Post-annealing-temperature-dependent Magnetic Anisotropy of CoFe 2 O 4 Thin Films
D. Y. Lee · C. -W. Cho · S. H. Lee · J. W. Kim · H. K. Kim · M. Y. Lee · J. S. Lee · S. Park ∗
Department of Physics, Pusan National University, Busan 609-735, Korea
S. M. Hwang
Pohang Accelerator Laboratory, Pohang University of Science & Technology, Pohang 790-834, Korea (Received 29 October 2013 : revised 20 November 2013 : accepted 11 December 2013)
CoFe
2O
4thin films with magnetic anisotropy were deposited by RF sputtering at room tem- perature and were post-annealed at various temperature to examine the annealing-temperature- dependent structural and magnetic characteristics of the films. X-ray diffraction measurements showed the as-grown sample and the samples annealed at temperatures below 700
◦C exhibited non-crystalline phases even though magnetic hysteresis loops (not superparamagnetic behavior) ap- peared for the film annealed at 500
◦C. With further increases in the annealing temperature, the in-plane anisotropy and the grain size increased, and crystallinity improved. Furthermore, the coer- civity and the remanent magnetization also increased with increasing post-annealing temperature.
These increases were associated with the increased crystalline size and the improved crystallinity of the films.
PACS numbers: 75.30.Gw, 75.50.Bb, 75.70.-i, 75.50.Kj
Keywords: Spinel structure, Magnetic anisotropy, Post-annealing
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