiation test. Sudden current drops under 0.4 A  indi-cate that the SEEs in the FPGA occurred
Table 1. Total irradiated fluence and experimental time for each energy level.

참조

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