1 CHAN PARK, MSE, SNU Spring-2019 Crystal Structure Analyses
TEXTURE
Krawitz Chap 11 Hammond Chap 10 Cullity Chap 14 Dyson Ch 11
Klug & Alexander Chap 10
Crystal Structure AnalysisMaterials Science & Engineering, Seoul National University CHAN PARK
2 CHAN PARK, MSE, SNU Spring-2019 Crystal Structure Analyses
Crystalline nature of materials
Many solid materials are composed of crystals joined together
The individual grains can fit together closely to form the solid
XRD can determine macroscopic orientation of a collection of grains (individual grains using micro diffraction possible)
EBSD can determine the orientation of individual grains and characterize grain boundaries
Crystallized copper oxide
Silicon iron alloy
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Crystalline nature of materials - Grains
A grain is a region of distinct crystal orientation within a polycrystalline material
A grain boundary is the interface between two neighboring grains
Grain boundaries have a significant influence on the properties of the material, dependent on the misorientation across boundaries
Grain boundaries are regions of comparative
disorder, but special grain boundaries exist where a significant degree of order occurs “CSL”
boundaries which have special properties
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Crystalline nature of materials – CSLs
Coincident site lattice boundaries (CSLs)
A significant degree of order occurs at a CSL boundary, which leads to special properties
Schematic presentation of a
3
boundary.Where the two grain lattices meet at the boundary, 1 in every 3 atoms is shared or
coincident – shown in green.
Schematic presentation of a
5
boundary. 1 in every 5 atoms is shared or coincident.
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Crystalline nature of materials – properties
If properties are equal in all directions, a material is termed
“isotropic”.
If the properties tend to be greater or diminished in any direction, the material is termed “anisotropic”.
Most materials are anisotropic.
Anisotropy results from preferred orientation or texture.
Random orientation Preferred orientation Highly oriented - close to a single crystal
isotropic vs. anisotropic
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Anisotropic structure of wood
Crystal structure - anisotropic arrangement of atoms
Photoelastic anisotropy used to visualize strains and
stresses Structure and Anisotropy
Prof. Jeong Hyo Tae, Kangnung National Univ.
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Texture
All orientations of crystallites possible
1cc powder of 10um crystallites 10
9particles
1cc powder of 1um crystallites 10
12particles
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Texture
Random powder – all crystallite orientations equally probable flat pole figure
Loose powder
Metal wire
(100) random texture
(100) wire texture
Crystallites oriented along wire axis - pole
figure peaked in center and at the rim
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RD, TD, & ND
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What is Texture?
Ks
K s
ND
Normal direction
K c
][001
[010]
[100]
RD Rolling direction TD
Transverse direction
K
Sspecimen reference frame sample coordinate system K
Ccrystal reference frame
crystal coordinate system
Orientation of Grains in Polycrystalline Solid
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Texture
In a polycrystalline body, the individual crystallites may have a random or non-random distribution of orientations.
A body with a non-random distribution of orientation is said to be textured or to display preferred orientation.
As materials properties are anisotropic (depend on the direction within a crystal), the presence of texture will alter the physical
properties of the polycrystalline material.12 CHAN PARK, MSE, SNU Spring-2019 Crystal Structure Analyses
Texture
Very common condition – difficult to prepare texture-free aggregate
Can have a profound effect on diffracted intensities
Many forming processes such as rolling & drawing introduce texture into a material deformation texture
On annealing, the texture can change, but not become random Annealing texture
Texture is well-studied because of its wide presence in real materials and its pronounced effect on physical properties
property
value in Zr along
c-axis a-axis
Young’s modulus 125 GPa 99 GPa CTE 11.4 x 10-6 K-1 5.7 x 10-6 K-1
Polycrystalline material with preferred orientation of the crystallites, can exhibit anisotropy in its physical properties, depending on the degree of preferred orientation
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Where is texture observed ?
