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Atomic diffusion induced degradation in bimetallic layer coated cemented tungsten carbide

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ContentslistsavailableatScienceDirect

Corrosion

Science

jo u r n al ho m e p a g e :w w w . e l s e v i e r . c o m / l o c a t e / c o r s c i

Atomic

diffusion

induced

degradation

in

bimetallic

layer

coated

cemented

tungsten

carbide

Zirong

Peng

a

,

Michael

Rohwerder

a,∗

,

Pyuck-Pa

Choi

a,b

,

Baptiste

Gault

a,∗

,

Thorsten

Meiners

a

,

Marcel

Friedrichs

c

,

Holger

Kreilkamp

c

,

Fritz

Klocke

c

,

Dierk

Raabe

a

aMax-PlanckInstitutfürEisenforschungGmbH,Max-PlanckStr.1,40237Düsseldorf,Germany

bKoreaAdvancedInstituteofScienceandTechnology(KAIST),DepartmentofMaterialsScienceandEngineering,Daejeon305-338,RepublicofKorea cFraunhoferInstituteforProductionTechnology(IPT),Steinbachstrasse17,52074Aachen,Germany

a

r

t

i

c

l

e

i

n

f

o

Articlehistory:

Received2December2016

Receivedinrevisedform12January2017 Accepted13January2017

Availableonline20February2017 Keywords: A.Metalcoatings A.Sputteredfilm B.TEM C.Oxidation C.Interfaces

a

b

s

t

r

a

c

t

Weinvestigatedthetemporaldegradationofglassmouldingdies,madeofcementedtungstencarbide coatedwithPtIronanadhesiveCrorNiinterlayer,byelectronmicroscopyandatomprobetomography. Duringtheexposuretreatmentsat630◦Cunderanoxygenpartialpressureof1.12×10−23bar,Cr(Ni) wasfoundtodiffuseoutwardsviagrainboundariesinthePtIr,alteringthesurfacemorphology.Upon dissolutionoftheinterlayer,theWCsubstratealsostarteddegrading.Extensiveinterdiffusionprocesses involvingPtIr,Cr(Ni)andWCtookplace,leadingtotheformationofintermetallicphasesandvoids, deterioratingtheadhesionofthecoating.

©2017TheAuthors.PublishedbyElsevierLtd.ThisisanopenaccessarticleundertheCCBY-NC-ND license(http://creativecommons.org/licenses/by-nc-nd/4.0/).

1. Introduction

Multilayercoatingsorthinfilmshavevariousapplicationfields. Theyarefrequentlyutilisedinengineeringcomponents,toolsand mouldsaswellasmicroelectronic,magneticandopticaldevices [1–4].Comparedtosinglelayercoatings,multilayercoatings, com-biningbeneficialpropertiesofdifferentmaterials,mayfulfilseveral practicalrequirementsatonce.Theymayalsobeusefulincases whereonlyapplyingasinglelayercoatingmaynotbesufficient. Animportantexampleistheuseofaninterfacialbondinglayer betweenthetopcoatingandthesubstratetoenhanceadhesion [5–8].However,multi-layeredstructuresarecommonly thermody-namicallyunstable.Thereisastrongdrivingforceforinterdiffusion and reaction, which will bedetrimental tothermal stability of thecoatingunlesskineticsoftheseprocessesareslow. Unfortu-nately,thetypicalfine-grainedmicrostructureofthinfilmsaswell aslargesurfaceandinterfaceareasprovidenumeroushigh diffu-sivitypaths.Togetherwiththeshortdiffusiondistancesnaturally associatedwiththincoatings,tremendouscompositionalchanges

∗ Correspondingauthors.

E-mailaddresses:[email protected](M.Rohwerder),[email protected] (B.Gault).

canariseandnewphasesaswellasvoidscanform,which will considerablydeterioratethecoatingproperties[9–12].

Here, wereportonthetemporal degradationof abimetallic layercoatingdepositedoncementedtungstencarbidesubstrate duringisothermalexposuresunderanoxygenpartialpressureof 1.12×10−23barat630◦C.The coatingconsistsofan ∼650-nm-thickPtIrtop layerand an∼20-nm-thickintermediate layerof metallicCrorNi(PtIr/CrorPtIr/Ni),whichisfrequentlyutilised in moulds for precision glass moulding (PGM) [13–15]. It is a promising and worldwide employed process for manufacturing highquality optical products withcomplex-geometries. During PGM,glassblanksareplacedinthemouldofapressingtoolandare heatedundervacuumorN2protectiveatmosphereuptotheglass formingtemperature,whichnormallyrangesfrom400to700◦C. Subsequently,highpressforces(2–20kN)areappliedforseveral minutesuntilthemouldformishomogeneouslyfilledwithglass. Aftercontrolledcooling,thefinalproductscanbedetachedfrom themould[16–18].PtIr,asanoblemetalbasedcoating,is chem-icallyinactiveanddoesnotsticktoglass.Anintermediatelayer, CrorNi,isusedtoimprovetheadhesionstrengthbetweenbase materialandtopcoating[19,20].Duetotheharshoperating con-ditionduringglasspressingwhereintensethermal,chemicaland mechanicalforcesareimposedsimultaneously,coating degrada-tiontakesplaceveryfastandbecomesasevereproblem,strongly limitingtheservicelifetimeofmoulds[21–23].Sincethe produc-http://dx.doi.org/10.1016/j.corsci.2017.01.007

0010-938X/©2017TheAuthors.PublishedbyElsevierLtd.ThisisanopenaccessarticleundertheCCBY-NC-NDlicense(http://creativecommons.org/licenses/by-nc-nd/4. 0/).

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Fig.1.(a)Configurationofthedepositionchamber.(b)SketchshowingthearrangementofthepureIrandPtpieceswithinthetarget.(c)Schematicdrawingofthetopview ofthedepositionchambertoillustratethecoatingprocessofthePtIrlayer.

tioncosts are directly related to themould lifetime, designing high-performanceand high-durabilitymouldsaswell as devel-opingconceptstoimpedetheirdegradationhave becomea top priorityforthePGMindustry.Akeytoachievethisgoalisthe under-standingofthefundamental degradationmechanismsofmould materialssuchasPtIr/Cr/WCandPtIr/Ni/WC.

