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5, RF Û ¼( ' a A, c , ë ß Û ¼& 7 à Ô! 3 , Photoluminescence
Study on the Structural and the Optical Properties of V 2 O 5 Thin Films by Electron Beam Irradiation
Minwoo Chu · Manil Kang · Sok Won Kim ∗
Department of Physics, University of Ulsan, Ulsan 680-749
Ji-wook Ryu
Department of Physics, Kongju National University, Kongju 314-701
(Received 22 September 2011 : revised 2 November 2011 : accepted 7 November 2011)
In order to examine changes in the structural and the optical properties of V
2O
5thin films caused by electron beam irradiation at different dose rates, we grew amorphous films by RF sputtering.
From the XRD, SEM, and Raman spectrum measurements, at 600 kGy, the amorphus V
2O
5film was crystallized to α-V
2O
5, and grew as nano-rods at 1200 kGy. This result is interpreted as being due to an exothermic effect caused by the electron beam irradiation. Measurements of the PL and transmittance were carried out to investigate the optical properties. The results showed that the absorption was enhanced by crystallization of the films, and the transmittance and the PL intensity were reduced due to strong surface scattering caused by the growth of the nano-rods.
PACS numbers: 68.55.JK, 78.20.-e
Keywords: V
2O
5, RF sputtering, Electron beam, Raman spectrum, Photoluminescence
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