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Analysis of Volatile Organic Compounds Emitted from Electronic Parts in PC/N1onitor Set
Chrmg-Seep Ri*, Jong-Wbo Choe, and Kyu-Won Back Deparrnuw of Chenri,stq, Keimyung Uniwrsity Tuegu 7(M-701 Korw
(Received July 12, 2W)
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RxjH]~] Z)~ o~~~] + ~}+ :<17}+ ++1~7] (Residual Gas Analyzer, RGA)%. Y#@%Sq,
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VOC@l ‘j++ RGAQ} GC-MSZL +++%+. ~j ‘j~~ ~ VOCS ‘$ &=#~ ~&~Lj +5. g-q 3! q q s+ @7J’9 s] XJ+ == a+ 3! @ X% toluene, xylene, cyclohexanone’~ krzofuram-1] H ~}+ CiC-MS-=- ‘j’#++~@W-. “1+3 +-+?3+, ,3z}-F+$+ PCB(CEM-1~
xVW.Z +lxl T %::
7}S!’1~~ % 3W-OI]A; l~l<!-%} Ioluene. xylene, cyclohexanone ~ pheno]~l ++= ~+ H&E)+ +~~
WW.i~@. 7s1 E% 3~X-7-+Hl~~ toluene, xylene, phenol, cyclolrexanonc 2 benzofuran %Ql %-+$+1 +j)j <} ~+]~~1 + 7@J MJ~t+~l M&sl~E+. +++ ~ Trwrs7} 7R1 %++ WC&] ‘) ~=% ~’i i-j , Zj xw-?E-l ~j ~&j q WCS w]+ xyleneQl ~!ww} 550-2482 Vg/rn3SZ.7}7$ =1 +E)-~+.
.4BSTRACT. V&tile Organic Compmn]ds(VOCs ) emitted horn electronic parts comprising of FWMonitoI wt ha~’ebeen arudyzed. VOCS trends consecutively emitted from electronic parts were analyzed by using Residual Gas Analyzer(RGA) which is directly comected to the sample chamber, and VOCs emitted from electronic parts were qualitatively analyzed by RGA and GC-MS. Since toluene, xylene. cyclohexanone, and benzokran will bring cm the deleterious smell and the heaith risk, even though vely small amount of these are exposed to human tmdy, quantitative analysis was achieved by GC-MS system. As ~ result of these ,amdyses, except ITB( CEIW 1) of which is one of the electronic parts, the left of electronic parts represented. irmne- diately from 30 minutes to 1 hour after heating, the trends thar toluene, xylene, cyclohexarmne and phenol were consecutively emitted very high. i~d toluenc. xylene, phenol, cyclohexanonc, and bcnzofuran from most of the electronic parts were emitted very frequently within the memrring period. Fimlly, Trans of electronic parts showed the highest concentration of emission, and xylene( 550-2482 ~g/m3) w~s the most noticeably emitting compound of VOC~s.
345
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Schematic diagram of gas malysis system equipped with RCiA and operational chamber.
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no 5b+7 ,.3. * ,5,.s ,.1,.a 2.5,.!Area
Fig. 2, The calibration curves (It Bcnzofurarie (a) wrclCykohexisnorw [b) Ior quantitative analysis.
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Fig.3. Emissiontmds of’WCs emittedfrom elecwonic parts on tempxature (a)Tmns.(b)FBT-A, (c) KB(FR-I ):(d) lKB (CIM L) and (e) W.
2000, Vol. 44, No. 4
PCB(FR-1) — Cyclopropanc ( 10.8%) Cyclopropane (8.27.)
XJ%Z7J — Triffuorethylcne (3.990) Trhluorethylene (3.4%)
Propyne (13.3%) — —
— Nitrous oxide (18.7%) Nitrous oxide (27.9%)
FBT Formaldehyde, Hydrogen sulfide. chloroethylcrwnitricoxide, propanal
Table 2. The results of qualitative analysis of WCs emitted from electronic parts hy C~-hKS
Maw Quality (%) Compound
Mearr SD N
Tolwne 84.5 A1O.85 11
Benzofuran 67.3 *12.04 6
Xylene 87.7 k 8.66 11
Cyclohexmrone 74.3 *24.34 6
Phenol 74.2 +18.59 5
Silicon compounds 58.8 * 4.57 4
Cyclohexane 45.0 * 9.17 3
Benzaldehyde 66.0 *28.28 2
Ethylbenzenc 58 — 1
Styrene 95 . 1
Table3. ‘Theconcentration(4ughn3) of V(XS emitted from electronic parts mcasored by GC/MS system (Turns, DY PCFl(l+- 1). PCB(CEM- 1). FBI-A. and FBT-B),.
Concenmdtion (lW130)
Compound Threshold MAK
Trans DY PCB FR- I PCBCEM- 1 FBT A FBT II Limit (pprrr)’ (pprn)’
‘Muenc 1430 I7.25 33 2.9 fl
0.35 ppm 4.2 ppb 8 ppb 0.7 ppb 8 ppb – 10-15 I(XI
2482 11~() 583 550
Xylem 1314
0.53 ppm 0.24 ppm ().13 ppm 1 100
().12 ppm – !).28 ppm
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