Inpreviousstudies,thereliabilityandstabilityofdiverse metal-licmultilayerthinfilmshavebeeninvestigated,e.g.Cu/Sn [24], Au/Ni/Cr[25],Cu/Ta[26],Pt/Ti-W[27],MoRu/Cr/Ti[28],PtIr/Ni [23,29], and PtIr/Cr[15,23], bymeans ofa variety of analytical techniquessuchasX-raydiffraction(XRD),Rutherford backscat-tering spectroscopy (RBS), Auger electron spectroscopy (AES), energy-dispersiveX-rayspectroscopy(EDS),X-rayphotoelectron spectroscopy(XPS)andsecondaryionmassspectroscopy(SIMS) [29–32].However,thespatialresolutionanddetectionsensitivity ofthesetechniqueswasnotsufficienttorevealthediffusionand segregationphenomenaatgrainboundaries,andlimitedinsights weregainedonthedegradationmechanisms.Atomprobe tomog-raphy(APT)isauniquetechnique,whichhasthecapabilitytoreveal three-dimensional(3D)chemicalinformationat(sub-)nanometre scalewithhighsensitivity(intherangeoftensofpart-per-million) and which hasbeensuccessfully appliedto thin filmmaterials [33–38].Therefore,inthis workweappliedAPTtostudy diffu-sionand degradationphenomenainPtIr/Cr/WCandPtIr/Ni/WC. In addition to APT, we also use scanning electron microscopy (SEM)and(scanning)transmissionelectronmicroscopy((S)TEM) formicrostructuralanalysisandSTEM-EDSandAESforchemical analysis.

2. Materialandmethods

2.1. Specimenpreparation

The basematerial was nano-grain sized cementedtungsten carbidecontainingaround0.3wt.%Cobinder (CTN01L,Ceratizit S.A). Before coating, bulk substrate samples were grinded and polished,makingtheirsurfaceroughness Rasmallerthan5nm. Subsequently, the samples were cleaned in an ultrasonic bath (SurTec089/131, SurTecInternationalGmbH). The coating pro-cesswasaccomplishedinamagnetronsputteringunit(CemeCon CC800/9).Theconfigurationofthedepositionchamberisshownin Fig.1(a).Beforecoating,aplasmaetchingprocesswascarriedoutto cleanandactivatethesubstratesurfacetoensureagoodadhesion. Subsequently,aCrorNilayerofabout20nminthicknessandan ∼650-nm-thickPtIrtopcoatingweredepositedsequentially.The detailedparametersofthecoatingprocessarelistedinTable1.The

PtIrtargetusedinthisstudyishome-made,andisnotaPtIralloy butconsistsofthreepiecesofpurePtstackedwithninepiecesof pureIr,asshowninFig.1(b).

2.2. Exposuretreatment

Anovellaboratoryset-upwasusedtoinducedegradationofthe coating,withwhichtheexposureconditionse.g.time,atmosphere andtemperaturecanbeaccuratelycontrolled[39].Mimickingthe realPGMprocess,thetreatmenttemperaturewassettobe630◦C andthefurnaceatmospherewasselectedas97.5%N2-2.5%H2with thedewpoint (DP)of+20◦C. TheDPismanipulatedbyforcing thegasmixturethroughcolumnswhicharefilledwithwater.By adjustingtheirtemperature,desireddewpointscanbeobtained. Undertheseconditions,theresultingoxygenpartialpressurewas calculatedtobeapproximately1.12×10−23bar.Suchalowoxygen partialpressureisdesirable forcontrollingcoatingdegradation. Thereby,thesuccessivestagesofthedegradationprocesscanbe accessedsimplyby adjusting theexposuretime.Moreover,the partialpressureofoxygeniskepthighenoughtooxidiseCrbut notNi,sotheeffectsofoxidationondegradationcanbeseparated andstudiedindividually.DuringtherealPGMprocesses,the oxy-genpartialpressuresinthePGMmachinewereestimatedtolie intherange of10−6bar,much higherthanthepartialpressure weappliedinthisstudy.Inrealprocessingsystems,it is deter-minedbytheleakagerateofthesystemandthermodynamically notwelldefined.TheH2O/H2equilibriumconditionsusedinthis studyprovidefullthermodynamiccontrol.Inthiswork,resultswill beshownforthePtIr/Cr/WCsystemintheas-fabricatedstate,as wellasafter6h,18h,and168hexposureat630◦Cunderthe above-describedcondition(PO2≈1.12×10−23bar)inordertoillustrate theevolutionofdegradation.AsforthePtIr/Ni/WCsystem,only representativeresultsforthe48h-exposedspecimenwillbeshown, sincetheobserveddegradationmechanismisverysimilartothat inthePtIr/Cr/WCsystem.Itisworthtomentionthatalthoughin ordertobeabletoresolvethesuccessivestagesofthe degrada-tion,especiallytheearlystages,thepartialpressureofoxygenin theatmosphereusedhereismuchlowerthanthatintheactual processing,wedonotexpectaneffectonthedegradation mecha-nisms.Wealsoanalysedsamplesobtainedfromatechnicalset-up andfoundthesamedegradationfeatures. Furthermore,thefact thatthedegradationmechanismsobservedinthePtIr/Cr/WCand PtIr/Ni/WCsystemsareverysimilarisalsoaproofthatthe degra-dationmechanismisnotstronglyaffectedbytheoxygenactivity.

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Table1

Detailedparametersforlayerdepositionprocess.

Etching Interlayerdeposition PtIrlayerdeposition

Target – Chromiumornickel(99.9%) Platinum(99.99%)andiridium(99.9%)

Heatingpower/kW 0 2 2 Argonpressure/mPa 390 200 200 Biasvoltage/V(f=240kHz) 650 60 60 Cathodepower/W(f=50kHz) – 125 250 Tablerevolution/rpm 2.5 2.5 2.5 Time/min 15 4 40 Thickness/nm – ∼20 ∼650

Fig.2. SketchtoillustratethepositionandorientationofAPTand(S)TEMspecimens.