Geology Biology Metals Ceramics Polymers
Rocks Teeth Alloys Oxides Polyethylene
Soils Bones Intermetallics Silicates Polypropylene
Ores Shells Nitrides Liquid Crystals
Ice Carbides
Salt
Natural Materials Man-made Materials
Prof. Jeong Hyo Tae, Kangnung National Univ.
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Why texture is important?
Each single crystal has anisotropic properties with respect to direction (e.g.
mechanical property, magnetic property…).
When orientations of grains are randomly distributed, macroscopic property of the sample is isotropic.
In textured materials, many macroscopic properties are anisotropic, i.e. they depend on direction.
Sheet steel
motors, transformers --- {110} // surface
severe deformation (drawing, rolling) --- {111} ⊥ surface
Control of texture degree of deformation, annealing temperature
Custom-made desired texture, is still difficult
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Why texture research is important ?
Texture is responsible for anisotropy of various properties
plastic deformation
mechanical properties
corrosion and oxidation
magnetic properties
electrical conductivity
……….
It allows to better understand various processes
geological processes
deformation of metals
annealing processes
electroplating
oxidation of materials
diffusion of atoms
phase transformation
…….
Prof. Jeong Hyo Tae, Kangnung National Univ.
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How is Texture formed & measured?
How is Texture formed ?
Solidification
Metal forming
Mechanical deformation
Annealing
Sintering
Thin films
How is Texture measured?
Etch pits
X-Ray diffraction
Neutron diffraction
EBSD
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Deformation texture, Annealing texture
Deformation texture
Texture produced by forming process (wire drawing, sheet rolling)
Grains undergo slip & rotation during plastic deformation.
Annealing texture (recrystallization texture)
When cold-worked materials with deformation texture is recrystallized by annealing, new structure can have a texture different from that of the un-annealed material.
Results from the effect of the pre-existing texture on the nucleation &
growth of new grains in the material
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Fiber texture, Rolling texture
A common direction parallel to the fiber or wire axis [uvw]
Fiber texture
Defined by {hkl}<uvw>
{hkl} - planes // to sheet surface
<uvw> - direction // to rolling direction Rolling texture
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Fiber texture
In a sample with fiber texture, there is a preference for one (or more) directions within the grains [uvw] to lie close to the fiber axis
Fiber axis lies along a wire or fiber
Materials with fiber texture display rotational symmetry in the distribution of directions [uvw] about the fiber axis
Fiber texture is common in wires and other materials formed by drawing or extrusion
In some materials, there may be more than one direction that is preferentially oriented along the fiber axis
Cu wire often has [111] + [100] texture
Many grains have [111] orientation close to the fiber direction but there are also a lot of grains with [100] close to the fiber axis – typical example of double texture
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Sheet (rolling) texture
In a specimen showing sheet texture, grains prefer to have a set of planes (hkl) parallel to the sheet surface and a direction [uvw]
aligned with the rolling direction that was used during manufacture
The ideal orientation is specified by (hkl)[uvw]
In real materials, not all grains are oriented with planes (hkl) exactly parallel to the surface and direction [uvw] along the rolling direction.
The distribution of orientations that are present can be displayed by the use of a stereographic projection called a
pole figure
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How to represent texture?
Miller index
Pole figure
Inverse pole figure
Orientation distribution function (ODF)
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Miller index of crystal orientation; {hkl}<uvw>
3 orthogonal directions as reference frame
Most widely used ones
Rolling direction (RD)
Transverse direction (TD)
Normal direction (ND)
Can identify a crystal plane (hkl) normal parallel to ND and a crystal direction [uvw] parallel to RD, written as (hkl)[uvw]
{100}<110>
Oxford Instrument
Ks
{110}<001>
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Pole figure vs. inverse pole figure
Pole figure – intensity variation of one family of planes (poles) as a
function of sample orientation Inverse pole figure – intensity variation of several families of planes in a fixed sample orientation
Data are plotted in “times random” unit --- in ratios of actual counts at a point to counts obtained from the corresponding random sample under the same experimental conditions
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Pole Figure & Inverse Pole Figure
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Pole figure
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Pole
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Pole figure
RD
TD ND
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Pole figure
Imagine a sample of a cubic material with only 10 grains. The orientation of the {100} directions for each grain (thirty of them) can be determined and plotted on a stereographic projection (100) pole figure.
