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Se Thin Films by Using a Vacuum Evaporation Method and Their Physical Properties

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Growth of p-Zn

0.31

Cd

0.69

Se Thin Films by Using a Vacuum Evaporation Method and Their Physical Properties

Dong Hun Han · Eun Jeong Yoon · Jeoung Ju Lee

Department of Physics and Research Institute of Natural Science, Gyeongsang National University, Jinju 660-701, Korea

Kwang Yong Kang

Convergence of IT Devices Institute, Dong-Eui University, Busan 614-714, Korea (Received 24 October 2014 : revised 26 November 2014 : accepted 1 December 2014)

Zn0.31Cd0.69Se films were prepared on indium-tin-oxide(ITO)-coated glass substrates by using thermal evaporation. X-ray diffraction spectra showed that the Zn0.31Cd0.69Se films had a mixed ZnSe and CdSe zincblende structure with a lattice constant a = 6.077 ˚A and that the crystals were preferentially grown with a (111) orientation. The optical energy band gap, measured at room temperature, of the as-deposited Zn0.31Cd0.69Se film was 2.05 eV and decreased to about 2.04 eV

∼ 1.96 eV upon annealing in a vacuum electric furnace at temperatures from 200C to 500C.

The dynamical behavior of the charge carriers in the Zn0.31Cd0.69Se film was investigated by using photoinduced discharge characteristics (PIDC) techniques.

PACS numbers: 81.15.-z, 81.05.Hd

Keywords: Zn0.31Cd0.69Se thin film, Annealing effect, Energy band gap, Surface roughness, PIDC

à Ã

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0.31

Cd

0.69

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r$3\ _ #Œ ~ÃÌ}Œ•_ ¶ú˜‚½Ó©œÃºH a = 6.077 ˚Aܼ–Ð ZnSeü< CdSe_ $3F g ½¨›¸\¦ ¦ e”%3¼ 9, Õª $큩œ~½Ó†¾Ó“Ér (111)~½Ó†¾Óܼ–Ð ĺ‚ $큩œH†d`¦ ·ú˜ ú e”%3. 7£x‚Ã̝)aZn0.31Cd0.69Se~ÃÌ}Œ•\ @/ 

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Œ z´“:r\"f 8£¤&ñôÇF g†<Æ&h \-t { çߖÉr 2.05 eVs%3¦, \P%ƒo “:r•¸\¦ 7£x<Ê\  yŒ™™è

%i¼ 9, 200C ∼ 500C–Ð \P%ƒoÇ ~ÃÌ}Œ•_F g†<Æ&h \-t { çߖÉr 2.04 eV ∼ 1.96 eVs%3.

Zn0.31Cd0.69Se~ÃÌ}Œ• ?/_ „ rìøÍ[þt_ 1lx%i<Æ&h 1lx`¦F gÄ»l ~½Ó„ :£¤$í (PIDC: photoinduced discharge characteristics)~½ÓZO¼–Ð ›¸ %i.

27

This is an Open Access article distributed under the terms of the Creative Commons Attribution Non-Commercial License (http://creativecommons.org/licenses/by-nc/3.0) which permits unrestricted non-commercial use, distribution, and reproduction in any medium, provided the original work is properly cited.

(2)

PACS numbers: 81.15.-z, 81.05.Hd

Keywords: Zn0.31Cd0.69Se~ÃÌ}Œ•, \P%ƒo ´òõ, \-t { çߖ, ³ð€ }9l,F gÄ»l ~½Ó„ :£¤$í

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수치

Table 1. Measured composition ratios and calculated ‘x’ values for the Zn 0.31 Cd 0.69 Se thin films.
Fig. 2. (Color online) XPS spectrum of the Zn 0.31 Cd 0.69 Se thin films for (a) Zn 2p, (b) Cd 3d and (c) Se 3d core levels
Fig. 4. Optical absorption spectra of the Zn 0.31 Cd 0.69 Se thin films. The inset shows the transmission spectra  ob-tained for the Zn 0.31 Cd 0.69 Se thin films.
Table 2. Calculated values of drift mobility and concentration of charge carrier for the Zn 0.31 Cd 0.69 Se thin films.

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