2.3. Specimencharacterisation

BothAPTand(S)TEMspecimenswerefabricatedusingadual

beam focused-ion-beam (FIB) instrument (FEI Helios Nanolab

600/600i)andthein-situlift-outmethod[40,41].Asillustratedin

Fig.2,theAPTspecimenswerepreparedwithanalignment per-pendiculartothesamplesurface,sothattheanalysisdirectionis paralleltothecoatinggrowthdirection.Forthe(S)TEM measure-ments,bothcross-sectional(perpendiculartothesamplesurface)

andplan-view(paralleltothesamplesurface)lamellaewere pre-pared.Toremoveregionsseverelydamagedbythehigh-energy (30kV)GaionbeamduringAPTspecimensand(S)TEMlamellae fabrication,afinalcleaningprocedurewascarriedoutat2kVand 28pA.APTmeasurementswereconductedusingaLEAPTM3000X HR(CamecaInstruments)instrument,equippedwithareflectron lens.Laserpulsingmode(532nmwavelength,∼10␮mspotsize) wasappliedatapulserepetitionrateof250kHzandapulseenergy of0.8 nJ.Thespecimenbasetemperaturewaskeptat 60Kand thetargetdetectionratewassettobe0.2%(2ionsdetectedevery 1000pulses).Theseanalysisparameterswereoptimised accord-ingtoapreviouswork[42].(S)TEMimageswereacquiredusing aJEOLJEM-2200FSmicroscopewith200kVaccelerating voltage (Figs.3(b),5(b),6(a),10(a),11(b),12(a),13(a),15(a),17) STEM-EDS were performed using a probe-correctedFEI Titan Themis 60–300S/TEM with300kVacceleratingvoltageusinga Super-X windowlessEDS detector.Correspondinglyahigh-angleannular darkfield (HAADF)imagewastakenfromthemeasuredregion usingaFischioneHAADFdetector(FischioneInstruments)(Fig.8). AESmeasurementswereconductedwithaJEOLJAMP-9500F sys-temequippedwitha hemisphericalanalyser.Thefieldemission electrongunoperatedatanaccelerationvoltageof25keVanda

Fig.3. Representativecharacterisationresultsobtainedfromtheas-fabricatedPtIr/Cr/WCspecimen:(a)SurfaceSEMimage,(b)cross-sectionalBFSTEMimage,and(c)1D concentrationprofileandacorrespondingclippedatommapacrosstheCrlayer.Forclarity,onlyIr(blue),Cr(cyan),O(magenta)andWions(orange)areshown.The13at.% Oiso-concentrationsurfacesrepresentthesmallCroxidesfoundinsidetheCrlayer.(Forinterpretationofthereferencestocolourinthisfigurelegend,thereaderisreferred tothewebversionofthisarticle.)

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beamcurrentof10nA.AESpeaksofPtMNN,IrMNNandCrLMM wererecordedandused.

3. Results

3.1. PtIr/Cr/WCspecimen 3.1.1. As-fabricatedstate

The surface SEM and cross-sectional bright-field (BF) STEM micrographsoftheas-fabricatedPtIr/Cr/WCsampleareshownin Fig.3(a)and(b),respectively.ThePtIrandCrlayersaswellasthe WCsubstratecanbeclearly identifiedintheSTEMimage.They exhibitdistinctlydifferentmicrostructures.Ascommonlyobserved forsputteredfilms,thePtIrlayerconsistsofveryfinecolumnar grains,growingalongthedepositiondirection.Individualgrains canbedistinguishedbydifferencesincontrast,wherethegrain sizesrangefrom50to100nm.ThethicknessoftheCrlayeris uni-form.BothPtIr/CrandCr/WCinterfacesappearflatandsharp.No voidsorcrackscanbeobserved.APTanalysesofthePtIrlayershow thattheoverallatomicratiobetweenIrandPtisaround2,matching thetargetvalue.However,periodicIr-andPt-richsublayerswere observed(seeFigs.3(c)and14(b)),whichcanbeattributedtothe combinationofthePtIrtargetand substraterotationduringthe deposition.AsillustratedinFig.1,thenon-uniformarrangement ofthePtandIrpiecesinthePtIrtargetcanleadtoan inhomo-geneousdistributionofPtand Irionsintheplasmaflux.When thesubstrateisdirectlyfacingthetarget,thecontentofPtwillbe slightlyhigher,while,whenitmovesaway,Ircontentwillincrease. Withtherotation of thesubstrate, this concentration variation willappearperiodically.Similarphenomenahavebeenreported inseveralpreviousstudies[43–45].Theatomicmapandthe1D concentrationprofileacrosstheCrlayerobtainedfromAPT mea-surement(Fig.3(c))demonstratethatCrdiffusesneitherintothe PtIrlayernorintotheWCsubstrate.Around10at.%Irand8at.%Pt arefoundtobesegregatedattheCr/WCinterface,indicatingthat duringdeposition,IrandPtrapidlydiffusedthroughtheCrlayer, buttheirpenetrationintotheWCsubstratewasrestricted.There isalsoaround10at.%WsegregatedattheCr/WCinterface,which maybeattributedtothelossofcarbonduringtheplasma activa-tionpriortocoating.WithintheCrlayer,somesmall,dispersed Cr-oxideparticlesarefound.SinceCrisafairlyactivemetal,itis difficulttoachievevacuumconditionsinsidethedeposition cham-bergoodenoughtoavoiditsoxidation.Therefore,duringsputter deposition,someCratomswillreactwithoxygenfromthe resid-ualgasandformCroxides.TheAPTanalysesoftheWCsubstrate indicatethatCandWatomsdistributehomogeneouslywhileCo, asthebinderphase,ismainlysegregatedatWCgrainboundaries (notshown).

3.1.2. After6hexposureat630◦Cunder1.12×10−23barO2 partialpressure

Comparingthe6h-exposedstatewiththeas-fabricatedstate, noobviousdifferencescanbefoundbetweenboth surfaceSEM andcross-sectionalSTEMimages(notshownhere).Thesideview atommapoftheCrlayer(Fig.4(a))alsoconfirmsthatnomassive diffusiontookplace.ThePtIrcoating,theCrinterlayerandtheWC substratearewellseparated.BoththePtIr/CrandCr/WCinterfaces arestillsharpandflat.However,asshowninFig.4(b),atthe bot-tomofthePtIrlayer,Crisobservedtosegregatetoseveralplanar features,whicharelikelytobegrainboundaries.However,the seg-regatedamountisrelativelylimited(∼1.5-3.5at.%Cr)andaround 30nmawayfromtheoriginalCrlayer,nofurthersegregationcan bedetected(Fig.4(c)).

Fig.4.3DatommapsobtainedfromthenearCrlayerregionofthePtIr/Cr/WC specimenafter6hexposureat630◦Cunder1.12×10−23barO2partialpressure:(a)

Sideview,(b)topviewofthesliceIImarkedin(a),and(c)topviewofthesliceI markedin(a).Forclarity,onlyIr(blue),Cr(cyan),O(magenta)andWions(orange) areshown,ifanyofthemaredetected.(Forinterpretationofthereferencestocolour inthisfigurelegend,thereaderisreferredtothewebversionofthisarticle.)