No texture poles will be uniformly distributed on the PF.
Textured poles will tend to group together in certain place on the PF.
Random orientation
Preferred orientation
(a) (b)
Uniform distribution of poles the material is not textured
Cullity 3rdEd. Page 405
Poles cluster close to the rolling direction and
⊥
tothe sheet (100)[010] texture. The cubic symmetry of the material requires that there should also be poles in the transverse direction
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(100) Pole figure
(111)[011]
Prof. Jeong Hyo Tae, Kangnung National Univ.
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(100) Pole figure
(111)[011]
Prof. Jeong Hyo Tae, Kangnung National Univ.
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(100) Pole figure
(111)[011]
Prof. Jeong Hyo Tae, Kangnung National Univ.
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(100) Pole figure
(110)[001]
Prof. Jeong Hyo Tae, Kangnung National Univ.
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(100) Pole figure
(110)[001]
Prof. Jeong Hyo Tae, Kangnung National Univ.
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(110) Pole figure
(110)[001]
Prof. Jeong Hyo Tae, Kangnung National Univ.
35 CHAN PARK, MSE, SNU Spring-2019 Crystal Structure Analyses Prof. Jeong Hyo Tae, Kangnung National Univ.
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Top
Side
bi-axial texturing uni-axial texturing
no texturing
top view
side view I Texture - film
In-plane texture
Out-of-plane texture
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Texture – film
no texturing
uni-axial T bi-axial T
film1 substrate
film2film3 film4
c a
out-of-plane texture in-plane texture
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OMEGA scan - out-of-plane texture
ω
Oak Ridge National Lab
-15 0 15
ω (deg.)
Ni
(002) 7.0˚
If grain size is very large, sampling problems may inhibit accurate estimation
of pole densities Cube-textured Ni
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PHI scan - in-plane texture
sample detector
θ
X-ray s ource
x 2θ z
y
sample detector
sample detector
θ
X-ray s ource
x 2θ z
y x
z
y
x y
X sample D z X sample D
φ
x y
z x
y
X sample D z X samsampleple D
φ
x z y
sample
detector
sample
detector
x
χ
z
y x
z y
sample
detector
sample sample
detector
χ
φ(deg.)
0 90 180 270 360
Ni
(111) 8.5˚
φ(deg.)
0 90 180 270 360
0 90 180 270 360
Ni
(111) 8.5˚
Oak Ridge National Lab
θ(ω), 2θ, χ − fixed φ − zero to 360
°40 CHAN PARK, MSE, SNU Spring-2019 Crystal Structure Analyses
Pole figure
θ(ω), 2θ, − fixed
χ − zero to 70° (e.g. 5° step) φ − zero to 360° (e.g. 5° step)
0 .05 0 .12 0 .29 0 .69 1 .64 3 .90 9 .24 2 1.9 2 5 1.9 8
φ χ
φ(deg.)
0 90 180 270 360
Ni (111)
8.5˚
φ(deg.)
0 90 180 270 360
0 90 180 270 360
Ni (111)
8.5˚
θ(ω), 2θ, χ −fixed φ −zero to 360°
Cube-textured Ni
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Pole Figure
(111) pole figure of (100) oriented single crystal (or polycrystalline with in-plane orientation)
54.73°
54.73°
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Pole figure
Probability function for texture
A stereographic projection of a crystal axis down some sample direction
A stereographic projection showing the orientation distribution of a certain direction (pole) within the crystals of the specimen
A pole figure is scanned to measure the diffraction intensity of a given reflection (2θis constant) at a large number of different angular
orientations of the sample
A contour map of the intensity is then plotted as a function of angular orientation of the specimen.
