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(1)

G (VG)

S D (VD)

QN(y) = inversion layer charge

0

VD

Let  be the potential along the channel

where the diffusion current is neglected.

For gate voltages above turn-on (VG ≥ VT), and drain voltages below pinch-off (0 ≤ VD ≤ VDsat), JN= qnnE

Note that current ID is the same everywhere, but JN (current density) can vary from position to position.

I

D

-V

DS

relationships (square-law theory)

(2)

Because the current flow within the conducting channel is almost exclusively in the y-direction,

dy n d n

J

JN Ny n y n

E

dy d

y

E

since

I

D

-V

DS

relationships (square-law theory)

To find ID from JN, we have to integrate the above eqn. within the area of the conducting channel.

 

( )

0 )

( 0 0

0

) ( 0

y x

Ny y

x

Ny Z

Z x y

Ny D

c c

c J dxdz dz J dx Z J dx

I

 

( )

0 )

( 0

y x

n y

x

n

c

c ndx

dy Z d dy dx

n d

Z

Since ,

dy Q d

μ Z

ID n N

( )

0 ( , ) ( , )

) ) (

( x y n

N n

c x y n x y dx

y Q

y q

(3)

I

D

-V

DS

relationships (square-law theory)

dy Q d

μ Z

ID n N

Separating variables and integrating,

0LIDdy IDL Z

0VD μnQNd

n VD N

D Q d

L μ I Z

0

With being position-independent in the long channel MOSFETs,

μn

When VG exceeds VT in the MOS capacitor, the equilibrium inversion layer charge is balanced by the charge added to the gate.

N semi

gate Q Q

Q

Because , Qgate CoVG CoVG VTQN CoVG VT

ox ox G

ox

o x

K A

C C 0

where Co is the oxide capacitance per unit area

T

G V

V

...

(4)

I

D

-V

DS

relationships (square-law theory)

n VD N

D Q d

L μ I Z

0

G T

o

N C V V

Q

In the MOSFET, the bottom-side “plate”

potential (ϕ) varies from zero at the source to VD at the drain.

Therefore the uniform potential drop (VG) in the MOS capacitor should be replaced by the potential drop (VG-ϕ) at an arbitrary point y in the MOSFET.

o G T

N y C V V

Q ( )

Substituting into and integrating,

o G T

N y C V V

Q ( )

  D

D

V T

G o

V n

T G

o n

D V V

L μ C d Z

V L V

μ C I Z

0 2

0 ( ) 2

( ) 2

2 D D

T G

o n D

V V V L V

μ C I Z

T G

Dsat

D V V V

V

and 0

...

(5)

I

D

-V

DS

relationships (square-law theory)

This equation can be applied only below pinch-off.

( ) 2

2 D D

T G

o n D

V V V L V

μ C I Z

T G

Dsat

D V V V

V

and 0

...

As pointed out in the qualitative discussion, ID is approximately constant if VD exceeds VDsat.

V Dsat V

D V

V

D I I

I D Dsat D Dsat

By simply setting

( ) 2

2 Dsat Dsat

T G

o n Dsat

V V V L V

μ C I Z

hence

It should be noted that pinch-off at the drain end of the channel implies QN(L)  0 when ϕ(L) = VD  VDsat.

o G T

N y C V V

Q ( )

At the pinch-off,

  0

)

( o G T Dsat

N L C V V V

Q

(6)

I

D

-V

DS

relationships (square-law theory)

  0

)

( o G T Dsat

N L C V V V

Q

Therefore and VDsat VG VT

( ) 2

2 Dsat Dsat

T G

o n Dsat

V V V L V

μ C

I Z ( )2

2 G T

o n

Dsat V V

L μ C

I Z

Neglecting ’s dependence on VG, the saturation drain

current varies as the square of the gate voltage above turn-on

μn

 the so called “square-law” dependence.