3.1.3. After18hexposureat630◦Cunder1.12×10−23barO2 partialpressure

Fig.5(a)isanSEMimageacquiredfromthesurfaceofthe 18h-exposedspecimen.Comparedtotheas-fabricatedstate(Fig.3(a)), thesurfacemorphologyhaschanged.Fig.5(b)isaBFSTEMimage obtained froma cross-sectional TEMlamella. Even though the Cr layer can still be distinguished, as indicated by the bright-nesschange,itsupperregionseemstobedissolved,resultingina wavyPtIr/Crinterface.However,theCr/WCinterfaceisstillintact andflat.Fig.6(a)showsarepresentative3Datommapobtained fromthe Crlayerregionand a corresponding magnified cross-sectionalBFSTEMimage.Tobetterillustratethedistributionof eachspecies,blue-to-redrainbowcolourconcentrationmaps(blue indicateslowestconcentrationandredindicateshighest concen-tration)areshowninFig.6(b)anda1Dconcentrationprofilefrom thePtIrlayertotheWCsubstrateisplottedinFig.6(c).Boththe APTandSTEM resultsrevealtheformationofan∼50-nm-thick interdiffusionzonebetweenthePtIrandCrlayerwhichexhibits aninhomogeneouschemicalcomposition.TheCrcontent progres-sivelydecreaseswhiletheIrcontentincreasestowardsthePtIr layer.TheCroxidesformedduringdepositioncanstillbedetected, which seemsstable and remain immobile, thereby providing a markerofthepositionoftheoriginalCrlayer.AsdisplayedinFig.6 (c),thisintermixedregionisfoundtoformonthebasisofthe out-warddiffusionofCr.Therearestillsomenon-uniform,interrupted fragmentsoftheCrlayerleftneartheCr/WCinterface.Fig.7(a)and (b)aresideandtopview3DatommapsobtainedfromthePtIrlayer, respectively. Comparedto the6h-exposed state,larger amount ofCr(∼2.6–5.9at.%Cr)segregatingatthese grain-boundary-like-features.Fig.8showsaSTEM-EDSmapandacorrespondingHAADF STEMimageofaplan-viewTEMlamella,fromwhichthegrainsize andgrainstructure ofthePtIrlayercanberevealed.SinceCris exclusivelydetectedatgrainboundaries,itcanbeconfirmedthat thefeatureswhereCrisseentosegregateintheAPTdatasetsare

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Fig.5.SurfaceSEM(a)andcross-sectionalBFSTEMimage(b)ofthePtIr/Cr/WCspecimenafter18hexposureat630◦Cunder1.12×10−23barO2partialpressure.

Fig.6.RepresentativecharacterisationresultsobtainedfromthenearCrlayerregionofthePtIr/Cr/WCspecimenafter18hexposureat630◦Cunder1.12×10−23barO2

partialpressure:(a)A3Datommaptogetherwithamagnifiedcross-sectionalBFSTEMimage;(b)correspondingblue-to-redrainbowcolourconcentrationmapsofIr,Cr, CrOandWionswiththecolourscalethatblueindicatesthelowestconcentrationandredindicatesthehighestconcentration;(c)1DconcentrationprofilefromthePtIr layertotheWCsubstrate.TheinterdiffusionregionandundissolvedCrlayercanbeobserved.Forcomparison,theoriginallocationsofthePtIrandCrlayersaswellasthe WCsubstrateareshown.Atthediffusionfront,the∼20-nm-thicklayerwithalmostconstantcompositionissupposedtobeCr-richintermetalliccompound(IMC).(For interpretationofthereferencestocolourinthisfigurelegend,thereaderisreferredtothewebversionofthisarticle.)

actuallygrainboundaries.Infact,thesegregationofCratPtIrgrain boundariesgivesevidenceoftheshortcircuitdiffusionprocess.No noticeableamountofoxygenoranyoxideparticlesaredetectedat thegrainboundaries.

Fig.9showstheAPTanalysisresultfromthesurfaceregion. Here,discontinuousnanometre-sizedCroxideislandsarefound. Fig.9(b)illustratestopviewblue-to-redrainbowcolour concen-trationmapsofCrfromdifferentdepthofthedatasetshownin Fig.9(a).Bluecolourindicates0at.%Crandredindicates3.5at.%

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Fig.7.3DatommapsobtainedfromthePtIrlayerofthePtIr/Cr/WCspecimenafter 18hexposureat630◦Cunder1.12×10−23barO2partialpressure:(a)Sideview

(forclarity,Ptionsarenotshown);(b)topviewoftheregionmarkedbythe semi-transparentcubein(a).HereCrionsaredenotedwithbiggerdotstohighlighttheir segregationatgrainboundaries.

Cr.Asmarkedbythewhitearrow(Fig.9(b)III),underneaththe surface,there isagrainboundarydecoratedwithCratoms.The CratomsdiffuseviaPtIrgrainboundariesandthengetincontact withoxygenatthepositionswheregrainboundariesintersectwith thesurface.However,asFig.9(b)IandIIreveal,thenucleationofCr oxidesisnotrestrictedtothegrainboundaryarea(indicatedbythe whitedashedlines),implyingthatmetallicCratomsalsodiffused laterallyonthesurfacebeforereactingwithoxygen.Fig.10(a)isa cross-sectionalTEMimageofthesurfaceregionathigher magni-fication,inwhichthethinbrightestlayerisconsideredtobethe approximately1-nm-thickCroxide.Atthisstage,thesurfaceisnot fullycoveredbyCroxides.Fig.10(b)showstheAESsurfacemapsof Cr,IrandPt.ConsistentwiththeAPTandTEMobservations, inho-mogeneousCrsignalsweredetected.SinceAESisahighlysurface sensitivetechnique,theextensiveIrandPtsignalsconfirmthatthe surfaceCroxidesarethinnerthan2nm.

