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Extraction of Passive Device Model Parameters Using Genetic Algorithms

Ilgu Yun^a), Lawrence A. Carastro, Ravi Poddar, Martin A. Brooke, Gary S. May, Kyung-Sook Hyun, and Kwang Eui Pyun

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20 Uncoupled Line Building Blocks Probe Pad

(a)

10 Uncoupled Line Building Blocks

(c) Probe Pad

(b)

Probe Pad Shielded Stub

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Probe Pad Building Block

1 2

R_pad = 0.1E-3 Ohm L_pad = 0.2E-10 H C_pad = 0.1E-14 F

1 2

1 2

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Uncoupled LineBuilding Block C_cou = 1.2E-15 F R_pad = 0.08 Ohm L_pad = 1E-11 H C_pad = 2.7E-15 F

(a)

R_pad = 0.08 Ohm L_pad = 1.2E-11 H C_pad = 3.6E-15 F

C_cou = 1.2E-15 F R_pad = 0.07 Ohm L_pad = 1E-11 H C_pad = 2.9E-15 F

C2 = 3.3E-15 F R = 0.6 Ohm L = 1E-10 H C = 7.1E-15 F Probe Pad Building Block

1 2

1 2

Uncoupled LineBuilding Block

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1 2

1 2 3

Shielded Stub Building Block

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(b)

Probe Pad Building Block

1 2

1

2

Uncoupled LineBuilding Block

1 2

R_pad = 1E-3 Ohm L_pad = 1.8e-10 H C_pad = 3.1e-13 F

1 2

C_cou = 1.2E-15 F R_pad = 1E-3 Ohm L_pad = 8.3E-11 H C_pad = 2.8E-14 F

(c)

 




 

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Define test structure geometry and building blocks

Device Model Parameter Optimization 1) LM algorithm

2) Genetic Algorithms

Obtain device model parameters Fabricate test structures

Extract circuit models for each building blocks using PEEC Measure s-parameters for test structure

Simulate s-parameters using HSPICE

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Simulate model Parameters

Genetic Algorithms - Reproduction - Crossover - Mutation

Generate new population Error Criteria ?

Extract device model parameters Measure model Parameters

1st parameter = 4.2 range [2, 5]

precision = 0.2

2nd parameter = 7 range [0, 15]

precision = 1

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