The most common representation of the pole figures are stereographic or equal area projections
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Pole figure
The intensity of a given reflection (hkl) is proportional to the number of hkl planes in reflecting condition (Bragg’s law). PF gives the probability of finding a given crystal-plane-normal as a function of the specimen orientation. If the crystallites in the sample have a random orientation, the recorded intensity will be uniform
PFs tell you about the orientation of one direction in a crystal
PFs does not fully specify the orientation of the crystals in the sample
More than one PF is needed for this
Which reflection to use in PF measurement (100 or 111 or …) has to be selected based on the material. (111) PF can be very informative for some materials, but may not be that useful in some other materials.
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Texture analysis using XRD
Reflection method
α (or χ) : 0
o- 70
o incomplete pole figure
β (or φ) : 0
o- 360
o Transmission method
α (or χ) : 0
o- 50
o incomplete pole figure
φ
χ α
φ(δ)
Reflection transmission
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TD
α
RDβ
Back- reflection range
Pole Figure – reflection method
Prof. Jeong Hyo Tae, Kangnung National Univ.
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TD
α RD
β
Back- reflection range Pole Figure – reflection method
Prof. Jeong Hyo Tae, Kangnung National Univ.
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TD
α RD
β
Back- reflection
range Pole Figure – reflection method
Prof. Jeong Hyo Tae, Kangnung National Univ.
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TD
α RD
β
Back-reflection range
Pole Figure – reflection method
Prof. Jeong Hyo Tae, Kangnung National Univ.
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TD
β RD
90°-α
Transmission range Pole Figure – transmission method
Prof. Jeong Hyo Tae, Kangnung National Univ.
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TD
β RD
90°-α
Transmission range Pole Figure – transmission method
Prof. Jeong Hyo Tae, Kangnung National Univ.
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Back-reflection range
Transmission range
Overlapping Zone
TD
α β RD
Overlapping region
Complete PF
Incomplete PF
Prof. Jeong Hyo Tae, Kangnung National Univ.
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Pole figure measurement
PFs are not typically determined by examining individual grains. They are determined by a combination of powder diffraction with either an area detector and/or a device for reorienting the whole polycrystalline material
If a diffractometer is set at a θBto record the (111) reflection, reorienting the sample while measuring the diffracted intensity will provide the required information to compute a PF as only those grains that have their (111) planes perpendicular to the diffraction vector will contribute to the recorded intensity
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Four circle diffractometer > Relation between rotation axes
The systematic change in angular orientation of the sample is normally achieved by utilizing a four-circle diffractometer
The intensity data are collected for various settings of CHIand PHI
Normally we measure all PHI values for a given setting of CHI, we then change CHI and repeat the process
θ(ω) 2θ
χ φ α: sample tilting (χ)
β: sample rotation (φ)
Bruker
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Cube component {001}<100>
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Pole figures – fiber texture
In PFs for a materials with fiber texture, rotational symmetry around the fiber direction can be found
The angle between the fiber axis and the peaks in the distribution of poles tells you what direction is preferentially aligned with the fiber axis
(111) Pole figure for a cubic material with imperfect [100]
fiber texture
The high probability shaded region makes an angle φ of ~54.7°to the fiber axis. This is the angle between [100] fiber axis and the (111) poles
Cullity 3rdEd. Page 406
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Sheet texture by diffractometer
In order to determine a PF using a diffractometer, the sample has to be reoriented in the beam.
Each different orientation gives an intensity that can be used to determine one point on a PF
After absorption correction, the intensity is directly proportional to the density of poles on the PF
Sheet texture can be measured in transmission and reflection. Both types of measurements are
needed for a complete PF α andδ are sample rotation angles. They are varied so that different points on the PF can be determined
Cullity 3rdEd. Page 411
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Transmission method - diffractometer
For α = 0, the diffraction vector is in the plane of the sheet. As α increases and we start to measure points closer to the center of the PF, the absorption goes up. This change in absorption has to be
corrected for, during the calculation of the PF
α
φ(δ)
Cullity 3rdEd. Page 413
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Transmission method - diffractometer
Absorption restricts the ability to measure PFs in transmission.