3.1.4. After168hexposureat630◦Cunder1.12×10−23barO2 partialpressure

Fig. 11(a) is an SEM picture taken from the surface of the 168h-exposedPtIr/Cr/WCspecimen.Comparedtotheas-fabricated (Fig.3(a))andthe18h-exposedspecimens(Fig.5(a)),the 168h-exposedspecimenexhibitsadifferentsurfacemorphology.TheBF STEMimageofa cross-sectionalTEMlamella(Fig.11(b))shows

Fig.9.(a)3DatommapofthenearsurfaceregionofthePtIr/Cr/WCspecimenafter 18hexposureat630◦Cunder1.12×10−23barO2partialpressure.TinyCroxides

canbefoundonthesurface.(b)Topviewblue-to-redrainbowcolourconcentration mapsofCrfromdifferentdepthofthedatasetshownin(a),whereblueindicates 0at.%Crandredindicates3.5at.%Cr.ThewhitedashedlinesinIandIIdepictthe positionofthegrainboundarymarkedwiththewhitearrowinIII.(Forinterpretation ofthereferencestocolourinthisfigurelegend,thereaderisreferredtotheweb versionofthisarticle.)

thattheoriginalCrlayerhasbeencompletelydissolvedandvoids haveformed.TheCr/WCinterfacealsobecomes rough.Another noticeablefeatureisthesurfaceoxidescale,whichcanbeseen moreclearlyinthemagnifiedBFSTEMimageshowninFig.12(a). After168h,largeramountsofCratomshavereachedthetop sur-faceandcontributedtothedevelopmentofathickeroxidescale, whichisidentifiedtobeCr2O3byAES(Fig.12(b)).Besidesthese surfaceoxides,noothernewlyformedoxidesnoranymeasurable amountofoxygenaredetectedinsidethestructure(Fig.12(c)).In addition,unlikethe18h-exposedstate,notonlyCratoms,butalso WandCoatomsarefoundatgrainboundariesandtriple junc-tionsofthePtIrlayer,whichisastrongindicationthatWCis,at thisstage,alsoinvolvedinthedegradationprocess.Fig.13shows amagnifiedcross-sectionalHAADFSTEMimageoftheinterfacial regiontogetherwithrepresentativeAPTresultsfromthisregion: (b)thebottompartofthePtIrlayer,(c)thePtIr/Crinterface,and (d)theCr/WCinterface.Asmentionedabove,theembeddedsmall Cr-oxideparticlescanbeusedasatraceroftheoriginalpositionof theCrlayer.Fig.13(d)illustratesthattheremainingCrispresent onlyinaverylimitedamount.Non-uniformdamageoftheWC sub-strateoccursattheCr/WCinterface,wherethedegradationfeatures

Fig.8.(a)STEMHAADFimageofaplan-viewTEMlamellafabricatedfromthePtIr/Cr/WCspecimenafter18hexposureat630◦Cunder1.12×10−23barO2partialpressure.

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Fig.10. (a)Magnifiedcross-sectionalTEMimageofthenearsurfaceregionofthePtIr/Cr/WCspecimenafter18hexposureat630◦Cunder1.12×10−23barO2partialpressure.

Athin,discontinuoussurfaceoxidescalecanbeobserved.(b)AESsurfaceelementalmapsshowingthedistributionofCr,IrandPtrespectively.Inaddition,theSEMimage ofthemeasuredareaisalsoshown.

Fig.11.SurfaceSEM(a)andcross-sectionalBFSTEMimage(b)ofthePtIr/Cr/WCspecimenafter168hexposureat630◦Cunder1.12×10−23barO2partialpressure.

alonggrainboundariesaresevere.Theinterdiffusionzoneformed betweenPtIrandCrafter18hexposureevolvedfurtherintoa mix-tureofsmallCr-richandW-richregions(Fig.13(b)).Additionally,in thebottompartofthePtIrlayer,someCr-richparticlesarefoundat thegrainboundariesandWatomssegregateattheparticle/matrix interfaces.

3.2. PtIr/Ni/WCspecimen

ThesurfaceSEMandcross-sectionalSTEMimages(notshown here) of the as-fabricated PtIr/Ni/WC specimen reveal similar featuresasthemicrostructureoftheas-fabricatedPtIr/Cr/WC spec-imen. The three different regions, PtIr layer, Ni layer and WC substratecanbeclearlydistinguishedandbothPtIr/NiandNi/WC interfacesareflat,sharpandfreeofvoids.However,asillustratedin Fig.14,somedifferenceswerediscoveredbyAPTanalysis.Firstly, therearenoembeddedNioxideswithintheNilayer,whichcanbe attributedtothehigheroxidationresistanceofNicomparedtoCr. Secondly,evenintheas-fabricatedstate,outwarddiffusionofNi alongPtIrgrainboundarieshasalreadytakenplace,buttheextent issmallandthediffusionlengthisbelow50nm.

Fig.15summarisestherepresentativecharacterisationresults ofthePtIr/Ni/WCspecimenafter48hexposureat630◦Cunder 1.12×10−23barO2partialpressure.Thecross-sectionalBFSTEM image(Fig.15(a))showsthatthePtIr/Niinterfaceisblurredandthe originalNilayerseemstoalreadydisappear.Fig.15(b)exhibitsthe APTresultobtainedfromthenearsurfaceregionofthespecimen.Ni atomsratherthanNioxidesarefoundtoaccumulateatthesurface. WithinthePtIrlayer,theenrichmentofNiatomsatgrain bound-ariesisobvious(Fig.15(c)),revealingthattheoutwarddiffusionof Niisalsosupportedbytheshortcircuitdiffusionmechanism.The 1Dconcentrationprofileacrossthegrainboundary(Fig.15(c)) indi-catesthatatthisstage,onlyNiatomsaresegregatedatthegrain boundaries.Fig.15(d)summarisestheresultsobtainedfromAPT analysisofthenearNilayerregion.SimilartothePtIr/Cr/WC sam-ple,aninterdiffusionregionformed,whichcontainsNi-richand W-richzones.Eventhoughfromthecross-sectionalSTEMimage, noobviousdamagesarevisibleat theNi/WCinterface,theAPT resultsclearlysuggestthatthedegradationofWCalreadystarted. Howeveratsuchrelativelyshortexposuretime,elementsfromthe WCsubstratehavenotyetpenetratedintothePtIrlayer.

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Fig.12.RepresentativecharacterisationresultsobtainedfromthenearsurfaceregionofthePtIr/Cr/WCspecimenafter168hexposureat630◦Cunder1.12×10−23barO2

partialpressure:(a)cross-sectionalBFSTEMimage;(b)AESpointanalysisresult(differentialspectrum)showingthatthesurfaceoxidesareCr2O3;(c)3Datommaps.Left:

sideview;right:topviewofthebottom30nmsliceofthedatasetshownontheleft,asmarkedbythesemi-transparentcube.ThesegregationofCr,WandCoatomsatthe PtIrgrainboundariesaredetected.