(7)

)2

2 ( G T

o n

Dsat V V

L μ C

I Z

( ) 2

2 D D

T G

o n D

V V V L V

μ C

I Z ... 0 VD VDsat and VG VT

T G

Dsat

D V V V

V and

...

I

D

-V

DS

relationships (square-law theory)

n-channel ideal MOSFET

)2

2 ( G T

o n

Dsat V V

L μ C

I Z

( ) 2

2 D D

T G

o p D

V V V L V

μ C I Z

T G

Dsat

D V V V

V

and 0

...

T G

Dsat

D V V V

V and

...

p-channel ideal MOSFET

T G

Dsat V V

V

T G

Dsat V V

V

(8)

Experimental determination of threshold voltage and field-effect mobility

( ) 2

2 D D

T G

o n D

V V V L V

μ C I Z

D T G

o n

D V V V

L μ C

I Z ( )

Very small VD

Plotting ID against VG, a straight line should be obtained, and the VT and can be determined by the intercept and slope. μn

L V μ C

slope Z n o D

Due to the effective mobility being a function of VG

Due to subthreshold conduction

(9)

I

D

-V

DS

relationships (bulk-charge theory)

o G T

N y C V V

Q ( )

The square-law theory contains a major flaw.

- In the square-law analysis, it is assumed that changes in

gate charge going down the channel were balanced solely by changes in QN ( and ). Qgate Qsemi QN - Thus it is implicitly assumed that the depletion width at all

channel points remains fixed at WT even under VD ≠ 0 biasing.

p-Si

 Due to VD ≠ 0 bias, the depletion width widens.

 “Bulk” charge (ionized accepters) must be included in any charge balance.

o G T

N y C V V

Q ( ) QN(y) CoBulk-charge theory VG VT qNA

W(y)WT

(10)

I

D

-V

DS

relationships (bulk-charge theory)

The ID-VDS relationships in the bulk-charge theory are as below:













F D F

D F

W D

D T G

o n D

V V V

V V V L V

μ C I Z

4 1 3 1 2

3 4 ) 2

(

2 / 2 3

n-channel ideal MOSFET ... 0 VD VDsat and VG VT

As in the square-law analysis, the post pinch-off portion of ID-VDS curve is approximately modeled by setting

V Dsat V

D V

V

D I I

I D Dsat D Dsat













F W F

W F

T G

W T

G Dsat

V V

V V V

V V

V 1 4

1 4 2

2 / 2 1

where

o T A

W C

W V qN

negative term added

negative term added

(11)

I

D

-V

DS

relationships (bulk-charge theory)

Because the negative

terms are added in the ID- VDS relationships of the bulk-charge theory, ID and VDsat are reduced

compared to the square- law theory.

As NA (or ND)  0 and xox  0, the bulk-charge theory, mathematically reduces to the square-law theory.

xox = 0.1 μm T = 300 K

(12)

Charge-sheet and exact-charge theories

Both the square-law and bulk-charge theories suffer from two severe inherent limitations.

1. QN was assumed to be zero for VG ≤ VT.

 In an actual MOSFET, QN becomes small, not zero.

2. The ID-VDS relationships from square-law and bulk-charge theories does not self-saturate.

 It is necessary to artificially set .

 As a result, a residual drain current (which is called the subthreshold current) can flow between the source and drain.

V Dsat V

D V

V

D I I

I D Dsat D Dsat

The noted failings are removed in the charge-sheet and exact charge theories (Appendix D).

 The subthreshold current can be calculated.

(13)

Charge-sheet and exact-charge theories

Solid line: exact charge theory Dashed line: charge sheet theory

Calculated

subthreshold current (solid or dashed lines)

(14)

Announcements

• Next lecture: basic concept for non-ideal MOS p. 645 ~ 683

• Final EXAM: Dec. 15, 13:00 ~ 15:00, 별 232

Everything studied after the Mid-Term EXM

• Homework problem set (due to Dec. 8):

17. 2; 17.18a; 17.20(a-d)

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