Need a sample with
µt ~ 1. This means 35um for iron or 75 um forAl with Cu Kα radiation. Real samples usually have to be thinned and their surfaces etched so that a useful measurement can be made.
Even after thinning, only the outer parts of the PF can be measured.
At α > 50°, absorption correction becomes inaccurate and specimen
holder frame obstructs the diffracted beam a major problem for
some values of
α59 CHAN PARK, MSE, SNU Spring-2019 Crystal Structure Analyses
Transmission method - Absorption correction
The diffracted intensity has to be corrected for absorption.
This correction can be very large.
Correction factor R for a sample with mt = 1 and θ = 19.25°
The measured integrated
intensity has to be divided by the correction factor (R)
For angles
α> 50°, 1/R increases rapidly and the data is no longer usable
Cullity 3rdEd. Page 415
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Schulz reflection method - diffractometer
The center part of the PF can be measured by reflection
χ
: 0
o- 70
o φ: 0
o- 360
oφ χ
Cullity 3rdEd. Page 416
This geometry allows
measurements over a large range of χ values without the
use of an absorptioncorrection
Measurements at different χ
and
φvalues can be used to
determine the center portion
of the PF
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Plotting pole figures
If transmission and reflection measurements have to be combined, the two sets of data have to be carefully scaled together so that the PF is continuous.
PFs can be drawn on an arbitrary scale or by comparing the
intensity that was actually measured with what you would expect for a sample with random grain orientations. “times random”
contours
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Pole figure with an “ideal texture”
Sharp featured PFs may be
approximated with an ideal texture
The maxima in the a brass PF correspond well with those expected for (110)[112] texture
(111) poles of the single crystal are oriented so that its (110) planes are // to the sheet and the [112]
direction // to the rolling direction
(111) PF for cold-rolled a brass sheet
The probability of finding the crystal plane normal for the reflection is proportional to the
intensity
Cullity 3rdEd. Page 420
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3-D display of pole figure
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Problems with texture measurement
If grain size is very large, sampling problems may inhibit accurate estimation of pole densities
Surface of a sheet may not have the same texture as the bulk
Transmission measurements can have a big problem due to
absorption
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Thin film – texture; YBCO/STO
Intensity
Omega (deg.)
14 15 16 17 18 19
0.4o
Intensity
0 90 180 270 360
Phi (deg.) fwhm = 1o
Intensity
10 20 30 40 50 60
2 theta (degrees)
002 003
004 005
006
007 STO 001 STO 002
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Textured film vs. single crystal
The amount of material properly oriented, in addition to ∆φ
and ∆ω, is needed to describe the degree of texture
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Percentage cube texture
111
A B
Collect data
@ A
Collect data
@ B
At each point, I(A) – I(B)
I (blue)/ I (blue + yellow) = percentage cube texture
Theta
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Inverse pole
figure
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Direct pole figure vs. Inverse pole figure
xyz sample coordinate system
x’y’z’ crystal coordinate system
Both are 2-D projections of the 3-D orientation distribution functions (ODF) cannot completely describe the orientations present. 3-D ODF can do this.
z = ND x= RD
y= TD
x’ = [100] z’ = [001]
Y’ = [010]
z = ND x= RD
y= TD x’ = [100]
z’ = [001]
Y’ = [010]
Pole figure Inverse pole figure
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Direct pole figure vs. Inverse pole figure
z = ND x= RD
y= TD
x’ = [100] z’ = [001]
Y’ = [010]
z = ND x= RD
y= TD x’ = [100]
z’ = [001]
Y’ = [010]
Pole figure Inverse pole figure
Dist. of selected xtallographic
direction relative to certain directions in the specimen
Dist. of selected direction in the specimen relative to xtal axes
Dist. of a, b & c relative to RD, TD & ND
Dist. of RD, TD & ND
relative to a, b & c
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Pole Figure & Inverse Pole Figure
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Inverse pole figure
Choose a sample direction of
interest, e.g. the Normal Direction (ND or “3”)
Choose a grain; determine which crystal direction the ND is parallel to; plot the result on a
stereographic projection.