4. Discussion

ThedegradationevolutioninthePtIr/Cr/WCspecimendeduced fromtheexperimentalobservationsissketchedinFig.16.Similar phenomenawereobservedinthecaseofthePtIr/Ni/WCspecimen. TheonlymajordifferenceisthatwhenNiatomsdiffusethroughthe PtIrlayerandreachthesurface,theyarenotoxidised.Accordingto thermodynamics,seee.g.theEllinghamdiagram[46],at630◦C,the criticaloxygenpartialpressuretooxidiseNiis∼10−17bar,which issubstantially higherthantheoneappliedinourexperiments (∼1.12×10−23bar).

4.1. Outwarddiffusionoftheinterlayer

TheoutwardtransportandsegregationofCrorNiatomsalong thegrainboundariesofthePtIrlayerseemstoindicatetheonset ofthe degradationprocess. For thePtIr/Cr/WC specimen,these processestakeplaceslowlyatthebeginning.After6hexposure, onlyasmallamountofCrisdetectedatthePtIrgrainboundaries, withinadiffusiondistanceofapproximately30nm.Comparedto Cr,Nifollowsthesametransportmechanismbutatahigher dif-fusionrate.Alreadyduringcoatingdeposition,Niatomspenetrate intothePtIrlayer.Fromathermodynamicpointofview,the

gra-dientinchemical potentials oractivitiesofindividual elements acrosstheinterfacedrivestheirdiffusion.Thisgradientinchemical potential,togetherwiththeelementaldiffusivity,determinestheir diffusionbehaviour.Typically,diffusionalonggrainboundariesis 4–8ordersofmagnitudefasterthantransportwithingrain inte-riors[47],therefore,atrelativelyshorttimeandlowtemperature (typeB-diffusionregime[48,49]),grainboundariesarethemain pathwaysfortheoutwarddiffusionofatomsfromtheinterlayer. GrainboundarydiffusiondataforCrandNiinPtIrarenot avail-ableinliterature.Accordingtoourresultsoftheas-fabricatedand earlydegradationstates,itislikelythatNidiffusesfasterthanCr. However,after48h,asshowninFig.17,thewholesurfaceofthe PtIr/Cr/WCsampleiscoveredbyanoxidescalewithathickness intherangeof15–120nm.WhileforthePtIr/Ni/WCsample,even after48h,thequantityofNiatomsaccumulatingonthesurfaceis stillsmall(Fig.15(a)),whichseemstocontradictourprevious infer-encethatNidiffusesmorerapidlythanCr.Ithasbeenreportedin previousstudiesthatsurfaceoxidationcanstronglyaffectinternal materialtransport.Thefirstdiffusionstepofsolutesdecoratingthe PtIrgrainboundariesisdrivenbytheGibbsadsorptionisotherm,i.e. theinterfaceenergygetsreducedbysolutedecoration.Thiscreates adiffusionfluxalongthegrainboundariestowardsthesurface.As thediffusingspeciesreachthefilmsurface,theoxidationprocess

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Fig.13.Representativecharacterisation resultsobtained from thenear inter-face regionof thePtIr/Cr/WCspecimenafter 168hexposure at630◦Cunder

1.12×10−23barO2partialpressure:(a)cross-sectionalHAADFSTEMimage.(b)On

theleft:3DatommapofthebottompartofthePtIrlayerwithiso-concentration sur-faceof1.2at.%W(orange);ontheright:correspondingblue-to-redrainbowcolour concentrationmapsofCrandW.(c)Ontheleft:3DatommapofthePtIr/Cr interfa-cialregion;ontheright:correspondingblue-to-redrainbowcolourconcentration mapsofIr,Cr,WandCrO.(d)Ontheleft:3DatommapoftheCr/WCinterfacial region;ontheright:correspondingblue-to-redrainbowcolourconcentrationmap ofIr,Cr,CrOandW.Inallconcentrationmaps,blueindicatesthelowest concentra-tionandredindicatesthehighestconcentration.Forclarity,inallatommaps,onlyIr (blue),Cr(cyan),W(orange)ionsandCroxideparticles(magenta)areshown,ifany ofthemaredetected.(Forinterpretationofthereferencestocolourinthisfigure legend,thereaderisreferredtothewebversionofthisarticle.)

Fig.14.(a)3DatommapofthenearNilayerregionoftheas-fabricatedPtIr/Ni/WC specimen.Forclarity,onlyIr(blue),Ni(green)andW(orange)ionsareshown.(b) 1DconcentrationprofileacrosstheNilayer.(Forinterpretationofthereferencesto colourinthisfigurelegend,thereaderisreferredtothewebversionofthisarticle.)

startsremovingsolutesfromthematerial,particularlyfromthe decoratedgrainboundariesbecausetheygettrappedintheoxides. Thiseffect reducestheirsolute chemical potentialonthegrain boundaries,hencecreatingachemicalpotentialgradienttowards thesurface,promotingfurtheroutbounddiffusion[31,50–54].Then theoutwardtransportationofthediffusingelementbecomesthe slower,rate-controllingstep[55].AsforthePtIr/Ni/WCsample, theexposureatmosphere isnon-oxidising.Thereisno substan-tialattractiveforcetofurtherpromotethespreadingandlateral diffusionofNiatomsontothePtIrsurface,especiallyonceafirst surfacecoverageisreached.Undersuchconditions,Niatomswill bemostly trappedalong thegrainboundariesof thePtIrlayer. Therefore,asillustratedinFig.15(c),significantenrichmentsofNi (∼30at.%)withbroadsegregationzones(>10nm)arefrequently foundatnumerousPtIrgrainboundaries.Whentheyaresaturated, therewillbenofurtherthermodynamicdrivingforceforfurther segregation.

