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Measurements of the Penetration Depth of $MgB_2$ and $YBa_2Cu_3O_7_{\Omega}$ Superconductor Films by Using Sapphire Resonators with Short-Circuited Parallel Plates

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69

E14

Measurements of the Penetration Depth of MgB

2

and

YBa

2

Cu

3

O

7-

K

Superconductor Films by Using Sapphire

Resonators with Short-Circuited Parallel Plates

Ho Sang Jung

a,b

, J. H. Lee

a,b

, Y. H. Cho

a,b

, W. K. Seong

c

, N. H. Lee

c

,

W. N. Kang

c

, and Sang Young Lee

*,a,b

a Department of Physics, Konkuk University

b Center for Wireless Power Transmission, Konkuk University Seoul 143-701, Korea

c Department of Physics, Sungkyunkwan University Suwon 440-746

A measurement method that enables to measure the penetration depth (λ) of superconductor films by using a short-ended parallel plate sapphire resonator is introduced. Variations in the λ of c-axis-oriented MgB2 and YBa2Cu3O7-x films could be measured down to the lowest temperature using a sapphire resonator with a YBa2Cu3O7-x film at the bottom. A model equation of λ= λ0 [1 – (

T

TC)

τ]-1/2 for MgB

2 films appeared to describe the observed variations of the resonant frequency of the sapphire resonator with temperature, with λ0, , and TC used as the fitting parameters. Merits of using the sapphire resonators with short-circuited parallel plates are discussed.

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