Repeat for all grains!
If appropriate (large number of data points), plot contours
Remember that the unit triangle is the fundamental zone for directions in cubic crystals
Carnegie Mellon Univ.
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Inverse pole figure
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Inverse PF
The crystallographic direction // to ND plotted on a stereographic projection with axes // to the edges of the crystal unit cell
The direction is repeated because, for cubic materials, it could be any one of 48
symmetrically equivalent crystal directions
a cubic crystal unit cell oriented w.r.t. sample axes
the same sample axes oriented w.r.t. the crystal unit cell
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Inverse pole figure
The RD and TD inverse pole figures are obtained in a similar way
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Inverse pole figure
Negligible fraction of non-<111> fiber
Sample direction 3, or ND Strong <111>//ND Fiber Texture
Carnegie Mellon Univ.
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Direct PF vs. Inverse PF
DPF
Specify the poles of a specific crystal direction w.r.t. sample coordinate in stereographic projection
Shows the distribution of a selected crystallographic direction relative to certain directions in the specimen
IPF
Specify the poles of sample coordinate system w.r.t. those of crystal coordinate system in stereographic projection
Shows the distribution of a selected direction in the specimen relative to the crystal axes
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Direct PF vs. Inverse PF
DPF
A normal PF indicates how likely it is that a specific direction in a grain will adopt some orientation relative to the external features of the sample
IPF
An inverse PF indicates how likely it is that some external feature of the sample, (e.g. the fiber axis) will be at some orientation relative to the crystallographic axes of the grains
shows the distribution of crystallographic directions // to certain sample directions and can show some textures more clearly
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Inverse pole figure
In an inverse PF, the axes of the projection sphere are aligned with crystal directions.
The directions plotted are the stereographic projection of crystal directions // to either the normal direction (ND), rolling direction (RD) or transverse direction (TD) in the sample.
The inverse PF can help visualize certain types of textures.
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Inverse pole figure
Indicates the frequencies with which different crystal directions occur in a specified sample direction.
Plays an important role in the calculation or estimation of physical properties of polyxtalline materials.
Very informative for fiber samples as we are only interested in how the fiber axis is oriented.
For sheet samples, it is less informative as we have to worry about the orientation of the sheet normal, the rolling direction and the transverse direction. This requires multiple inverse PFs.
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Inverse pole figure of extruded Al rod
Contours indicate how likely it is that the fiber axis will adopt a given orientation relative to the
crystallographic axes (directions) of a grain.
IPF shows immediately the
crystallographic “direction” of the scatter.
Cullity 3rdEd. Page 428
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Euler angle
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Euler angles
TD(y)
RD(x) ND(z)
Rotation ϕ1about ND (z) axis
Rotation φ about new x axis bring ND to 001
Rotation ϕ2 about new z axis bring RD & TD to 100 & 010
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Euler angles
TD(y)
RD(x) sample
crystal
ND(z)
Rotation ϕ1about ND (z) axis
Rotation φabout new x axis bring ND to 001
Rotation ϕ2about new z axis bring RD & TD to 100 & 010
The orientation between 2 coordinate systems can be defined by a set of 3 successive rotations about specified axes.
These rotation angles are called the Euler angles --- ϕ1, φ, ϕ2
(
Bunge’s notation).85 CHAN PARK, MSE, SNU Spring-2019 Crystal Structure Analyses
Euler Angles, Animated
e
1=X
sample=RD e2=Y
sample=TD e
3=Z
sample=ND
e’
1e’
2φ
1Φ e”
2e”
3e’
3=
=e”
1y
crystal=e”’
2φ
2x
crystal=e”’
1z
crystal=e”’
3= [010]
[100]
[001]
Dr. Jongmin Baek
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Orientation Distribution Function
(ODF)
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Orientation distribution function (ODF)
sample
crystal
Need to specify angles, ϕ
1, φ, ϕ2between the crystallographic axes and the sample coordinate system.