4.2. Formationofintermetallicphaseandevolutionofthe interfacialregion

Sincethereisnosubstantialdifferenceintheinternal degra-dation processes between the PtIr/Cr/WC and the PtIr/Ni/WC specimen,inthis and thefollowingsubsections,thePtIr/Cr/WC systemwillbetaken asrepresentative.After168hexposureat 630◦C under1.12×10−23barO2 partialpressure,Cr-rich parti-clesappearatPtIrgrainboundaries(Fig.13(b))aswellasinside theinterdiffusionregion(Fig.13(c)).APTanalysisrevealsthatthe chemical compositionsof alltheseCr-rich particlesare similar, namelyapproximately56at.%Ir,17at.%Ptand27at.%Cr. Stud-ies aboutthe Pt-Ir-Cr ternary system are rare in theliterature andknowingthechemicalcompositionoftheprecipitatesaloneis insufficienttodrawanunequivocalconclusionabouttheassociated reactionandphasetransformationpathways.Thecompositional similarityobservedisnonethelessastrongindicationthatallthese particlesbelongtothesametypeofintermetallicphase.Moreover, after168hexposure,localequilibriabetweenPtIrandthenewly formedintermetalliccompound particles aremostlikely estab-lished,which meansthatthis intermetallicphase, denotedhere as(Pt,Ir)3Cr,isthefirststableintermetallicphasefromthe PtIr-richsidetotheCr-richside,yet,withcomparablyhighPtIrcontent andlowCrcontent.After18h,volumediffusioninducedchanges becomesubstantial.Awell-definedinterdiffusionzone between thePtIrandCrlayerappears(Fig.6)andCrisproventobethe dominantdiffusingspecies.However,surprisingly,theCrcontent withinthewholeregionismuchhigherthan27at.%.Additionally, asnotedfromtheconcentrationprofile,inthediffusionfront,there isan∼20-nm-thickthinlayerwithalmostconstantcomposition (markedinFig.6(c)),namelyapproximately43at.%Ir,17at.%Pt and40at.%Cr.Itisthusverylikelythatanothertypeof intermetal-licphasehasformed,denotedhereas(Pt,Ir)3Cr2,whichshouldbe closertotheCr-richsideinthephasediagram.

The evolution fromthe Cr-richto thePtIr-rich intermetallic compoundcanbeexplainedbythefollowingmechanism.Firstly, theintermetallicphasewiththelowesteffectiveinterfacial reac-tionbarrier,e.g.(Pt,Ir)3Cr2,nucleatesatthePtIr/Crinterface.With ongoingexposure,theCrinterlayeriscontinuouslyconsumedby thegrowthoftheseintermetalliccompoundnucleiaswellasthe formationofsurfaceoxidescale.WhentheoriginalCrlayerhas beenfullyconsumed,theCractivitywilldropandtheformation of(Pt,Ir)3Cr2willstop.Subsequently,thechemicalpotential gradi-entacrossthePtIr/(Pt,Ir)3Cr2interfacewilldrivePtIrtodiffuseinto (Pt,Ir)3Cr2 andCrmaydiffuseout.Afterashorttransitionperiod, thesecondintermetallicphase,i.e.(Pt,Ir)3Cr,withhigherPtIr con-tentwillformandgrow.Correspondingly,(Pt,Ir)3Cr2 willshrink andevendisappear.Thisphenomenon,termedassupply

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limita-Fig.15.RepresentativeanalysisresultsobtainedfromthePtIr/Ni/WCspecimenafter48hexposureat630◦Cunder1.12×10−23barO2partialpressure:(a)cross-sectional

BFSTEMimage.(b)3Datommapofthesurfaceregion.(c)Ontheleft:3DatommapofthePtIrlayerwithiso-concentrationsurfaceof15at.%Ni(green);ontheright:1D concentrationprofilewithinthecylinderhighlightedintheatommapalongthedirectionmarkedwiththeredarrow.(d)ontheleft:3DatommapofthenearNilayer region;ontheright:correspondingblue-to-redrainbowcolourconcentrationmapsofIr,Ni,andWwiththecolourscalethatblueindicatesthelowestconcentrationand redindicatesthehighestconcentration.Forclarity,inallatommaps,onlyIr(blue),Ni(green)andW(orange)ionsareshown,ifanyofthemaredetected.(Forinterpretation ofthereferencestocolourinthisfigurelegend,thereaderisreferredtothewebversionofthisarticle.)

Fig.16. SchematicillustrationoftheevolutionofdegradationofthePtIr/Cr/WCsystemduringisothermalexposureat630◦Cunderawell-controlledatmosphere(N2-2.5%H2

with+20◦Cdewpoint,PO2≈1.12×10−23bar).

Fig.17.Cross-sectionalBFSTEMimageofthenearsurfaceregionofthePtIr/Cr/WCspecimenafter48hexposureat630◦Cunder1.12×10−23barO2partialpressure.The

edgeofthesurfaceoxidescaleishighlightedusingreddottedline.(Forinterpretationofthereferencestocolourinthisfigurelegend,thereaderisreferredtotheweb versionofthisarticle.)

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Fig.18. APTresulted1Dconcentrationprofileandacorrespondingatommapacross theinterfacebetweenaCr-richandaW-richintermetalliccompound(IMC).For clarity,onlyCr(cyan)andWions(orange)areshown.(Forinterpretationofthe referencestocolourinthisfigurelegend,thereaderisreferredtothewebversion ofthisarticle.)

tioninducedsecondphaseformation,hasbeenreportedinvarious previousstudies[11,56–63].

Atalaterstage,theWCsubstratealsogetsinvolvedinthe reac-tiveinterdiffusionprocess,givingrisetotheformationofaW-rich intermetalliccompound(Fig.13).Fig.18showsa1Dconcentration profilefromaCr-richtoaW-richparticle.ThesolubilityofCrinthe W-richparticlesisfoundtobeverylimited,implyingthatCratoms havebeensubstitutedbyWatomstoformaW-richphase. Actu-ally,theCr-richintermetallicphaseistheproductofthereaction betweenPtIrandCrlayer.AfterthefullconsumptionoftheCrlayer, WCbecomesthenewendmember.Forthissystem,i.e.PtIr-WC, theCr-richintermetallicsshouldbeunstablephases,whichwill begraduallyreplacedbythermodynamicallymorestablephases, suchastheobservedW-richphase.Inadditiontotheintermetallic compounds,achainofnanometre-sizedvoidsarealsoformedin theinterfacialregion(Fig.13).Thisphenomenonisattributedto theKirkendalleffect,whereanimbalanceinmasstransportdueto differentdiffusionratescreatesfreevolumeandhencevoidsare formed.Morespecific,inthepresentcasewhereCristhe dominat-ingdiffusingspecies,duringitsoutwarddiffusion,vacanciesmove intheoppositedirection.Theseextravacanciesmaycondensate furtherintovoids[9,64–66],whichmayplayanimportantrolein theonsetofdegradationoftheWCsubstrate.

