Growth and Optical Properties of ZnTe Thin Films Formed by Using Pulsed Laser Deposition
Chang-Sun Yoon ∗ · Seung-Jae Nam
Department of Physics, Kunsan National University, Kunsan 573-701, Korea (Received 17 April 2014 : revised 30 April 2014 : accepted 30 April 2014)
ZnTe thin films were grown on glass substrates at various substrate temperatures ranging from 26
◦C to 300
◦C by using pulsed laser deposition. The effects of the substrate temperature on the structural and optical properties and on the surface morphology of the ZnTe thin films were investigated. X-ray diffraction and scanning electron microscope analysis showed that the ZnTe films grown at substrate temperatures above 260
◦C revealed good crystalline quality that was characterized by a preferred (111) orientation with polycrystalline behavior. The optical energy gap of the ZnTe films, measured at room temperature, increased with increasing substrate temperature from 26
◦C to 300
◦C and approached the bulk value of 2.26 eV. The photoluminescence spectra of the ZnTe films exhibited a sharp band-edge emission near the absorption edge without a deep- level emission peak. Particularly, the Raman spectra showed the four multiphonon modes of the longitudinal optical (LO) phonon at room temperature, which indicates good crystalline quality.
PACS numbers: 78.20.Ci, 78.66.Hf, 78.30.Fs
Keywords: ZnTe thin films, Pulsed laser deposition, X-ray diffraction, Optical absorption, Raman scattering
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PACS numbers: 78.20.Ci, 78.66.Hf, 78.30.Fs
Keywords: ZnTe ~ à Ì} , ` O Û ¼Y Us $ 7 £ x à Ì, X- r] X , F gf ¨ à º, ë ß í ß ê ø Í
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