Probability function for texture
A single PF does not completely describe the orientations of the grains in a sample.
To fully specify grain orientation, we need to plot probability as a function of three angles. This function or plot is ODF.
The ODF is a function of three independent angular variables and gives the probability of finding the corresponding unit cell (lattice) orientation.
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Orientation distribution function (ODF)
Can be derived completely from two PFs for a cubic material.
Once ODF is known, any PF can be calculated from it.
Is often plotted as a series of sections.
ODF for cold rolled brass Sections are for constant ϕ
2Cullity 3rdEd. Page 430
ϕ
1φ
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ODF Example (2D)
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ODF
ODF can give all the orientation information
ODF does not give grain boundary information
misorientation angle
ODF together with EBSD can give all the orientation information + grain boundary information
ODF, EBSD, grain size, grain shape can give complete microstructure
ODF Example (3D)
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Electron Back Scattered Diffraction
(EBSD)
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How is the signal generated & detected?
Each band in the pattern represents a crystal plane
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EBSD is made of
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Electron column focuses the
electron beam on the sample Sample is tilted using special holder or microscope stage
A special forward scatter electron detector is used to capture images of the sample
Microscope is used to select the point where the
measurement takes place
Pattern is formed on a phosphor screen
Phosphor screen is acquired on a low light Peltier cooled CCD camera Crystal orientation map
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EBSD measurement
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Texture – XRD vs. EBSD
XRD EBSD
Featu res
Large penetrationdepth (few um) Spatial resolution 25um ~ 1mm
Small penetrationdepth (~20nm) – surface sensitive Spatial resolution tens of nm in FE-SEM
advan tages
Well-established technique
Relatively larger area scanned (< 10mm2) Large number of grains can be analysed in one experiment
Macroscopic samples can be examined
Direct calculation of ODF possible Superior spatial resolution (< tens of nm)
Texture measurement of microscopic area possible Can relate texture to microstructure
Can easily measure texture of multiphase materials
disad vanta ges
Calculation of ODF from PF is complex and can give erroneous information
Poor spatial resolution – unsuitable for microscopic samples and difficult to relate texture to microstructure
Requires relatively expensive SEM
May not work with heavily deformed materials Impractical with some samples (polymers, pharmaceuticals)
Need more sample prep
Less practical for texture measurements of large grained materials
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EBSD vs. XRD
Misorientation angle “14” between grain 1 & grain 15
does not make any difference in the current path
is counted in XRD
is not counted in EBSD 1°
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15
1° 1°
1°
7 ~ 8° XRD 1° EBSP
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Texture analysis – overview 1
Texture analysis - The determination of the preferred orientation of the crystallites in polycrystalline aggregates
texture = preferred crystallographic orientation
The preferred orientation is usually described in terms of pole figures
A pole figure is scanned to measure the diffraction intensity of a given reflection (2- Theta is constant) at a large number of different angular orientations of the sample
A contour map of the intensity is then plotted as a function of angular orientation of the specimen. The most common representation of the pole figures are stereographic projection
The intensity of a given reflection (hkl) is proportional to the number of hkl planes in reflecting condition (Bragg’s law)
Hence, the pole figure gives the probability of finding a given crystal-plane-normal as a function of the specimen orientation. If the crystallites in the sample have a
random orientation, the recorded intensity will be uniform
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Texture analysis – overview 2
The orientation of the unit cell can be used to describe crystallite directions
The inverse pole figure gives the probability of finding a given specimen direction parallel to crystal (unit cell) directions
By collecting data for several reflections and combining several pole figures, we can arrive at the complete orientation distribution function (ODF) of the crystallites within a single polycrystalline phase that makes up the material
Considering a coordinate system defined in relation to the specimen, any orientation of the crystal lattice (unit cell) with respect to the specimen coordinate system may be defined by Euler rotation (three angular values) necessary to rotate the crystal coordinate system from a position coincident with the specimen coordinate system to a given position