4.3. Dissolutionofthetungstencarbide

ThedissolutionofWCoccurringduringthelaterstagesof degra-dationfirstrequiresthedecompositionofthecompound,especially considering that only W atoms, rather than WC entities, were involvedinthereactiveinterdiffusionprocess.SincenoCatoms werefoundwithinthesurfacecoating,apossibilityisthatWCfirst reactedwithoxygen,resultingin elementaltungstenaswellas gaseousspeciessuchasCOandCO2,whichformedattheexpense ofthefreecarbonatoms,andfinallyleakedintotheatmosphere [67,68].Asforthematerialwestudiedhere,WChasnodirect con-tactwithair,thepre-requisiteisthatoxygenpenetratethrough thecoating.HoweveraccordingtotheAPTresults,nosubstantial amountsofoxygenweredetected(Fig.7(b),Fig.12(c)).Apossible reasoncouldbethatafterexposure,specimensarecooleddownto

roomtemperatureslowly(coolingrate∼5◦C/min).Duringsucha slowcoolingprocedure,gasesincludingO2,COandCO2mayescape forinstanceviadiffusingalongthegrainboundaries.Another pos-sibilityisthatthesegaseousphasesmaybetrappedintheobserved voidsattheinterfacialregionandpromotefurthervoidnucleation andgrowth[69,70].

APTreliesonthedetectionofindividualionswhichare suc-cessivelyfieldevaporatedfromasharp,needle-shapedspecimen andidentificationofthemusingtime-of-flight(TOF)mass spec-trometry.Quantitativechemicalinformationisnormallyobtained throughcountingtheionswithinthepeaksoftheresultingmass spectrum,whichisahistogramshowingthenumberofthedetected ionsasafunctionofmass-to-chargeratio,i.e.TOFvalue[71–73]. Therefore,theaccuracyoftheresultswillbeinfluencedbyerrors forexampleinpeakrecognition,peakdeconvolution,mass rang-ingandbackgroundsubtraction[74,75].Insomecases,minorpeaks maybeburiedunderbackgroundduetotheirlowintensity.Inthis study,thepossibleimportantsimpleormolecularionspeciesthat containoxygenareO+,O

2+,CrO2+,CrO+,CrO22+,CrO2+andCrO3+. Theoverallnoiselevelatthesepositionsisevaluatedtofallinto therangeof0.18–0.84at.%,dependingonthedataset.Therefore, iftheoxygencontentisbelow∼1at.%,itwouldnotnecessarilybe properlyquantified.Indeed,sinceCrisnotfoundtobeoxidised internallyatleastuptothis stage,theactivityofoxygenwithin thematerialinteriorshouldbebelowthecriticalpartialpressure of Croxidation. AccordingtotheEllingham diagram, at630◦C, thecriticaloxygenpartialpressureforCroxidationis∼10−34bar (Cr→Cr2O3),andforWoxidationis∼2.2×10−25bar(W→WO2) [46].IfCrhasnotbeenoxidisedinternally,itisnotpossibleforWto getoxidised.However,ifcoatingspallationtakesplace,andtheWC substrateisindirectcontactwithair,orincasethatthemetallic tungstenatomsdiffusetothesurface,wherehigheroxygenpartial pressureprevails,oxidationoftungstenwilltakeplace.

5. Conclusion

We investigatedthestability and degradationevolution ofa bimetalliclayercoating(PtIr/CrandPtIr/Ni)oncementedtungsten carbidesubstrateduringisothermalexposuretreatmentat630◦C underawell-controlledatmosphere(N2-2.5%H2with+20◦Cdew point,PO2≈1.12×10−23bar).Fromourexperimentalresults,the followingconclusionscanbedrawn:

(1)The transportand migration ofdifferentatomic speciescan be traced by APT.Combining theAPT results withdetailed microstructureanalysisusingadvanced electronmicroscopy suchasSTEMprovidesadditionallynewinsightsintothe degra-dationprocessinmultilayerthinfilmsorcoatings.

(2)Bothsystemsstudied,i.e.PtIr/Cr/WCandPtIr/Ni/WC,are unsta-bleundertheexposureconditions.CrorNiwereobservedto diffusethroughPtIrgrainboundariestothesurface,whereCr gotoxidisedselectively,whileNiremainedmetallic.Internally, all threeregions, i.e.PtIr,Cr(Ni)and WC,wereinvolved in complexreactiveinterdiffusionprocesses,givingriseto inter-metallicparticlesandvoidsattheinterfacialregion.

(3)ThenanocrystallinecolumnargrainstructureofthePtIrcoating isakeyfactorlimitingthestabilityofthesystem,asitprovides numerousfastandshortdiffusionpathways.

(4)BycomparingthePtIr/Cr/WCtothePtIr/Ni/WCsamples,itis possibletoinferthatsurfaceoxidationpromotesthe replenish-ingdiffusionofsoluteCrtowardssurfaceatthelaterexposure stages. Initially, for both systems, segregation to the grain boundaries is thedominating drivingforce forthe outward diffusion,whichoccursfasterforNithanforCr.

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Acknowledgements

Theauthorsaregratefulforthefinancialsupportfromthe Ini-tialWearproject, fundedby theMax-Planck-Gesellschaft(MPG) andtheFraunhofer-Gesellschaft.TheexposuretreatmentsandAES measurementswere conductedby AlexandraVogel, we greatly appreciateher help. Theauthors arethankful to UweTezins & AndreasSturmfortheirsupportoftheAPT&FIBfacilitiesatMPIE. AleksanderKostka(Ruhr-UniversitätBochum),MinjieLai,Volker Kreeand ChristianLiebscher arethankedfor theirvitalhelp in (S)TEMexperiments.

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수치

Fig. 1. (a) Configuration of the deposition chamber. (b) Sketch showing the arrangement of the pure Ir and Pt pieces within the target
Fig. 2 , the APT specimens were prepared with an alignment per- per-pendicular to the sample surface, so that the analysis direction is parallel to the coating growth direction
Fig. 4. 3D atom maps obtained from the near Cr layer region of the PtIr/Cr/WC specimen after 6 h exposure at 630 ◦ C under 1.12 × 10 −23 bar O 2 partial pressure: (a)
Fig. 6. Representative characterisation results obtained from the near Cr layer region of the PtIr/Cr/WC specimen after 18 h exposure at 630 ◦ C under 1.12 × 10 −23 bar O 2
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